Vereecke, B.; van der Veen, M.H.; Sugiura, M.; Kashiwagi, Y.; Ke, X.; Cott, D.J.; Hantschel, T.; Huyghebaert, C.; Tökei, Z. |
Wafer-level electrical evaluation of vertical carbon nanotube bundles as a function of growth temperature |
2013 |
Japanese journal of applied physics |
52 |
5 |
UA library record; WoS full record; WoS citing articles |