| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Gao, C.; Hofer, C.; Jannis, D.; Béché, A.; Verbeeck, J.; Pennycook, T.J. |
Overcoming contrast reversals in focused probe ptychography of thick materials: An optimal pipeline for efficiently determining local atomic structure in materials science |
2022 |
Applied physics letters |
121 |
9 |
UA library record; WoS full record; WoS citing articles |
| van der Sluijs, M.M.; Salzmann, B.B.V.; Arenas Esteban, D.; Li, C.; Jannis, D.; Brafine, L.C.; Laning, T.D.; Reinders, J.W.C.; Hijmans, N.S.A.; Moes, J.R.; Verbeeck, J.; Bals, S.; Vanmaekelbergh, D. |
Study of the Mechanism and Increasing Crystallinity in the Self-Templated Growth of Ultrathin PbS Nanosheets |
2023 |
Chemistry of materials |
|
2 |
UA library record; WoS full record; WoS citing articles |
| Birkholzer, Y.A.; Sotthewes, K.; Gauquelin, N.; Riekehr, L.; Jannis, D.; van der Minne, E.; Bu, Y.; Verbeeck, J.; Zandvliet, H.J.W.; Koster, G.; Rijnders, G. |
High-strain-induced local modification of the electronic properties of VO₂ thin films |
2022 |
ACS applied electronic materials |
4 |
2 |
UA library record; WoS full record |
| Denisov, N.; Jannis, D.; Orekhov, A.; Müller-Caspary, K.; Verbeeck, J. |
Characterization of a Timepix detector for use in SEM acceleration voltage range |
2023 |
Ultramicroscopy |
253 |
|
UA library record; WoS full record |
| Hugenschmidt, M.; Jannis, D.; Kadu, A.A.; Grünewald, L.; De Marchi, S.; Perez-Juste, J.; Verbeeck, J.; Van Aert, S.; Bals, S. |
Low-dose 4D-STEM tomography for beam-sensitive nanocomposites |
2023 |
ACS materials letters |
6 |
|
UA library record; WoS full record |
