Number of records found: 719
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Citations
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Martensitic transformations and microstructures in splat-cooled Ni-Al”. Schryvers D, Holland-Moritz D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 273/275, 697 (1999). http://doi.org/10.1016/S0921-5093(99)00399-8
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Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering”. Hendrich C, Favre L, Ievlev DN, Dobrynin AN, Bras W, Hörmann U, Piscopiello E, Van Tendeloo G, Lievens P, Temst K, Applied physics A : materials science &, processing 86, 533 (2007). http://doi.org/10.1007/s00339-006-3808-5
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Measuring strain fields and concentration gradients around Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang ZQ;, Materials science and engineering A: structural materials properties microstructure and processing 438, 485 (2006). http://doi.org/10.1016/j.msea.2006.02.166
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Mécanismes de la non-stoechiométrie dans les nouveaux supraconducteurs à, haute Tc”. Hervieu M, Michel C, Martin C, Huvé, M, Van Tendeloo G, Maignan A, Pelloquin D, Goutenoire F, Raveau B, Journal de physique: 3: applied physics, materials science, fluids, plasma and instrumentation 4, 2057 (1994)
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Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing”. Espinosa EH, Lonescu R, Bittencourt C, Felten A, Erni R, Van Tendeloo G, Pireaux J-J, Llobet E, Thin solid films : an international journal on the science and technology of thin and thick films 515, 8322 (2007). http://doi.org/10.1016/j.tsf.2007.03.017
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Metallic nanoparticles on plasma treated carbon nanotubes : $Nano2hybrids$”. Bittencourt C, Felten A, Douhard B, Colomer J-F, Van Tendeloo G, Drube W, Ghijsen J, Pireaux J-J, Surface science : a journal devoted to the physics and chemistry of interfaces T2 –, International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601, 2800 (2007). http://doi.org/10.1016/j.susc.2006.12.045
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Microstructural mechanism of development in photothermographic materials”. Potapov PL, Schryvers D, Strijckers H, van Roost C, The journal of imaging science and technology 47, 115 (2003)
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The microstructure and interfaces of intermediate layers in sapphire bicrystals”. Vasiliev AL, Stepantsov EA, Ivanov ZG, Verbist K, Van Tendeloo G, Olsson E, Applied surface science 119, 215 (1997)
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Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties”. Verbist K, Lebedev OI, Verhoeven MAJ, Winchern R, Rijnders AJHM, Blank DHA, Tafuri F, Bender H, Van Tendeloo G, Superconductor science and technology 11, 13 (1998). http://doi.org/10.1088/0953-2048/11/1/004
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Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications”. Vasiliev AL, Van Tendeloo G, Boikov Y, Olsson E, Ivanov S, Superconductor science and technology 10, 356 (1997)
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Mixed-valent, heteroleptic homometallic diketonates as templates for the design of volatile heterometallic precursors”. Lieberman CM, Filatov AS, Wei Z, Rogachev AY, Abakumov AM, Dikarev EV, Chemical science 6, 2835 (2015). http://doi.org/10.1039/c4sc04002c
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Morphological TEM studies and magnetoresistance analysis of sputtered Al-substituted ZnO films : the role of oxygen”. Van Gompel M, Atalay AY, Gaulke A, Van Bael MK, D'Haen J, Turner S, Van Tendeloo G, Vanacken J, Moshchalkov VV, Wagner P, Physica status solidi : A : applications and materials science 212, 1191 (2015). http://doi.org/10.1002/pssa.201431888
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A multi-scale characterization of deformation twins in Ti6Al4V sheet material deformed by simple shear”. Tirry W, Coghe F, Bouvier S, Gasperini M, Rabet L, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 527, 4136 (2010). http://doi.org/10.1016/j.msea.2010.03.039
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Multiple-step martensitic transformations in the Ni51Ti49 single crystal”. Khalil-Allafi J, Amin-Ahmadi B, Journal of materials science 45, 6440 (2010). http://doi.org/10.1007/s10853-010-4729-4
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Multiwalled carbon nanotubes functionalized with 7-octenyltrichlorosilane and n-octyltrichlorosilane: dispersion in Sylgard®184 silicone and Youngs modulus”. Vast L, Carpentier L, Lallemand F, Colomer J-F, Van Tendeloo G, Fonseca A, Nagy JB, Mekhalif Z, Delhalle J, Journal of materials science 44, 3476 (2009). http://doi.org/10.1007/s10853-009-3464-1
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Nanodiamonds do not provide unique evidence for a Younger Dryas impact”. Tian H, Schryvers D, Claeys P, Proceedings of the National Academy of Sciences of the United States of America 108, 40 (2011). http://doi.org/10.1073/pnas.1007695108
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Nanostructures in LuFe2O4+\delta”. Hervieu M, Damay F, Poienar M, Elkaim E, Rouquette J, Abakumov AM, Van Tendeloo G, Maignan A, Martin C, Solid state sciences 23, 26 (2013). http://doi.org/10.1016/j.solidstatesciences.2013.05.015
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Natural mineral-marine manganese nodule as a novel catalyst for the synthesis of carbon nanotubes”. Cheng JP, Zhang XB, Ye Y, Tao XY, Liu F, Li Y, Van Tendeloo G, Journal of Wuhan University of Technology: materials science edition 21, 29 (2006)
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New (3(3)under-bar) long-period microtwin variant in the martensitic phase of the PtTi alloy”. Rotaru G-M, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 437 (2008). http://doi.org/10.1016/j.msea.2006.12.201
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New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views”. Goessens C, Schryvers D, van Landuyt J, de Keyzer R, The journal of imaging science and technology 41, 301 (1997)
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New molybdenum oxides Ag4M2Zr(MoO4)6 (M=Mg, Mn, Co, Zn) with a channel-like structure”. Khobrakova ET, Morozov VA, Khasanov SS, Tsyrenova GD, Khaikina EG, Lebedev OI, Van Tendeloo G, Lazoryak BI, Solid state sciences 7, 1397 (2005). http://doi.org/10.1016/j.solidstatesciences.2005.08.010
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Order and twining in Sb2W0.75Mo0.25O6”. Enjalbert R, Galy J, Castro A, Lidin S, Withers R, Van Tendeloo G, Solid state sciences 5, 721 (2003). http://doi.org/10.1016/S1293-2558(03)00093-1
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Oxidation potential in the Earth's lower mantle as recorded by ferropericlase inclusions in diamond”. Kaminsky FV, Ryabchikov ID, McCammon CA, Longo M, Abakumov AM, Turner S, Heidari H, Earth and planetary science letters 417, 49 (2015). http://doi.org/10.1016/j.epsl.2015.02.029
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Photoelectric and electrical responses of several erbium silicide/silicon interfaces”. Muret P, Nguyen TTA, Frangis N, Van Tendeloo G, van Landuyt J, Applied surface science T2 –, International Symposium on Si Heterostructures –, From Physics to Devices, SEP 11-14, 1995, IRAKLION, GREECE 102, 173 (1996). http://doi.org/10.1016/0169-4332(96)00042-6
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Platinum particle size and support effects in NOx mediated carbon oxidation over platinum catalysts”. Villani K, Vermandel W, Smets K, Liang D, Van Tendeloo G, Martens JA, Environmental science &, technology 40, 2727 (2006). http://doi.org/10.1021/es051871h
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Positron annihilation study of nanocrystalline Ni3Al : simulations and measurements”. Kuriplach J, van Petegem S, Hou M, Van Tendeloo G, Schryvers D, et al, Materials science forum T2 –, 12th International Conference on Positron Annihilation (ICPA-12), AUG 06-12, 2000, UNIV BUNDERSWEHR MUNCHEN, NEUBIBERG, GERMANY 363-3, 94 (2001)
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Quantitative determination of the crystal structure of Ni4Ti3 precipitates”. Tirry W, Schryvers D, Jorissen K, Lamoen D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 438, 517 (2006). http://doi.org/10.1016/j.msea.2006.02.063
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Rational synthesis of a nanocrystalline calcium phosphate cement exhibiting rapid conversion to hydroxyapatite”. Neira IS, Kolen'ko YV, Lebedev OI, Van Tendeloo G, Gupta HS, Matsushita N, Yoshimura M, Guitian F, Materials science and engineering: part C: biomimetic materials 29, 2124 (2009). http://doi.org/10.1016/j.msec.2009.04.011
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Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
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Stability and structures of the CFCC-TmC phases : a first-principles study”. Fang CM, van Huis MA, Zandbergen HW, Computational materials science 51, 146 (2012). http://doi.org/10.1016/j.commatsci.2011.07.017
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