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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Adelmann, C.; Wen, L.G.; Peter, A.P.; Pourtois, G.; et al. |
Alternative metals for advanced interconnects |
2014 |
2014 Ieee International Interconnect Technology Conference / Advanced Metallization Conference (iitc/amc) |
|
|
UA library record; WoS full record; |
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Helm, M.; Hilber, W.; Fromherz, T.; Peeters, F.M.; Alavi, K.; Pathak, R.N. |
Bloch and localized electrons in semiconductor superlattices |
1994 |
Semiconductor science and technology |
9 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Buschmann, V.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
A comparative investigation of replication techniques used for the study of (S+Au) sensitized AgBr microcrystals |
1996 |
The journal of imaging science and technology |
40 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A. |
Comprehensive modelling network for dc glow discharges in argon |
1999 |
Plasma sources science and technology |
8 |
27 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Jacques, P.; Verbist, K.; Lapin, J.; Ryelandt, L.; Van Tendeloo, G.; Delannay, F. |
Critical assessment of the process of growth of a YBa2Cu3O7-\delta layer on Y2BaCuO5 |
1996 |
Superconductor science and technology |
9 |
1 |
UA library record; WoS full record; WoS citing articles |
|
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Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
|
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E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; |
Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment |
2014 |
Thin solid films : an international journal on the science and technology of thin and thick films |
|
7 |
UA library record; WoS full record; WoS citing articles |
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Yan, M.; Bogaerts, A.; Goedheer, W.J.; Gijbels, R. |
Electron energy distribution function in capacitively coupled RF discharges: differences between electropositive Ar and electronegative SiH4 discharges |
2000 |
Plasma sources science and technology |
9 |
21 |
UA library record; WoS full record; WoS citing articles |
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Sankaran, K.; Clima, S.; Mees, M.; Adelmann, C.; Tokei, Z.; Pourtois, G. |
Exploring alternative metals to Cu and W for interconnects : an ab initio Insight |
2014 |
2014 Ieee International Interconnect Technology Conference / Advanced Metallization Conference (iitc/amc) |
|
|
UA library record; WoS full record; |
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Nistor, L.C.; van Landuyt, J.; Ralchenko, V.G.; Kononenko, T.V.; Obraztsova, E.D.; Strelnitsky, V.E. |
Formation of diamond nanocrystals in laser-irradiated amorphous carbon films |
1994 |
International Conference on the New Diamond Science and Technology |
4 |
|
UA library record |
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Laffez, P.; Chen, X.Y.; Banerjee, G.; Pezeril, T.; Rossell, M.D.; Van Tendeloo, G.; Lacorre, P.; Liu, J.M.; Liu, Z.-G. |
Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering |
2006 |
Thin solid films : an international journal on the science and technology of thin and thick films |
500 |
15 |
UA library record; WoS full record; WoS citing articles |
|
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Bogaerts, A.; Okhrimovskyy, A.; Baguer, N.; Gijbels, R. |
Hollow cathode discharges with gas flow: numerical modelling for the effect on the sputtered atoms and the deposition flux |
2005 |
Plasma sources science and technology |
14 |
9 |
UA library record; WoS full record; WoS citing articles |
|
|
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Peeters, F.M.; Devreese, J.T. |
Hot magneto-phonon and electro-phonon resonances in heterostructures |
1992 |
Semiconductor science and technology: B |
7 |
12 |
UA library record; WoS full record; WoS citing articles |
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Mahieu, S.; Ghekiere, P.; de Winter, G.; Depla, D.; de Gryse, R.; Lebedev, O.I.; Van Tendeloo, G. |
Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering |
2005 |
Thin solid films : an international journal on the science and technology of thin and thick films |
484 |
23 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Bollen, D.; de Keyzer, R.; van Roost, C. |
Influence of twinning on the morphology of AgBr and AgCl microcrystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
The ion- and atom-induced secondary electron emission yield: numerical study for the effect of clean and dirty cathode surfaces |
2002 |
Plasma sources science and technology |
11 |
51 |
UA library record; WoS full record; WoS citing articles |
|
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Verbist, K.; Lebedev, O.I.; Van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A. |
Low- or high-angle Ar ion-beam etching to create ramp-type Josephson junctions |
1996 |
Superconductor science and technology |
9 |
10 |
UA library record; WoS full record; WoS citing articles |
|
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Verbist, K.; Lebedev, O.I.; Verhoeven, M.A.J.; Winchern, R.; Rijnders, A.J.H.M.; Blank, D.H.A.; Tafuri, F.; Bender, H.; Van Tendeloo, G. |
Microstructure of YBa2Cu3O7-\delta Josephson junctions in relation to their properties |
1998 |
Superconductor science and technology |
11 |
|
UA library record; WoS full record; WoS citing articles |
|
|
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Vasiliev, A.L.; Van Tendeloo, G.; Boikov, Y.; Olsson, E.; Ivanov, S. |
Microstructure of YBa2Cu3O7-x films on buffered Si for microelectronic applications |
1997 |
Superconductor science and technology |
10 |
2 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; de Bleecker, K.; Kolev, I.; Madani, M. |
Modeling of gas discharge plasmas: What can we learn from it? |
2005 |
Surface and coatings technology |
200 |
11 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R. |
New method to determine the parity of the number of twin planes in tabular silver halide microcrystals from top views |
1997 |
The journal of imaging science and technology |
41 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
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Kastalsky, A.; Peeters, F.M.; Chan, W.K.; Florez, L.T.; Harbison, J.P. |
Novel nonlinear transport phenomena in a triangular quantum well |
1992 |
Semiconductor science and technology: B |
7 |
4 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of gas discharge plasmas for various applications |
2003 |
Vacuum: surface engineering, surface instrumentation & vacuum technology |
69 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Huq, M.Z.; Celis, J.P.; Meneve, J.; Stals, L.; Schryvers, D. |
Oscillating sliding wear of mono- and multilayer ceramic coatings in air |
1999 |
Surface and coatings technology |
113 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Georgieva, V.; Bogaerts, A. |
Plasma characteristics of an Ar/CF4/N2 discharge in an asymmetric dual frequency reactor: numerical investigation by a PIC/MC model |
2006 |
Plasma sources science and technology |
15 |
35 |
UA library record; WoS full record; WoS citing articles |
|
|
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Vanhellemont, J.; Romano-Rodriguez, A.; Fedina, L.; van Landuyt, J.; Aseev, A. |
Point defect reactions in silicon studies in situ by high flux electron irradiation in high voltage transmission electron microscope |
1995 |
Materials science and technology |
11 |
7 |
UA library record; WoS full record; WoS citing articles |
|
|
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van Cleempoel, A.; Gijbels, R.; Zhu, D.; Claeys, M.; Richter, H.; Fonseca, A. |
Quantitative determination of C60 and C70 in soot extracts by high performance liquid chromatography and mass spectrometric characterization |
1996 |
Fullerene science and technology |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Mordvinova, N.; Emelin, P.; Vinokurov, A.; Dorofeev, S.; Abakumov, A.; Kuznetsova, T. |
Surface processes during purification of InP quantum dots |
2014 |
Beilstein journal of nanotechnology |
5 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Schryvers, D.; Yandouzi, M.; Toth, L. |
TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film |
1998 |
Thin solid films : an international journal on the science and technology of thin and thick films |
326 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
|
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; van Roost, C.; de Keyzer, R. |
A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals |
2001 |
The journal of imaging science and technology |
45 |
|
UA library record; WoS full record; WoS citing articles |
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