Number of records found: 216
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Citations
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Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten”. Adriaensen L, Vangaever F, Gijbels R, Chemie magazine , 10 (2004)
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A compact μ-XRF spectrometer for (in-situ) analyses of cultural heritage and forensic materials”. Vittiglio G, Bichlmeier S, Klinger P, Heckel J, Fuzhong W, Vincze L, Janssens K, Engström P, Rindby A, Dietrich K, Jembrih-Simbürger D, Schreiner M, Denis D, Lakdar A, Lamotte A, Nuclear instruments and methods in physics research B 213, 693 (2004)
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Cultural heritage research in “The Micro and Trace Analysis Center&rdquo, of the University of Antwerp”. Godoi RHM, Kontozova V, Godoi AFL, Bencs L, Spolnik Z, Janssens K, Van Grieken R, Coalition 7, 11 (2004)
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Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
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The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES”. Shimizu K, Habazaki H, Bender H, Gijbels R, Engineering materials 52, 97 (2004)
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Hole band engineering in self-assembled quantum dots and molecules”. Peeters FM, Tadić M, Janssens KL, Partoens B s.l., page 191 (2004).
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Statistical experimental design for quantitative atomic resolution transmission electron microscopy”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D Academic Press, San Diego, Calif., page 1 (2004).
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Introduction and overview”. Janssens K, Van Grieken R page 1 (2004).
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Monte Carlo simulation for X-ray fluorescence spectroscopy”. Vincze L, Janssens K, Vekemans B, Adams F page 435 (2004).
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Polycapillary X-ray optics”. Gao N, Janssens K page 89 (2004).
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Preface”. Janssens K, Van Grieken R page xxvii-xxviii (2004).
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Provenance analysis of glass artefacts”. Gratuze B, Janssens K page 663 (2004).
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X-ray based methods of analysis”. Janssens K page 129 (2004).
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Damages caused to European monuments by air pollution: assessment and preventive measures”. Saiz-Jimenez C, Brimblecombe P, Camuffo D, Lefèvre R-A, Van Grieken R page 91 (2004).
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Effects of air pollution and microclimate on stained glass windows: prliminary results in the Sainte Chapelle (Paris)”. Bernardi A, Becherini F, Kontozova V, Godoi RHM, Van Grieken R, Deutsch F page 133 (2004).
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Introduction: considering the role of X-ray spectrometry in chemical analysis and outlining the volume”. Van Grieken R page 1 (2004).
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Investigation of individual particles and gaseous air pollutants in showcases”. Godoi RHM, Kontozova V, Godoi AFL, Van Grieken R page 147 (2004).
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Speciation and surface analysis of single particles using electron-excited X-ray emission spectrometry”. Szalóki I, Ro C-U, Osán J, de Hoog J, Van Grieken R page 569 (2004).
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Synchrotron radiation for microscopic X-ray fluorescence analysis”. Adams F, Vincze L, Vekemans B page 343 (2004).
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Kirschhock CEA, Liang D, Aerts A, Aerts CA, Kremer SPB, Jacobs PA, Van Tendeloo G, Martens JA (2004) On the TEM and AFM evidence of zeosil nanoslabs present during the synthesis of silicalite-1 : reply. Weinheim, 4562–4564
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Blumenau AT, Frauenheim T, Ö,berg S, Willems B, Van Tendeloo G (2004) Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy. Trans Tech Publications, s.l
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Kempenaers L, Vincze L, Vekemans B, Janssens K, Adams F, Somogyi A, Drakopoulos M, Simionovici AS (2004) Micro-heterogeneity study of trace elements in reference materials. 132 p
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Tsuji K, Injuk J, Van Grieken R (2004) X-ray spectrometry: recent technological advances. 616 p
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Non-destructive micoranalysis of cultural heritage materials”. Janssens K, Van Grieken R page 800 p. (2004).
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Simulation of poly-capillary lenses for coherent and partially coherent x-rays”. Vincze L, Kukhlevsky SV, Janssens K, Proceedings of the Society of Photo-optical Instrumentation Engineers T2 –, Conference on Advances in Computational Methods for X-Ray and Neutron, Optics, AUG 03-05, 2004, Denver, CO , 81 (2004). http://doi.org/10.1117/12.560740
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X-ray fluorescence microtomography and polycapillary based confocal imaging using synchrotron radiation”. Vincze L, Vekemans B, Szaloki I, Brenker FE, Falkenberg G, Rickers K, Aerts K, Van Grieken R, Adams F, , 220 (2004). http://doi.org/10.1117/12.560416
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Ab initio approach to superexchange interactions in alkali doped fullerides AC60”. Nikolaev AV, Michel KH, AIP conference proceedings T2 –, 18th International Winterschool/Euroconference on Electronic Properties, of Novel Materials, MAR 06-JUN 13, 2004, Kirchberg, AUSTRIA , 393 (2004). http://doi.org/10.1063/1.1812115
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High electron mobility in AlGaN/GaN HEMT grown on sapphire: strain modification by means of AIN interlayers”. Germain M, Leys M, Boeykens S, Degroote S, Wang W, Schreurs D, Ruythooren W, Choi K-H, van Daele B, Van Tendeloo G, Borghs G, Materials Research Society symposium proceedings 798, Y10.22 (2004)
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Synchrotron computed X-ray fluorescence tomography in environmental and earth sciences: radiation”. Vincze L, Vekemans B, Adams F, (2004)
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X-ray spectrometry for air pollution and cultural heritage research”. Van Grieken R, Delalieux F, (2004)
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