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Study of the main physical processes contributing to image formation in emission radiography using mathematical modeling”. Leyva Pernia D, Cabal Rodríguez AE, Schalm O, van Espen P, Piñera Hernández I, Abreu Alfonso Y, (2013)
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Injuk J, Janssens K, van Espen P, Van Grieken R, (2001)
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Morphology and fractal dimension of soot and carbon black aggregates determined by image analysis”. Smekens A, Vervoort M, Pauwels J, Berghmans P, van Espen P, Van Grieken R, (1998)
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Prediction of Mα/L&alpha, intensity ratios and the use in the spectra evaluation”. Trincavelli J, Montoro S, Van Grieken R, van Espen P, (1992)
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Sulfur and heavy metals over the Atlantic Ocean : comparison with other marine data”. Maenhaut W, Selen A, van Espen P, Van Grieken R, Winchester JW, (1980)
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Multiscale modeling of radiation damage and annealing in Si samples implanted with 57-Mn radioactive ions”. Abreu Y, Cruz CM, van Espen P, Piñera I, Leyva A, Cabal AE, IEEE conference record T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1754 (2011)
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Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method”. Piñera I, Abreu Y, van Espen P, Diaz A, Leyva A, Cruz CM, IEEE conference record T2 –, IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN , 1609 (2011)
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Gijbels R, van Grieken R, Blommaert W, Van 't dack L, van Espen P, Nullens H, Saelens R (1983) Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges). S.l
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Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe”. Janssens G, Geuens I, de Keyzer R, van Espen P, Gijbels R, Hubin A, Terryn H, Vereecken J Wiley, Chichester, page 161 (1996).
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Van Grieken R, Janssens K, van Espen P, Injuk J, Padilla R, Vittiglio G, Potgieter JH page 45 (2005).
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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IDAS: a new Windows based software for multivariate analysis of atmospheric aerosol composition data bases”. Bondarenko I, Treiger B, Van Grieken R, van Espen P page 308 (1995).
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Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium)”. Vandevijvere M, Van de Voorde L, Caen J, van Espen P, Vekemans B, Vincze L, Schalm O page 169 (2013).
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Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods”. Vanmeert F, De Meyer S, Gestels A, Clerici EA, Deleu N, Legrand S, Van Espen P, Van der Snickt G, Alfeld M, Dik J, Monico L, De Nolf W, Cotte M, Gonzalez V, Saverwyns S, Depuydt-Elbaum L, Janssens K page 317 (2022).
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Euroanalysis 14: the European Conference on Analytical Chemistry”. Janssens K, van Espen P, Van 't dack L, Analytical and bioanalytical chemistry 391, 1107 (2008). http://doi.org/10.1007/S00216-008-2114-9
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CAC-2010 : Twelfth international conference on chemometrics in analytical chemistry”. Buydens L, van Espen P, Rutan S, Analytica chimica acta 705, 1 (2011). http://doi.org/10.1016/J.ACA.2011.08.001
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XRS activities at the Micro &, Trace Analysis Centre (MiTAC), University of Antwerp, Belgium”. Padilla R, Janssens K, van Espen P, Van Grieken R, IAEA XRF newsletter 12, 13 (2006)
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Background aerosol composition at Gobabeb, South West Africa”. Annegarn H, Van Grieken R, van Espen P, von Blottnitz F, Sellschop J, Winchester J, Maenhaut W, Madoqua , 107 (1976)
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Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions”. Gregory CL, Nullens HA, Gijbels RH, van Espen PJ, Geuens I, de Keyzer R, Analytical chemistry 70, 2551 (1998). http://doi.org/10.1021/ac9710644
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A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source”. van Vaeck L, van Espen P, Gijbels R, Baykut G, Laukien FH, European mass spectrometry 6, 277 (2000). http://doi.org/10.1255/ejms.342
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The primary energy dependence of backscattered electron images up to 100 keV”. Geuens I, Nys B, Naudts J, Gijbels R, Jacob W, van Espen P, Scanning microscopy 5, 339 (1991)
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Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis”. Oleshko V, Kindratenko V, Gijbels R, van Espen P, Jacob W, Mikrochimica acta: supplementum 13, 443 (1996)
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Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis”. Verlinden G, Janssens G, Gijbels R, van Espen P, Geuens I, Analytical chemistry 69, 3773 (1997). http://doi.org/10.1021/ac970010r
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Hyperfine electric parameters calculation in Si samples implanted with 57Mn\rightarrow57Fe”. Abreu Y, Cruz CM, Pinera I, Leyva A, Cabal AE, van Espen P, Van Remortel N, Physica: B : condensed matter 445, 1 (2014). http://doi.org/10.1016/J.PHYSB.2014.03.028
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Gamma induced atom displacements in LYSO and LuYAP crystals as used in medical imaging applications”. Pinera I, Cruz CM, Abreu Y, Leyva A, van Espen P, Diaz A, Cabal AE, Van Remortel N, Interactions With Materials And Atoms 356, 46 (2015). http://doi.org/10.1016/J.NIMB.2015.04.063
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Improved calculation of displacements per atom cross section in solids by gamma and electron irradiation”. Pinera I, Cruz CM, Leyva A, Abreu Y, Cabal AE, van Espen P, Van Remortel N, Interactions With Materials And Atoms 339, 1 (2014). http://doi.org/10.1016/J.NIMB.2014.08.020
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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Modeling the charge deposition in quartz grains during natural irradiation and its influence on the optically stimulated luminescence signal”. Baly L, Quesada I, Murray AS, Martin G, van Espen P, Arteche R, Jain M, Radiation Measurements 142, 106564 (2021). http://doi.org/10.1016/J.RADMEAS.2021.106564
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Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm”. Piñera I, Cruz CM, van Espen P, Abreu Y, Leyva A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 274, 191 (2012). http://doi.org/10.1016/J.NIMB.2011.11.021
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Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications”. Van Echelpoel R, de Jong M, Daems D, van Espen P, De Wael K, Talanta 233, 122605 (2021). http://doi.org/10.1016/J.TALANTA.2021.122605
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