Number of records found: 8874
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A distinct correlation between the vibrational and thermal transport properties of group VA monolayer crystals”. Kocabas T, Cakir D, Gulseren O, Ay F, Perkgoz NK, Sevik C, Nanoscale 10, 7803 (2018). http://doi.org/10.1039/C7NR09349G
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Determination of platinum, palladium, and rhodium in automotive catalysts using high-energy secondary target X-ray fluorescence spectrometry”. van Meel K, Smekens A, Behets M, Kazandjian P, Van Grieken R, Analytical chemistry 79, 6383 (2007). http://doi.org/10.1021/AC070815R
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Removal of a past varnish treatment from a 19th-century Belgian wall painting by means of a solvent-loaded double network hydrogel”. Al-Emam E, Beltran V, De Meyer S, Nuyts G, Wetemans V, De Wael K, Caen J, Janssens K, Polymers 13, 2651 (2021). http://doi.org/10.3390/POLYM13162651
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Signatures of subband excitons in few-layer black phosphorus”. Chaves A, Sousa GO, Khaliji K, da Costa DR, Farias GA, Low T, Physical Review B 103, 165428 (2021). http://doi.org/10.1103/PHYSREVB.103.165428
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Charging of vitreous samples in cryogenic electron microscopy mitigated by graphene”. Zhang Y, van Schayck JP, Pedrazo-Tardajos A, Claes N, Noteborn WEM, Lu P-H, Duimel H, Dunin-Borkowski RE, Bals S, Peters PJ, Ravelli RBG, ACS nano 17, 15836 (2023). http://doi.org/10.1021/ACSNANO.3C03722
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Chip-based in situ TEM investigation of structural thermal instability in aged layered cathode”. Wang Y, Yuan Y, Liao X, Van Tendeloo G, Zhao Y, Sun C, Nanoscale Advances 5, 4182 (2023). http://doi.org/10.1039/D3NA00201B
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Fractal design of hierarchical PtPd with enhanced exposed surface atoms for highly catalytic activity and stability”. Ying J, Xiao Y, Chen J, Hu Z-Y, Tian G, Van Tendeloo G, Zhang Y, Symes MDD, Janiak C, Yang X-Y, Nano letters 23, 7371 (2023). http://doi.org/10.1021/ACS.NANOLETT.3C01190
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Multi-scale X-ray imaging of the pigment discoloration processes triggered by chlorine compounds in the Upper Basilica of Saint Francis of Assisi”. Avranovich Clerici E, De Meyer S, Vanmeert F, Legrand S, Monico L, Miliani C, Janssens K, Molecules: a journal of synthetic chemistry and natural product chemistry 28, 6106 (2023). http://doi.org/10.3390/MOLECULES28166106
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Two pathways for the degradation of orpiment pigment (As₂S₃) found in paintings”. Broers FTH, Janssens K, Weker JN, Webb SM, Mehta A, Meirer F, Keune K, Journal of the American Chemical Society 145, 8847 (2023). http://doi.org/10.1021/JACS.2C12271
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Wave-packet scattering at a normal-superconductor interface in two-dimensional materials : a generalized theoretical approach”. Linard FJA, Moura VN, Covaci L, Milošević, MV, Chaves A, Physical review B 107, 165306 (2023). http://doi.org/10.1103/PHYSREVB.107.165306
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A multi-scale characterization of deformation twins in Ti6Al4V sheet material deformed by simple shear”. Tirry W, Coghe F, Bouvier S, Gasperini M, Rabet L, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 527, 4136 (2010). http://doi.org/10.1016/j.msea.2010.03.039
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Efficient amorphous platinum catalyst cluster growth on porous carbon : a combined molecular dynamics and experimental study”. Xie L, Brault P, Coutanceau C, Bauchire J-M, Caillard A, Baranton S, Berndt J, Neyts EC, Applied catalysis : B : environmental 162, 21 (2015). http://doi.org/10.1016/j.apcatb.2014.06.032
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Reversible Li-intercalation through oxygen reactivity in Li-rich Li-Fe-Te oxide materials”. McCalla E, Prakash AS, Berg E, Saubanere M, Abakumov AM, Foix D, Klobes B, Sougrati MT, Rousse G, Lepoivre F, Mariyappan S, Doublet ML, Gonbeau D, Novak P, Van Tendeloo G, Hermann RP, Tarascon JM;, Journal of the electrochemical society 162, A1341 (2015). http://doi.org/10.1149/2.0991507jes
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Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Institute of physics conference series T2 –, Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND , 495 (1999)
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An alternative approach for ζ-factor measurement using pure element nanoparticles”. Zanaga D, Altantzis T, Sanctorum J, Freitag B, Bals S, Ultramicroscopy 164, 11 (2016). http://doi.org/10.1016/j.ultramic.2016.03.002
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Cyclist exposure to black carbon, ultrafine particles and heavy metals : an experimental study along two commuting routes near Antwerp, Belgium”. Hofman J, Samson R, Joosen S, Blust R, Lenaerts S, Environmental research 164, 530 (2018). http://doi.org/10.1016/J.ENVRES.2018.03.004
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Measuring the height-to-height correlation function of corrugation in suspended graphene”. Kirilenko DA, Brunkov PN, Ultramicroscopy 165, 1 (2016). http://doi.org/10.1016/j.ultramic.2016.03.010
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Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering”. Moors K, Sorée B, Magnus W, Microelectronic engineering 167, 37 (2017). http://doi.org/10.1016/J.MEE.2016.10.015
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Orientation relationship of the austenite-to-ferrite transformation in austenitic stainless steels due to dissolution corrosion in contact with liquid Pb-Bi eutectic”. Charalampopoulou E, Cautaerts N, Van der Donck T, Schryvers D, Lambrinou K, Delville R, Scripta materialia 167, 66 (2019). http://doi.org/10.1016/J.SCRIPTAMAT.2019.03.035
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Progress and new advances in simulating electron microscopy datasets using MULTEM”. Lobato I, Van Aert S, Verbeeck J, Ultramicroscopy 168, 17 (2016). http://doi.org/10.1016/j.ultramic.2016.06.003
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Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation”. Stuer C, Steegen A, van Landuyt J, Bender H, Maex K, Institute of physics conference series , 481 (2001)
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EFTEM study of plasma etched low-k Si-O-C dielectrics”. Hens S, Bender H, Donaton RA, Maex K, Vanhaelemeersch S, van Landuyt J, Institute of physics conference series T2 –, Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND , 415 (2001)
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HREM investigation of a Fe/GaN/Fe tunnel junction”. Nistor L, Bender H, van Landuyt J, Nemeth S, Boeve H, De Boeck J, Borghs G, Institute of physics conference series T2 –, Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England , 53 (2001)
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Aqueous CSD approach for the growth of novel, lattice-tuned LaxCe1-xO\delta epitaxial layers”. Narayanan V, Lommens P, De Buysser K, Vanpoucke DEP, Huehne R, Molina L, Van Tendeloo G, van der Voort P, Van Driessche I, Journal of materials chemistry 22, 8476 (2012). http://doi.org/10.1039/c2jm15752g
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Cation ordering and flexibility of the BO42- tetrahedra in incommensurately modulated CaEu2(BO4)4 (B = Mo, W) scheelites”. Abakumov AM, Morozov VA, Tsirlin AA, Verbeeck J, Hadermann J, Inorganic chemistry 53, 9407 (2014). http://doi.org/10.1021/ic5015412
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Comment on “Transverse rectification in superconducting thin films with arrays of asymmetric defects””. Silhanek AV, van de Vondel J, Moshchalkov VV, Metlushko V, Ilic B, Misko VR, Peeters FM, Applied physics letters 92 (2008). http://doi.org/10.1063/1.2920078
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Comparative Hall studies in the electron- and hole-doped manganites La0.33Ca0.67MnO3 and La0.70Ca0.30MnO3”. Gordon I, Wagner P, Das A, Vanacken J, Moshchalkov VV, Bruynseraede Y, Schuddinck W, Van Tendeloo G, Ziese M, Borghs G, Physical review : B : condensed matter and materials physics 62, 11633 (2000). http://doi.org/10.1103/PhysRevB.62.11633
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Computer modelling of the plasma chemistry and plasma-based growth mechanisms for nanostructured materials”. Bogaerts A, Eckert M, Mao M, Neyts E, Journal of physics: D: applied physics 44, 174030 (2011). http://doi.org/10.1088/0022-3727/44/17/174030
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Crystal structure of a lightweight borohydride from submicrometer crystallites by precession electron diffraction”. Hadermann J, Abakumov A, Van Rompaey S, Perkisas T, Filinchuk Y, Van Tendeloo G, Chemistry of materials 24, 3401 (2012). http://doi.org/10.1021/cm301548k
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Current fluctuations in boundary driven diffusive systems in different dimensions : a numerical study”. Becker T, Nelissen K, Cleuren B, New journal of physics 17, 055023 (2015). http://doi.org/10.1088/1367-2630/17/5/055023
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