toggle visibility
Search within Results:
Display Options:
Number of records found: 3074

Select All    Deselect All
 | 
Citations
 | 
   print
Pacquets L (2022) Towards stable Cu-Ag bimetallic nanoparticles to boost the electrocatalytic CO2 reduction. xvi, 188 p
toggle visibility
Du K (2021) In situ TEM study on the manipulation of ferroelectrics. 91 p
toggle visibility
Prabhakara V (2021) Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy. 149 p
toggle visibility
Hao Y (2022) A joint experimental-modeling study of the structure and properties of functional molecular monolayers for the control of organic crystal growth. xiii, 174 p
toggle visibility
Penders AG (2022) Microstructural investigation of irradiation assisted stress corrosion cracking mechanisms based on focused ion beam analysis of tested and industrial specimens. xxxviii, 226 p
toggle visibility
Kashiwar A (2022) TEM investigations of deformation mechanisms in nanocrystalline metals and multilayered composites. xvi, 129 p
toggle visibility
Yu C-P (2023) Novel imaging methods of transmission electron microscopy based on electron beam scattering and modulation. x, 154 p
toggle visibility
Lu Q (2024) Precipitation behavior and heat resistance properties of Al-Cu-Mg-Ag-(Si) alloy. VIII, 212 p
toggle visibility
Martí,nez Alanis GT (2015) Quantitative model-based high angle annular dark field scanning transmission electron microscopy. Antwerpen
toggle visibility
Lobato I (2014) Accurate modeling of high angle electron scattering. Antwerpen
toggle visibility
Amin-Ahmadi B (2015) Adanced TEM investigation of the elementary plsticity mechanisms in palladium thin films at the nano scale. Antwerpen
toggle visibility
Goris B (2014) Advanced electron tomography : 3 dimensional structural characterisation of nanomaterials down to the atomic scale. Antwerpen
toggle visibility
d' Hondt H (2011) Characterization of anion deficient perovskites. Antwerpen
toggle visibility
Kirilenko D (2012) Characterization of graphene by electron diffraction. Antwerpen
toggle visibility
Wiktor C (2014) Characterization of metal-organic frameworks and other porous materials via advanced transmission electron microscopy. Antwerpen
toggle visibility
Leroux F (2012) Characterization of soft-hard matter composite materials by advanced transmission electron microscopy. Universiteit Antwerpen, EMAT, Antwerpen
toggle visibility
Lu Y (2013) Electron energy-loss spectroscopy (EELS) characterization of diamond and related materials. Antwerpen
toggle visibility
Biermans E (2012) Electron tomography : from qualitative to quantitative. Antwerpen
toggle visibility
Govaerts K (2015) First-principles study of homologous series of layered Bi-Sb-Te-Se and Sn-O structures. Antwerpen
toggle visibility
Tan H (2012) From EELS to oxidation state mapping : an investigation into oxidation state mapping of transition metals with electron energy-loss spectroscopy. Antwerpen
toggle visibility
Shi H (2014) From functional properties to micro/nano-structures : a TEM study of NiTiNb shape memory alloys. Antwerpen
toggle visibility
Ke X (2010) From top-down to bottom-up : from carbon nanotubes to nanodevices. Antwerpen
toggle visibility
Khaletskaya K (2014) Functional metal-organic frameworks : from bulk to surface engineered properties. Antwerpen
toggle visibility
Sarmadian N (2015) Identification of thin-film photovoltaic cell materials based on high-throughput first-principles calculations. Antwerpen
toggle visibility
Roose D (2015) Magnetic resonance imaging and electron microscopy of iron oxide particles in the brain. Universiteit Antwerpen, Faculteit Farmaceutische, Biomedische en Diergeneeskundige Wetenschappen, Departement Biomedische Wetenschappen, Antwerpen
toggle visibility
Batuk D (2014) Modular structures with lone electron pair cations. Antwerpen
toggle visibility
Batuk M (2013) New perovskite-based homologous series : AnBnO3n-2 and An+1BnO3n-1Cl. Antwerpen
toggle visibility
Cao S (2010) Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view. Antwerpen
toggle visibility
Wang W-C (2011) Quantitative analysis of electron exit waves with single atom sensitivity. Antwerpen
toggle visibility
de Backer A (2015) Quantitative atomic resolution electron microscopy using advanced statistical techniques. Antwerpen
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: