Number of records found: 2109
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Comparative analysis of tight-binding models for transition metal dichalcogenides”. Jorissen B, Covaci L, Partoens B, SciPost physics core 7, 004 (2024). http://doi.org/10.21468/SCIPOSTPHYSCORE.7.1.004
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Low-dose 4D-STEM tomography for beam-sensitive nanocomposites”. Hugenschmidt M, Jannis D, Kadu AA, Grünewald L, De Marchi S, Perez-Juste J, Verbeeck J, Van Aert S, Bals S, ACS materials letters 6, 165 (2023). http://doi.org/10.1021/ACSMATERIALSLETT.3C01042
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Single-organoid analysis reveals clinically relevant treatment-resistant and invasive subclones in pancreatic cancer”. Le Compte M, Cardenas De La Hoz E, Peeters S, Rodrigues Fortes F, Hermans C, Domen A, Smits E, Lardon F, Vandamme T, Lin A, Vanlanduit S, Roeyen G, van Laere S, Prenen H, Peeters M, Deben C, npj Precision Oncology 7, 128 (2023). http://doi.org/10.1038/S41698-023-00480-Y
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Whole transcriptome analysis highlights nutrient limitation of nitrogen cycle bacteria in simulated microgravity”. Verbeelen T, Fernandez CA, Nguyen TH, Gupta S, Aarts R, Tabury K, Leroy B, Wattiez R, Vlaeminck SE, Leys N, Ganigué, R, Mastroleo F, NPJ microgravity 10, 3 (2024). http://doi.org/10.1038/S41526-024-00345-Z
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Auranofin repurposing for lung and pancreatic cancer : low CA12 expression as a marker of sensitivity in patient-derived organoids, with potentiated efficacy by AKT inhibition”. Deben C, Freire Boullosa L, Rodrigues Fortes F, Cardenas De La Hoz E, Le Compte M, Seghers S, Peeters M, Vanlanduit S, Lin A, Dijkstra KK, Van Schil P, Hendriks JMH, Prenen H, Roeyen G, Lardon F, Smits E, Journal of Experimental and Clinical Cancer Research 43, 88 (2024). http://doi.org/10.1186/S13046-024-03012-Z
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Finizola e Silva M, Van Schoubroeck S, Cools J, Aboge DO, Ouma M, Olweny C, Van Passel S (2024) Local actors' perspectives on sustainable food value chains : evidence from a Q-methodology study in Kenya. 36–51
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Why, how, when, and for whom does digital disconnection work? A process-based framework of digital disconnection”. Vanden Abeele MMP, Vandebosch H, Koster EHW, De Leyn T, Van Gaeveren K, de Segovia Vicente D, Van Bruyssel S, van Timmeren T, De Marez L, Poels K, DeSmet A, De Wever B, Verbruggen M, Baillien E, Communication theory 34, 3 (2024). http://doi.org/10.1093/CT/QTAD016
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Shuffling atomic layer deposition gas sequences to modulate bimetallic thin films and nanoparticle properties”. Filez M, Feng J-Y, Minjauw MM, Solano E, Poonkottil N, Van Daele M, Ramachandran RK, Li C, Bals S, Poelman H, Detavernier C, Dendooven J, Filez M, Minjauw M, Solano E, Poonkottil N, Li C, Bals S, Dendooven J, Chemistry of materials (2022). http://doi.org/10.1021/acs.chemmater.2c01304
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Ab initio spectroscopy and thermochemistry of the BN molecule”. Martin JML, François JP, Gijbels R, Zeitschrift für Physik : D : atoms, molecules and clusters 21, 47 (1991)
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L'analyse des eaux géothermales par spectrométrie de masse à, étincelles”. Vandelannoote R, Blommaert W, van Grieken R, Gijbels R, Spectra 2000: la revue de l'instrumentation 53, 66 (1979)
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Analysis of thermal waters by ICP-MS”. Veldeman E, Van 't dack L, Gijbels R, Campbell M, Vanhaecke F, Vanhoe H, Vandecasteele C The Royal Society of Chemistry, Cambridge, page 25 (1991).
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Gijbels R, van Grieken R (1977) Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees). S.l
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Gijbels R, van Grieken R, Blommaert W, Van 't dack L, van Espen P, Nullens H, Saelens R (1983) Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges). S.l
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Application of neural networks in image analysis: the classification of geometrical shapes”. Geuens I, Nys B, Gijbels R, Jacob W, CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10, 61 (1993)
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Application of trace element analysis to geothermal waters”. Gijbels R, van Grieken R, Blommaert W, Vandelannoote R, Van 't dack L, , 429 (1977)
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Atomic imaging of cage like structures of silicon”. Nistor L, Van Tendeloo G, Amelinckx S, Cros C, Physica status solidi: A: applied research 146, 119 (1994). http://doi.org/10.1002/pssa.2211460111
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Atomic mass spectrometry”. Gijbels R, Oksenoid KG Academic Press, London, page 2839 (1995).
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Atomic resolution of interfaces in ceramic-superconductors”. Van Tendeloo G, Krekels T, Amelinckx S, Hervieu M, Raveau B, Greaves C, , 35 (1995)
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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Cation ordering in Tl- and Hg-based superconducting materials”. Van Tendeloo G, De Meulenaere P, Hervieu M, Letouze F, Martin C, (1996)
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Characteristic mosaic texture related to orderingin AuCu-9at.%Ag pseudobinary alloy”. Yasuda K, Hisatsune K, Udoh K, Tanaka Y, Van Tendeloo G, van Landuyt J, Dentistry in Japan 29, 91 (1992)
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Characterization of complex silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Microbeam analysis 3, 1 (1994)
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Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging”. Goessens C, Schryvers D, van Landuyt J, Amelinckx S, Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, (1991)
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Charged-impurity correlations in a δ-doped quantum barrier”. Koenraad PM, Shi JM, van de Stadt AFW, Smets A, Perenboom JAAJ, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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Charged-impurity correlations in Si ?-doped GaAs”. Shi JM, Koenraad PM, van de Stadt AFW, Peeters FM, Devreese JT, Wolter JH, , 2351 (1996)
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The chemical characterization of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 251 (1993)
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Combined characterization of nanostructures by AEM and STM”. Oleshko V, Gijbels R, Jacob W, Alfimov M, Mikrochimica acta: supplementum 13, 435 (1996)
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Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques”. Oleshko VP, Gijbels R, Jacob W, , 46 (1996)
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Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders”. Jenett H, Grallath E, Riedel R, Strecker K, Gijbels R, Kennis P, Fres J. Anal. Chem. 341, 265 (1991)
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Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy”. Oleshko V, Gijbels R, Jacob W, Alfimov M Editions de physique, Les Ulis, page 701 (1994).
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