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A parametric model for reactive high-power impulse magnetron sputtering of films”. Kozák T, Vlček J, Journal Of Physics D-Applied Physics 49, 055202 (2016). http://doi.org/10.1088/0022-3727/49/5/055202
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Survival of the Dirac points in rippled graphene”. Covaci L, Berciu M, Physical Review Letters 100, 256405 (2008). http://doi.org/10.1103/PhysRevLett.100.256405
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Measuring the height-to-height correlation function of corrugation in suspended graphene”. Kirilenko DA, Brunkov PN, Ultramicroscopy 165, 1 (2016). http://doi.org/10.1016/j.ultramic.2016.03.010
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Strength, toughness and aging stability of highly-translucent Y-TZP ceramics for dental restorations”. Zhang F, Inokoshi M, Batuk M, Hadermann J, Naert I, Van Meerbeek B, Vleugels J, Dental Materials 32, e327 (2016). http://doi.org/10.1016/j.dental.2016.09.025
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The corrosion process of sterling silver exposed to a Na2S solution: monitoring and characterizing the complex surface evolution using a multi-analytical approach”. Schalm O, Crabbé, A, Storme P, Wiesinger R, Gambirasi A, Grieten E, Tack P, Bauters S, Kleber C, Favaro M, Schryvers D, Vincze L, Terryn H, Patelli A, Applied Physics A-Materials Science &, Processing 122, 903 (2016). http://doi.org/10.1007/s00339-016-0436-6
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The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images”. Martinez GT, de Backer A, Rosenauer A, Verbeeck J, Van Aert S, Micron 63, 57 (2014). http://doi.org/10.1016/j.micron.2013.12.009
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Gas-phase synthesis of Mg-Ti nanoparticles for solid-state hydrogen storage”. Calizzi M, Venturi F, Ponthieu M, Cuevas F, Morandi V, Perkisas T, Bals S, Pasquini L, Physical chemistry, chemical physics 18, 141 (2016). http://doi.org/10.1039/c5cp03092g
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Self-assembly of gas-phase synthesized magnesium nanoparticles on room temperature substrates”. Venturi F, Calizzi M, Bals S, Perkisas T, Pasquini L, Materials research express 2, 015007 (2015). http://doi.org/10.1088/2053-1591/2/1/015007
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Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM”. Jones L, Martinez GT, Béché, A, Van Aert S, Nellist PD, Microscopy and microanalysis 20, 126 (2014). http://doi.org/10.1017/S1431927614002359
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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Precision of three-dimensional atomic scale measurements from HRTEM images : what are the limits?”.Wang A, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 114, 20 (2012). http://doi.org/10.1016/j.ultramic.2011.12.002
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Throughput maximization of particle radius measurements by balancing size and current of the electron probe”. van den Broek W, Van Aert S, Goos P, van Dyck D, Ultramicroscopy 111, 940 (2011). http://doi.org/10.1016/j.ultramic.2010.11.025
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How flue gas impurities affect the electrochemical reduction of CO₂, to CO and formate”. Van Daele S, Hintjens L, Hoekx S, Bohlen B, Neukermans S, Daems N, Hereijgers J, Breugelmans T, Applied catalysis : B : environmental 341, 123345 (2024). http://doi.org/10.1016/J.APCATB.2023.123345
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Air- and water-resistant noble metal coated ferromagnetic cobalt nanorods”. Lentijo-Mozo S, Tan RP, Garcia-Marcelot C, Altantzis T, Fazzini PF, Hungria T, Cormary B, Gallagher JR, Miller JT, Martinez H, Schrittwieser S, Schotter J, Respaud M, Bals S, Van Tendeloo G, Gatel C, Soulantica K, ACS nano 9, 2792 (2015). http://doi.org/10.1021/nn506709k
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Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale”. Pfannmöller M, Heidari H, Nanson L, Lozman OR, Chrapa M, Offermans T, Nisato G, Bals S, Nano letters 15, 6634 (2015). http://doi.org/10.1021/acs.nanolett.5b02437
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Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction”. Mueller K, Krause FF, Béché, A, Schowalter M, Galioit V, Loeffler S, Verbeeck J, Zweck J, Schattschneider P, Rosenauer A, Nature communications 5, 5653 (2014). http://doi.org/10.1038/ncomms6653
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Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering”. Dendooven J, Devloo-Casier K, Ide M, Grandfield, Kurttepeli, Ludwig KF, Bals S, Van der Voort P, Detavernier C, Nanoscale 6, 14991 (2014). http://doi.org/10.1039/c4nr05049e
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Atomic resolution monitoring of cation exchange in CdSe-PbSe heteronanocrystals during epitaxial solid-solid-vapor growth”. Yalcin AO, Fan Z, Goris B, Li WF, Koster RS, Fang CM, van Blaaderen A, Casavola M, Tichelaar FD, Bals S, Van Tendeloo G, Vlugt TJH, Vanmaekelbergh D, Zandbergen HW, van Huis MA;, Nano letters 14, 3661 (2014). http://doi.org/10.1021/nl501441w
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Atomic structure of quantum gold nanowires : quantification of the lattice strain”. Kundu P, Turner S, Van Aert S, Ravishankar N, Van Tendeloo G, ACS nano 8, 599 (2014). http://doi.org/10.1021/nn4052315
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Atomistic structure of Cu-containing \beta", precipitates in an Al-Mg-Si-Cu alloy”. Li K, Béché, A, Song M, Sha G, Lu X, Zhang K, Du Y, Ringer SP, Schryvers D, Scripta materialia 75, 86 (2014). http://doi.org/10.1016/j.scriptamat.2013.11.030
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Au@Ag nanoparticles : halides stabilize {100} facets”. Gómez-Graña S, Goris B, Altantzis T, Fernández-López C, Carbó-Argibay E, Guerrero-Martínez A, Almora-Barrios N, López N, Pastoriza-Santos I, Pérez-Juste J, Bals S, Van Tendeloo G, Liz-Marzán LM;, The journal of physical chemistry letters 4, 2209 (2013). http://doi.org/10.1021/jz401269w
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Au particles supported on (110) anatase-TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, Microstructure And Processing 297, 197 (2001). http://doi.org/10.1016/S0921-5093(00)01261-2
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Band structure quantization in nanometer sized ZnO clusters”. Schouteden K, Zeng Y-J, Lauwaet K, Romero CP, Goris B, Bals S, Van Tendeloo G, Lievens P, Van Haesendonck C, Nanoscale 5, 3757 (2013). http://doi.org/10.1039/c3nr33989k
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Carbon-dot-decorated nanodiamonds”. Shenderova O, Hens S, Vlasov I, Turner S, Lu Y-G, Van Tendeloo G, Schrand A, Burikov SA, Dolenko TA, Particle and particle systems characterization 31, 580 (2014). http://doi.org/10.1002/ppsc.201300251
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Carbon nanotube TiO2 hybrid films for detecting traces of O2”. Llobet E, Espinosa EH, Sotter E, Ionescu R, Vilanova X, Torres J, Felten A, Pireaux JJ, Ke X, Van Tendeloo G, Renaux F, Paint Y, Hecq M, Bittencourt C;, Nanotechnology 19, 375501 (2008). http://doi.org/10.1088/0957-4484/19/37/375501
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Cation exchange mediated elimination of the Fe-antisites in the hydrothermal synthesis of LiFePO4”. Paolella A, Bertoni G, Hovington P, Feng Z, Flacau R, Prato M, Colombo M, Marras S, Manna L, Turner S, Van Tendeloo G, Guerfi A, Demopoulos GP, Zaghib K;, Nano energy 16, 256 (2015). http://doi.org/10.1016/j.nanoen.2015.06.005
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Characterisation of multilayer ramp-type REBa2Cu3O7-\delta structures by scanning probe microscopy and high-resolution electron microscopy”. Blank DHA, Rijnders AJHM, Verhoeven MAJ, Bergs RMH, Rogalla H, Verbist K, Lebedev O, Van Tendeloo G, Journal of alloys and compounds T2 –, Symposium on High Temperature Superconductor Thin Films, Growth, Mechanisms, Interfaces, Multilayers, at the 1996 Spring Meeting of the European-Materials-Society, June 04-07, 1996, Strasbourg, France 251, 206 (1997). http://doi.org/10.1016/S0925-8388(96)02799-5
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Chemical and structural analysis of etching residue layers in semiconductor devices with energy filtering transmission electron microscopy”. Hens S, van Landuyt J, Bender H, Boullart W, Vanhaelemeersch S, Materials science in semiconductor processing 4, 109 (2001). http://doi.org/10.1016/S1369-8001(00)00147-5
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Chemical insight into electroforming of resistive switching manganite heterostructures”. Borgatti F, Park C, Herpers A, Offi F, Egoavil R, Yamashita Y, Yang A, Kobata M, Kobayashi K, Verbeeck J, Panaccione G, Dittmann R;, Nanoscale 5, 3954 (2013). http://doi.org/10.1039/c3nr00106g
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