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The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
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Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization”. Charlier E, Gijbels R, Van Doorselaer M, De Keyzer R, , 172 (2000)
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The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS)”. Lenaerts J, Verlinden G, Gijbels R, Geuens I, Callant P, , 180 (2000)
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Caractérisation historique et chimique des peintures en grisaille et du verre de vitrail dans l'oeuvre de J.-B. Capronnier (1814 –, 1891) et J.-B. Bethune (1821 –, 1894)”. Caen J, Schalm O, Janssens K, (2000)
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Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
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Characterization of aerosol particles at Seoul, Korea, using ultrathin window EPMA”. Oh K-Y, Ro C-U, Kim HK, Van Grieken R, (2000)
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Characterization of aerosol particles collected at Kosan and 1100 Hill sites, Cheju Island, Korea, using ultrathin window EPMA”. Oh K-Y, Ro C-U, Kim HK, Kim Y-P, Van Grieken R, (2000)
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Gold particles supported on TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, , 369 (2000)
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Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties”. Kuhn LT, Vanhoutte F, Cannaerts M, Neukermans S, Verschoren G, Bouwen W, van Haesendonck C, Lievens P, Silverans RE, Pauwels B, Van Tendeloo G, (2000)
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Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
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Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
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TEM of nanostructured materials”. Van Tendeloo G, Pauwels B, Geuens P, Lebedev O, , 3 (2000)
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Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
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An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers”. Herrebout D, Bogaerts A, Yan M, Goedheer W, Dekempeneer E, Gijbels R, , 399 (2000)
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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