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Author
Title
Year
Publication
Volume
Times cited
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Lenaerts, J.
;
Verlinden, G.
;
Ignatova, V.A.
;
van Vaeck, L.
;
Gijbels, R.
;
Geuens, I.
Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)
2001
Fresenius' journal of analytical chemistry
370
3
UA library record
;
WoS full record
;
WoS citing articles