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Author
Title
Year
Publication
Volume
Times cited
Additional Links
Nord, M.
;
Verbeeck, J.
Open Source Development Tools for Robust and Reproducible Electron Microscopy Data Analysis
2019
Microscopy And Microanalysis
25
Van Aert, S.
;
Verbeeck, J.
;
Bals, S.
;
Erni, R.
;
van Dyck, D.
;
Van Tendeloo, G.
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy
2009
Microscopy and microanalysis
15
1
UA library record
;
WoS full record
;
WoS citing articles
Verbeeck, J.
;
Van Aert, S.
;
Zhang, L.
;
Haiyan, T.
;
Schattschneider, P.
;
Rosenauer, A.
Computational aspects in quantitative EELS
2010
Microscopy and microanalysis
16
UA library record
Bals, S.
;
Van Aert, S.
;
Verbeeck, J.
;
Van Tendeloo, G.
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy
2007
Microscopy and microanalysis
13
UA library record
