Number of records found: 71
 | 
Citations
 | 
   web
Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
toggle visibility
James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry”. van der Snickt G, Janssens K, Schalm O, Aibéo C, Kloust H, Alfeld M, X-ray spectrometry 39, 103 (2010). http://doi.org/10.1002/XRS.1235
toggle visibility
Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
toggle visibility
Awards for best referees of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 68 (2014). http://doi.org/10.1002/XRS.2530
toggle visibility
EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials”. Belikov KN, Mikhailova LI, Spolnik ZM, Van Grieken R, X-ray spectrometry 35, 112 (2006). http://doi.org/10.1002/XRS.874
toggle visibility
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 131 (1986). http://doi.org/10.1002/XRS.1300150211
toggle visibility
Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
toggle visibility
Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 67 (2014). http://doi.org/10.1002/XRS.2534
toggle visibility
Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
toggle visibility
A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
toggle visibility
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
toggle visibility
Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
toggle visibility
Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis”. Labrecque JJ, Beusen JM, Van Grieken RE, X-ray spectrometry 15, 13 (1986). http://doi.org/10.1002/XRS.1300150105
toggle visibility
Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
toggle visibility
Editorial : award for best X-Ray Spectrometry referee during 2011-2012”. Van Grieken R, X-ray spectrometry 42, 3 (2013). http://doi.org/10.1002/XRS.2428
toggle visibility
Heterogeneity effects in direct X-ray fluorescence analysis of hair”. Török S, Van Dyck P, Van Grieken R, X-ray spectrometry 13, 27 (1984). http://doi.org/10.1002/XRS.1300130106
toggle visibility
Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents”. Török S, Braun T, Van Dyck P, Van Grieken R, X-ray spectrometry 15, 7 (1986). http://doi.org/10.1002/XRS.1300150104
toggle visibility
Introducing four new members of the editorial board of X-ray spectrometry”. Van Grieken R, X-ray spectrometry 44, 1 (2015). http://doi.org/10.1002/XRS.2577
toggle visibility
New members of the editorial board of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 42, 1 (2013). http://doi.org/10.1002/XRS.2431
toggle visibility
Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
toggle visibility
Automated segmentation of μ-XRF image sets”. Vekemans B, Janssens K, Vincze L, Aerts A, Adams F, Hertogen J, X-ray spectrometry 26, 333 (1997)
toggle visibility
Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
toggle visibility
ID18F: a new micro-X-ray fluorescence end-station at the European Synchrotron Radiation Facility (ESRF): preliminary results”. Somogyi A, Drakopoulos M, Vincze L, Vekemans B, Camerani C, Janssens K, Snigirev A, Adams F, X-ray spectrometry 30, 242 (2001). http://doi.org/10.1002/XRS.494.ABS
toggle visibility
Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
toggle visibility
Use of microscopic XRF for non-destructive analysis in art an archaeometry”. Janssens K, Vittiglio G, Deraedt I, Aerts A, Vekemans B, Vincze L, Wei F, de Ryck I, Schalm O, Adams F, Rindby A, Knöchel A, Simionovici AS, Snigirev A, X-ray spectrometry 29, 73 (2000). http://doi.org/10.1002/(SICI)1097-4539(200001/02)29:1<73::AID-XRS416>3.3.CO;2-D
toggle visibility
Comparison of four mobile, non‐invasive diagnostic techniques for differentiating glass types in historical leaded windows : MA‐XRF , UV–Vis–NIR, Raman spectroscopy and IRT”. Cagno S, van der Snickt G, Legrand S, Caen J, Patin M, Meulebroeck W, Dirkx Y, Hillen M, Steenackers G, Rousaki A, Vandenabeele P, Janssens K, X-Ray Spectrometry , xrs.3185 (2020). http://doi.org/10.1002/XRS.3185
toggle visibility
X-ray spectrometry applied for characterization of bricks of Brazilian historical sites”. Asfora VK, Bueno CC, de Barros VM, Khoury H, Van Grieken R, X-Ray Spectrometry , 1 (2020). http://doi.org/10.1002/XRS.3194
toggle visibility
Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
toggle visibility
Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
toggle visibility
EDXRS study of aerosol composition variations in air masses crossing the North Sea”. Injuk J, van Malderen H, Van Grieken R, Swietlicki E, Knox JM, Schofield R, X-ray spectrometry 22, 220 (1993). http://doi.org/10.1002/XRS.1300220410
toggle visibility