Number of records found: 139
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Citations
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Trace metals in the St-Louis aerosol”. Winchester JW, Meinert DL, Nelson JW, Johansson TB, Van Grieken RE, Orsini C, Kaufmann HC, Akselsson R page 385 (1975).
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Use of grazing emission XRF spectrometry for silicon wafer surface contamination measurements”. de Gendt S, Kenis K, Mertens PW, Heyns MM, Claes M, Van Grieken RE, Bailleul A, Knotter M, de Bokx PK, (1996)
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Use of stable isotope measurements to evaluate the origin of suphur in gypsum layers on limestone buildings”. Torfs KM, Van Grieken RE, Buzek F, Environmental science and technology 31, 2650 (1997)
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Weathering of treated and untreated limestones in atmospheric exposures”. Vleugels GJ, Van Grieken RE, Journal of preservation technology 23, 48 (1991)
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X-ray fluorescence”. Injuk J, Van Grieken RE page 151 (2001).
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X-ray spectrometry”. Van Grieken RE page 13269 (2000).
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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X-ray spectrometry”. Török SB, Van Grieken RE, Analytical chemistry 64r, 180 (1992)
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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Analysis of X-ray spectra excited by X rays, electrons, and protons in monazite”. Annegarn HJ, Madiba CCP, Sellschop JPF, Genz H, Hoffmann DHH, Low W, Richter A, Van Grieken RE, Physical review : C : nuclear physics 16, 379 (1977). http://doi.org/10.1103/PHYSREVC.16.379
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Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis”. Labrecque JJ, Beusen JM, Van Grieken RE, X-ray spectrometry 15, 13 (1986). http://doi.org/10.1002/XRS.1300150105
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Elemental analysis of aerosols using proton-scattering”. Nelson JW, Williams I, Johansson TB, Van Grieken RE, IEEE transactions on nuclear science Ns21, 618 (1974). http://doi.org/10.1109/TNS.1974.4327522
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Phosphorus, calcium and lead distribution in collagen in lead induced soft tissue calcification : an ultrastructural and X-ray microanalytical study”. Vandeputte DF, Jacob WA, Van Grieken RE, Matrix 10, 33 (1990). http://doi.org/10.1016/S0934-8832(11)80135-6
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Background aerosol composition in the Namib Desert, South West-Africa (Namibia)”. Annegarn HJ, Van Grieken RE, Dibby DM, Von Blottnitz F, Atmospheric environment : an international journal 17, 2045 (1983). http://doi.org/10.1016/0004-6981(83)90361-X
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Effects of titanium dioxide industry waste dumping on sea water chemistry”. Roekens EJ, Van Grieken RE, Water research 17, 1385 (1983). http://doi.org/10.1016/0043-1354(83)90268-3
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Absorption correction for X-ray-fluorescence analysis of aerosol loaded filters”. Adams FC, Van Grieken RE, Analytical chemistry 47, 1767 (1975). http://doi.org/10.1021/AC60361A040
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Classification of suspended particles in deposition samples and run-off water samples from a limestone cathedral”. Leysen LA, Roekens EJ, Storms H, Van Grieken RE, Atmospheric environment 21, 2425 (1987). http://doi.org/10.1016/0004-6981(87)90377-5
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Losses of metabolically incorporated selenium in common digestion procedures for biological material”. Robberecht HJ, Van Grieken RE, Van den Bosch PA, Deelstra H, vanden Berghe D, Talanta : the international journal of pure and applied analytical chemistry 29, 1025 (1982). http://doi.org/10.1016/0039-9140(82)80244-0
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Co-crystallization with 1-(2-pyridylazo)-2-naphthol, and X-ray fluorescence, for trace metal analysis of water”. Vanderstappen MG, Van Grieken RE, Talanta : the international journal of pure and applied analytical chemistry 25, 653 (1978). http://doi.org/10.1016/0039-9140(78)80166-0
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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Grazing exit electron probe microanalysis for surface and particle analysis”. Tsuji K, Wagatsuma K, Nullens R, Van Grieken RE, Analytical chemistry 71, 2497 (1999). http://doi.org/10.1021/AC990075P
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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