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Author | Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. | ||||
Title | The primary energy dependence of backscattered electron images up to 100 keV | Type | A1 Journal article | ||
Year | 1991 | Publication | Scanning microscopy | Abbreviated Journal | |
Volume | 5 | Issue | 2 | Pages | 339-344 |
Keywords ![]() |
A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Chicago, Ill. | Editor | ||
Language | Wos | A1991GC67000005 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0891-7035 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 3 | Open Access | ||
Notes | Approved | no | |||
Call Number | UA @ lucian @ c:irua:709 | Serial | 2713 | ||
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