NANOlab Center of Excellence literature database -- Query Results

“Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813 Keywords: A3 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.891 DOI: 10.1017/S1431927604882813 Additional Links: UA library record show.php?record=2714
“TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.891 DOI: 10.1017/S1431927604881765 Additional Links: UA library record show.php?record=3475
“Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab Impact Factor: 1.891 DOI: 10.1017/S143192761100554X Additional Links: UA library record show.php?record=3792
“Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.891 DOI: 10.1017/S1431927607081664 Additional Links: UA library record show.php?record=3224
“Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 1.891 DOI: 10.1017/S1431927614005558 Additional Links: UA library record show.php?record=3687
“Crystal structure of the group of optical materials Ln₂MeGe₄O₁₂ (Me = Ca, Mn)”. Tarakina NV, Zubkov VG, Leonidov II, Tyutunnik AP, Surat LL, Hadermann J, Van Tendeloo G, Zeitschrift für Kristallographie , 401 (2009). http://doi.org/10.1524/zksu.2009.0059 Abstract: The crystal structure of the group of optical materials Ln2MeGe4O12, Ln = Eu, Gd, Dy-Lu, Y; Me = Ca, Mn and of the solid solution (Y1-xErx)2CaGe4O12 (x = 0 – 1), promising materials for photonics, has been studied in detail. The crystal structure of all compounds exhibit two alternating layers: one formed by Ln and Me atoms and another by cyclic [Ge4O12]8- anions. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Times cited: 7 DOI: 10.1524/zksu.2009.0059 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=575
“Investigation of stacking disorder in Li₂SnO₃”. Tarakina NV, Denisova TA, Maksimova LG, Baklanova YV, Tyutyunnik AP, Berger IF, Zubkov VG, Van Tendeloo G, Zeitschrift für Kristallographie , 375 (2009). http://doi.org/10.1524/zksu.2009.0055 Abstract: A crystal structure investigation of the low temperature Li2SnO3 modification has been carried out. X-ray, neutron powder and electron diffraction data showed that this compound crystallizes in a monoclinic unit cell with parameters: a = 5.3033(2)Å, b = 9.1738(3)Å, c = 10.0195(2)Å, β ~ 100.042(2)º and has stacking disorder along the c-axis. Simulation of diffraction patterns with different stacking faults mainly reveal the presence of rotational stacking faults with a probability of about 40% . Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Times cited: 16 DOI: 10.1524/zksu.2009.0055 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=1735
“Comparative study of structural properties and photoluminescence in InGaN layers with a high In content”. Vantomme A, Wu MF, Hogg S, van Landuyt J, et al, Internet journal of nitride semiconductor research T2 –, Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5, art. no.-W11.38 (2000) Abstract: Rutherford backscattering and channeling spectrometry (RBS), photoluminescence (PL) spectroscopy and transmission electron microscopy (TEM) have been used to investigate macroscopic and microscopic segregation in MOCVD grown InGaN layers. The PL peak energy and In content (measured by RES) were mapped at a large number of distinct points on the samples. An indium concentration of 40%, the highest measured in this work, corresponds to a PL peak of 710 nn strongly suggesting that the light-emitting regions of the sample me very indium-rich compared to the average measured by RES. Cross-sectional TEM observations show distinctive layering of the InGaN films. The TEM study further reveals that these layers consist of amorphous pyramidal contrast features with sizes of order 10 nm The composition of these specific contrast features is shown to be In-rich compared to the nitride matrix. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Additional Links: UA library record; WoS full record; show.php?record=423
“Recent EM investigations on nano-and micro-defect structures in SMAs”. Schryvers D, Cao S, Pourbabak, Shi H, Lu, Journal of alloys and compounds 577, S705 (2013). http://doi.org/10.1016/j.jallcom.2011.10.112 Abstract: The present contribution reviews some recent electron microscopy investigations on different shape memory systems in which a variety of nano- and micro-defect structures play an essential role in the functional behaviour of the material. (NiTi3)-Ti-4 precipitates in Ni-Ti are a well-known example for which the focus is now on the 3D configurations, in Ni-Ti-Nb Nb-rich nanoprecipitates are thought to have a large impact on the hysteresis, in Co-Ni-Al an Al-enriched zone nearby the y'-precipitates yields a small sandwiched austenite while some first signs of quasidynamical lattice deformation in non-frozen Ni-Ti strain glass are measured by Cs-aberration-corrected transmission electron microscopy. (C) 2011 Elsevier B.V. All rights reserved. Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) Impact Factor: 3.133 Times cited: 7 DOI: 10.1016/j.jallcom.2011.10.112 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=2839
“The study of high T_c-superconducting materials by electron microscopy and electron diffraction”. Amelinckx S, Van Tendeloo G, van Landuyt J, Superconductor science and technology T2 –, SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4, S19 (1991). http://doi.org/10.1088/0953-2048/4/1S/003 Abstract: A survey is given of the application of different electron microscopic techniques to the study of structural features of high T(c)-superconducting materials. Emphasis is laid in this contribution on those structural aspects for the study of which electron microscopy has been essential or has contributed to a significant extent. Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 2.325 Times cited: 2 DOI: 10.1088/0953-2048/4/1S/003 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=3596
“Effect of annealing on cold-rolled Ni-Ti alloys”. Srivastava AK, Yang Z, Schryvers D, van Hurnbeeck J, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 594 (2008). http://doi.org/10.1016/j.msea.2006.12.216 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 3.094 Times cited: 8 DOI: 10.1016/j.msea.2006.12.216 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=797
“In situ transmission electron microscopy of stress-induced martensite with focus on martensite twinning”. Tirry W, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 420 (2008). http://doi.org/10.1016/j.msea.2006.12.214 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 3.094 Times cited: 22 DOI: 10.1016/j.msea.2006.12.214 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=1586
“New (3(3)under-bar) long-period microtwin variant in the martensitic phase of the PtTi alloy”. Rotaru G-M, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 437 (2008). http://doi.org/10.1016/j.msea.2006.12.201 Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 3.094 Times cited: 3 DOI: 10.1016/j.msea.2006.12.201 Additional Links: UA library record; WoS full record; WoS citing articles show.php?record=2300
“Structural properties of c-axis oriented epitaxial YBa₂Cu₃O_7-\delta thin films”. Ye M, Schroeder J, Deltour R, Delplancke MP, Winand R, Verbist K, Van Tendeloo G, Superlattices and microstructures 21, 287 (1997) Keywords: A1 Journal article; Electron microscopy for materials research (EMAT) Impact Factor: 2.123 Additional Links: UA library record; WoS full record; show.php?record=3255

“Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813

“TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765

“Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X

“Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664

“Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558

“Crystal structure of the group of optical materials Ln₂MeGe₄O₁₂ (Me = Ca, Mn)”. Tarakina NV, Zubkov VG, Leonidov II, Tyutunnik AP, Surat LL, Hadermann J, Van Tendeloo G, Zeitschrift für Kristallographie , 401 (2009). http://doi.org/10.1524/zksu.2009.0059

“Investigation of stacking disorder in Li₂SnO₃”. Tarakina NV, Denisova TA, Maksimova LG, Baklanova YV, Tyutyunnik AP, Berger IF, Zubkov VG, Van Tendeloo G, Zeitschrift für Kristallographie , 375 (2009). http://doi.org/10.1524/zksu.2009.0055

“Comparative study of structural properties and photoluminescence in InGaN layers with a high In content”. Vantomme A, Wu MF, Hogg S, van Landuyt J, et al, Internet journal of nitride semiconductor research T2 –, Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5, art. no.-W11.38 (2000)

“Recent EM investigations on nano-and micro-defect structures in SMAs”. Schryvers D, Cao S, Pourbabak, Shi H, Lu, Journal of alloys and compounds 577, S705 (2013). http://doi.org/10.1016/j.jallcom.2011.10.112

“The study of high T_c-superconducting materials by electron microscopy and electron diffraction”. Amelinckx S, Van Tendeloo G, van Landuyt J, Superconductor science and technology T2 –, SATELLITE CONF TO THE 19TH INTERNATIONAL CONF ON LOW TEMPERATURE PHYSICS : HIGH TEMPERATURE SUPERCONDUCTIVITY, AUG 13-15, 1990, QUEENS COLL, CAMBRIDGE, ENGLAND 4, S19 (1991). http://doi.org/10.1088/0953-2048/4/1S/003

“Effect of annealing on cold-rolled Ni-Ti alloys”. Srivastava AK, Yang Z, Schryvers D, van Hurnbeeck J, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 594 (2008). http://doi.org/10.1016/j.msea.2006.12.216

“In situ transmission electron microscopy of stress-induced martensite with focus on martensite twinning”. Tirry W, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 420 (2008). http://doi.org/10.1016/j.msea.2006.12.214

“New (3(3)under-bar) long-period microtwin variant in the martensitic phase of the PtTi alloy”. Rotaru G-M, Schryvers D, Materials science and engineering: part A: structural materials: properties, microstructure and processing 481, 437 (2008). http://doi.org/10.1016/j.msea.2006.12.201

“Structural properties of c-axis oriented epitaxial YBa₂Cu₃O_7-\delta thin films”. Ye M, Schroeder J, Deltour R, Delplancke MP, Winand R, Verbist K, Van Tendeloo G, Superlattices and microstructures 21, 287 (1997)