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Author Title Year Publication Volume Times cited Additional Links
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 1998 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I. Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods 1998 UA library record
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates 2000 UA library record