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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Colla, M.-S.; Amin-Ahmadi, B.; Idrissi, H.; Malet, L.; Godet, S.; Raskin, J.-P.; Schryvers, D.; Pardoen, T. |
Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing |
2015 |
Nature communications |
6 |
34 |
UA library record; WoS full record; WoS citing articles |
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Idrissi, H.; Turner, S.; Mitsuhara, M.; Wang, B.; Hata, S.; Coulombier, M.; Raskin, J.-P.; Pardoen, T.; Van Tendeloo, G.; Schryvers, D. |
Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study |
2011 |
Microscopy and microanalysis |
17 |
25 |
UA library record; WoS full record; WoS citing articles |
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Amin-Ahmadi, B.; Idrissi, H.; Delmelle, R.; Pardoen, T.; Proost, J.; Schryvers, D. |
High resolution transmission electron microscopy characterization of fcc -> 9R transformation in nanocrystalline palladium films due to hydriding |
2013 |
Applied physics letters |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
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