toggle visibility
Search within Results:
Display Options:
Number of records found: 167

Select All    Deselect All
 | 
Citations
 | 
   print
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling”. Verlinden G, Gijbels R, Geuens I, de Keyzer R, , 213 (2000)
toggle visibility
An extended RF methane plasma 1D fluid model of interest in deposition of diamond-like carbon layers”. Herrebout D, Bogaerts A, Yan M, Goedheer W, Dekempeneer E, Gijbels R, , 399 (2000)
toggle visibility
Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
toggle visibility
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates”. Lenaerts J, Verlinden G, van Vaeck L, Gijbels R, Geuens I, , 115 (2000)
toggle visibility
XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
toggle visibility
Gold particles supported on TiO2”. Giorgio S, Henry CR, Pauwels B, Van Tendeloo G, , 369 (2000)
toggle visibility
Granular films assembled of CoN, CrM and mixtures of CoN and CrM clusters: structure and electron transport properties”. Kuhn LT, Vanhoutte F, Cannaerts M, Neukermans S, Verschoren G, Bouwen W, van Haesendonck C, Lievens P, Silverans RE, Pauwels B, Van Tendeloo G, (2000)
toggle visibility
Structural changes in fluorinated T{'} and T* phases”. Hadermann J, Abakumov AM, Lebedev OI, Antipov EV, Van Tendeloo G, , 193 (2000)
toggle visibility
Structural properties of Au clusters on MgO”. Pauwels B, Van Tendeloo G, Bouwen W, Kuhn LT, Lievens P, , 383 (2000)
toggle visibility
TEM of nanostructured materials”. Van Tendeloo G, Pauwels B, Geuens P, Lebedev O, , 3 (2000)
toggle visibility
Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA”. Ro C-U, Oh K-Y, Van Grieken RE, (2000)
toggle visibility
Characterization of aerosol particles at Seoul, Korea, using ultrathin window EPMA”. Oh K-Y, Ro C-U, Kim HK, Van Grieken R, (2000)
toggle visibility
Characterization of aerosol particles collected at Kosan and 1100 Hill sites, Cheju Island, Korea, using ultrathin window EPMA”. Oh K-Y, Ro C-U, Kim HK, Kim Y-P, Van Grieken R, (2000)
toggle visibility
Caractérisation historique et chimique des peintures en grisaille et du verre de vitrail dans l'oeuvre de J.-B. Capronnier (1814 –, 1891) et J.-B. Bethune (1821 –, 1894)”. Caen J, Schalm O, Janssens K, (2000)
toggle visibility
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization”. Charlier E, Gijbels R, Van Doorselaer M, De Keyzer R, , 172 (2000)
toggle visibility
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS)”. Lenaerts J, Verlinden G, Gijbels R, Geuens I, Callant P, , 180 (2000)
toggle visibility
Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study”. Van Renterghem W, Schryvers D, van Landuyt J, Bollen D, Van Roost C, De Keyzer RB, , 38 (2000)
toggle visibility
The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
toggle visibility
Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application”. Ferroni M, Carotta MC, Guidi V, Martinelli G, Ronconi F, Richard O, van Dyck D, van Landuyt J, Sensors and actuators : B : chemical 68, 140 (2000). http://doi.org/10.1016/S0925-4005(00)00474-3
toggle visibility
Atmospheric aerosols in the Asian part of the former Soviet Union”. Van Grieken R, Jaenicke R, Koutsenogii KP, Khodzher TV, Kulipanov GN, AIP conference proceedings T2 –, 15th International Conference on Nucleation and Atmospheric Aerosols, (ICNAA), August 06-11, 2000, Univ. Missouri Rolla, Rolla, MO 534, 740 (2000)
toggle visibility
Gravitational energy of solar oscillations and climatic changes”. Callebaut DK, Makarovska Y, Tlatov, 463, 297 (2000)
toggle visibility
Janssens KHA, Adams FCV, Rindby A (2000) Microscopic X-ray fluorescence analysis. 419 p
toggle visibility
Einleitung zu den massenspektrometrischen Methoden”. Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 159 (2000).
toggle visibility
Electron microscopy and scanning microanalysis”. Oleshko V, Gijbels R, Amelinckx S Wiley, Chichester, page 9088 (2000).
toggle visibility
Glow discharge mass spectrometry, methods”. Bogaerts A Academic Press, San Diego, Calif., page 669 (2000).
toggle visibility
Multielementmassenspektrometrie (MMS)”. Jochum KP, Gijbels R, Adriaens A Schweizerbart, Stuttgart, page 188 (2000).
toggle visibility
Characterisation of individual aerosol particles for atmospheric and cultural heritage studies”. Van Grieken R, Gysels K, Hoornaert S, Joos P, Osán J, Szalóki I, Worobiec A page 215 (2000).
toggle visibility
Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate”. Geuens P, Lebedev OI, van Dyck D, Van Tendeloo G s.l., page 1133 (2000).
toggle visibility
Charge ordering and phase transitions in perovskite manganites: correlation with CMR properties”. Hervieu M, Martin C, Van Tendeloo G, Mercey B, Maignan A, Jirak Z, Raveau B s.l., page 179 (2000).
toggle visibility
Electron microscopy of fullerenes and related materials”. Van Tendeloo G, Amelinckx S Wiley-VCH, Weinheim, page 353 (2000).
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: