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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence”. van Espen P, Van 't dack L, Adams F, Van Grieken R, Analytical chemistry 51, 961 (1979). http://doi.org/10.1021/AC50043A042
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Fractal dimensional classification of aerosol particles by computer-controlled scanning electron microscopy”. Kindratenko VV, van Espen PJM, Treiger BA, Van Grieken RE, Environmental science and technology 28, 2197 (1994). http://doi.org/10.1021/ES00061A031
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IDAS: a Windows based software package for cluster analysis”. Bondarenko I, Treiger B, Van Grieken R, van Espen P, Spectrochimica acta: part B : atomic spectroscopy 51, 441 (1996)
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Non-linear mapping of microbeam proton-induced X-ray emission data for source identification of North Sea aerosols”. Treiger B, Injuk J, Bondarenko I, van Espen P, Van Grieken R, Breitenbach L, Wätjen U, Spectrochimica acta: part B : atomic spectroscopy 49, 345 (1994). http://doi.org/10.1016/0584-8547(94)80029-4
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Pixe analysis of aerosol samples collected over the atlantic-ocean from a sailboat”. Maenhaut W, Selen A, van Espen P, Van Grieken R, Winchester WJ, Nuclear instruments and methods 181, 399 (1981). http://doi.org/10.1016/0029-554X(81)90640-6
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Size-differentiated composition of aerosols in Khartoum, Sudan”. Eltayeb MAH, van Espen PJ, Cafmeyer J, Van Grieken RE, Maenhaut W, The science of the total environment 120, 281 (1992). http://doi.org/10.1016/0048-9697(92)90062-W
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Studying aerosol samples by non-linear mapping of electron probe microanalysis data”. Treiger B, van Malderen H, Bondarenko I, van Espen P, Van Grieken R, Analytica chimica acta 284, 119 (1993). http://doi.org/10.1016/0003-2670(93)80014-C
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Modeling the charge deposition in quartz grains during natural irradiation and its influence on the optically stimulated luminescence signal”. Baly L, Quesada I, Murray AS, Martin G, van Espen P, Arteche R, Jain M, Radiation Measurements 142, 106564 (2021). http://doi.org/10.1016/J.RADMEAS.2021.106564
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Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm”. Piñera I, Cruz CM, van Espen P, Abreu Y, Leyva A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 274, 191 (2012). http://doi.org/10.1016/J.NIMB.2011.11.021
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Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications”. Van Echelpoel R, de Jong M, Daems D, van Espen P, De Wael K, Talanta 233, 122605 (2021). http://doi.org/10.1016/J.TALANTA.2021.122605
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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Gamma induced atom displacements in LYSO and LuYAP crystals as used in medical imaging applications”. Pinera I, Cruz CM, Abreu Y, Leyva A, van Espen P, Diaz A, Cabal AE, Van Remortel N, Interactions With Materials And Atoms 356, 46 (2015). http://doi.org/10.1016/J.NIMB.2015.04.063
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Improved calculation of displacements per atom cross section in solids by gamma and electron irradiation”. Pinera I, Cruz CM, Leyva A, Abreu Y, Cabal AE, van Espen P, Van Remortel N, Interactions With Materials And Atoms 339, 1 (2014). http://doi.org/10.1016/J.NIMB.2014.08.020
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Hyperfine electric parameters calculation in Si samples implanted with 57Mn\rightarrow57Fe”. Abreu Y, Cruz CM, Pinera I, Leyva A, Cabal AE, van Espen P, Van Remortel N, Physica: B : condensed matter 445, 1 (2014). http://doi.org/10.1016/J.PHYSB.2014.03.028
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Automated particle analysis of populations of silver halide microcrystals by electron probe microanalysis under cryogenic conditions”. Gregory CL, Nullens HA, Gijbels RH, van Espen PJ, Geuens I, de Keyzer R, Analytical chemistry 70, 2551 (1998). http://doi.org/10.1021/ac9710644
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A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source”. van Vaeck L, van Espen P, Gijbels R, Baykut G, Laukien FH, European mass spectrometry 6, 277 (2000). http://doi.org/10.1255/ejms.342
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The primary energy dependence of backscattered electron images up to 100 keV”. Geuens I, Nys B, Naudts J, Gijbels R, Jacob W, van Espen P, Scanning microscopy 5, 339 (1991)
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Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis”. Oleshko V, Kindratenko V, Gijbels R, van Espen P, Jacob W, Mikrochimica acta: supplementum 13, 443 (1996)
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Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis”. Verlinden G, Janssens G, Gijbels R, van Espen P, Geuens I, Analytical chemistry 69, 3773 (1997). http://doi.org/10.1021/ac970010r
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XRS activities at the Micro &, Trace Analysis Centre (MiTAC), University of Antwerp, Belgium”. Padilla R, Janssens K, van Espen P, Van Grieken R, IAEA XRF newsletter 12, 13 (2006)
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Background aerosol composition at Gobabeb, South West Africa”. Annegarn H, Van Grieken R, van Espen P, von Blottnitz F, Sellschop J, Winchester J, Maenhaut W, Madoqua , 107 (1976)
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CAC-2010 : Twelfth international conference on chemometrics in analytical chemistry”. Buydens L, van Espen P, Rutan S, Analytica chimica acta 705, 1 (2011). http://doi.org/10.1016/J.ACA.2011.08.001
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Euroanalysis 14: the European Conference on Analytical Chemistry”. Janssens K, van Espen P, Van 't dack L, Analytical and bioanalytical chemistry 391, 1107 (2008). http://doi.org/10.1007/S00216-008-2114-9
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Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods”. Vanmeert F, De Meyer S, Gestels A, Clerici EA, Deleu N, Legrand S, Van Espen P, Van der Snickt G, Alfeld M, Dik J, Monico L, De Nolf W, Cotte M, Gonzalez V, Saverwyns S, Depuydt-Elbaum L, Janssens K page 317 (2022).
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Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium)”. Vandevijvere M, Van de Voorde L, Caen J, van Espen P, Vekemans B, Vincze L, Schalm O page 169 (2013).
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Novel quantitative procedures for in-situ X-ray fluorescence analysis”. Van Grieken R, Janssens K, van Espen P, Injuk J, Padilla R, Vittiglio G, Potgieter JH page 45 (2005).
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