Number of records found: 167
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Comparative study of structural properties and photoluminescence in InGaN layers with a high In content”. Vantomme A, Wu MF, Hogg S, van Landuyt J, et al, Internet journal of nitride semiconductor research T2 –, Symposium on GaN and Related Alloys Held at the MRS Fall Meeting, NOV 29-DEC 03, 1999, BOSTON, MASSACHUSETTS 5, art. no.-W11.38 (2000)
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TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
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The elemental composition and microstructure of soot emitted by different sources”. Smekens A, Knupfer M, Berghmans P, Van Grieken R, Journal of aerosol science 31, 917 (2000)
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The influence of black carbon on the crystallization point of salt aerosol”. Even A, ten Brink HM, Khlystov A, Smekens A, Berghmans P, Van Grieken R, Journal of aerosol science 31, 336 (2000)
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Methodology for light element analysis of individual aerosol particles using thin-window EPMA”. Osán J, Ro C-U, Szalóki I, Worobiec A, de Hoog J, Joos P, Van Grieken R, Journal of aerosol science 31, 765 (2000)
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Optimisation of light element analysis of individual particles using UTW-EPMA”. de Hoog J, Osán J, Worobiec A, Ro C-U, Szalóki I, Joos P, Van Grieken R, Journal of aerosol science 31, 388 (2000)
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The size distribution and surface area of soot emitted by different sources”. Smekens A, Berghmans P, Van Grieken R, Journal of aerosol science 31, 706 (2000)
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Unconventional microanalysis for low-Z, volatile and organic aerosol compounds”. Worobiec A, de Hoog J, Osán J, Szalóki I, Joos P, Van Grieken R, Journal of aerosol science 31, 384 (2000)
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Influence of the lattice symmetry on melting of the bilayer Wigner crystal”. Schweigert IV, Schweigert VA, Peeters FM, Journal de physique: 4 T2 –, International Conference on Strongly Coupled Coulomb Systems, SEP 04-10, 1999, ST MALO, FRANCE 10, 117 (2000). http://doi.org/10.1051/jp4:2000515
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Spatial behavior of energy relaxation of electrons in capacitively coupled discharges: comparison between Ar and SiH4”. Yan M, Bogaerts A, Gijbels R, Goedheer WJ, Journal of applied physics 87, 3628 (2000). http://doi.org/10.1063/1.372392
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Defect structure of the low temperature α-cristobalite phase and the cristobalite <->, tridymite transformation in (Si-Ge)O2”. Lemmens H, Czank M, Van Tendeloo G, Amelinckx S, Physics and chemistry of minerals 27, 386 (2000). http://doi.org/10.1007/s002699900082
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Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals”. Dluzewski P, Pietraszko A, Kozlowski M, Szczepanska A, Gorecka J, Baran M, Leonyuk L, Babonas GJ, Lebedev OI, Szymczak R, Acta physica Polonica: A: general physics, solid state physics, applied physics 98, 729 (2000)
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Structural transformation in fluorinated LaACuGaO5 (A=Ca, Sr) brownmillerites”. Hadermann J, Van Tendeloo G, Abakumov AM, Pavlyuk BP, Rozova MG, Antipov EV, International journal of inorganic materials 2, 493 (2000). http://doi.org/10.1016/S1466-6049(00)00072-6
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High-resolution X-ray fluorescence microtomography of homogeneous samples”. Simionovici AS, Chukalina M, Schroer C, Drakopoulos M, Snigirev A, Snigireva I, Lengeler B, Janssens K, Adams F, IEEE transactions on nuclear science 47, 2736 (2000). http://doi.org/10.1109/23.901180
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Synchrotron light through ancient glass”. de Raedt I, Vekemans B, Janssens K, Adams F, Europhysics news 31, 15 (2000)
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Spectrometric determination of silicon in food and biological samples: an interlaboratory trial”. van Dyck K, Robberecht H, van Cauwenbergh R, Deelstra H, Arnaud J, Willemyns L, Benijts F, Centeno JA, Taylor H, Soares ME, Bastos ML, Ferreira MA, d'Haese PC, Lamberts LV, Hoenig M, Knapp G, Lugowski SJ, Moens L, Riondato J, Van Grieken R, Claes M, Verheyen R, Clement L, Uytterhoeven M, Journal of analytical atomic spectrometry 15, 735 (2000). http://doi.org/10.1039/B000572J
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Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces”. de Witte H, de Gendt S, Douglas M, Conard T, Kenis K, Mertens PW, Vandervorst W, Gijbels R, Journal of the electrochemical society 147, 13 (2000). http://doi.org/10.1149/1.1393457
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Structural and magnetotransport transitions in the electron-doped Pr1-xSrxMnO3(0.85\leq x\leq1) manganites”. Hervieu M, Martin C, Maignan A, Van Tendeloo G, Jirak Z, Hejtmanek J, Barnabe A, Thopart D, Raveau B, Chemistry and materials 12, 1456 (2000). http://doi.org/10.1021/cm000016o
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TEM and laser-polarized 129Xe NMR characterization of oxidatively purified carbon nanotubes”. Kneller JM, Soto RJ, Surber SE, Colomer JF, Fonseca A, Nagy JB, Van Tendeloo G, Pietrass T, Journal of the American Chemical Society 122, 10591 (2000). http://doi.org/10.1021/ja994441y
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Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer”. Nistor L, Bender H, Vantomme A, Wu MF, van Landuyt J, O'Donnell KP, Martin R, Jacobs K, Moerman I, Applied physics letters 77, 507 (2000). http://doi.org/10.1063/1.127026
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Atmospheric particulate element concentrations and deposition rates in French Polynesia”. Rojas CM, Injuk J, Van Grieken RE, Maenhaut W, Journal de recherche océanographique 25, 74 (2000)
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Microstructural characterization of diamond films deposited on c-BN crystals”. Nistor L, Buschmann V, Ralchenko V, Dinca G, Vlasov I, van Landuyt J, Fuess H, Diamond and related materials T2 –, 10th European Conference on Diamond, Diamond-Like Materials, Nitrides, and Silicon Carbide (Diamond 1999), SEP 12-17, 1999, PRAGUE, CZECH REPUBLIC 9, 269 (2000). http://doi.org/10.1016/S0925-9635(99)00246-0
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High-resolution electron microscopy study of strained epitaxial La0.7Sr0.3MnO3 thin films”. Lebedev OI, Van Tendeloo G, Amelinckx S, Ju HL, Krishnan KM, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 80, 673 (2000). http://doi.org/10.1080/01418610008212075
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Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire”. Richard O, Van Tendeloo G, Lemée N, le Lannic J, Guilloux-Viry M, Perrin A, Journal of electron microscopy 49, 493 (2000). http://doi.org/10.1093/oxfordjournals.jmicro.a023834
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Unveiling the composition of sulphur sensitization specks by their interactions with TAI”. Charlier E, van Doorselaer M, Gijbels R, de Keyzer R, Geuens I, Journal Of Imaging Science And Technology 44, 235 (2000)
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Interaction of a Ti-capped Co thin film with Si3N4”. Li H, Bender H, Conard T, Maex K, Gutakovskii A, van Landuyt J, Froyen L, Applied physics letters 77, 4307 (2000). http://doi.org/10.1063/1.1329329
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Atmospheric deposition and its impact on ecosystems, with reference to the Mid-East region”. Van Grieken R, Shevach Y, Eurotrac newsletter , 39 (2000)
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Electron Boltzmann kinetic equation averaged over fast electron bouncing and pitch-angle scattering for fast modeling of electron cyclotron resonance discharge”. Kaganovich I, Misina M, Berezhnoi S, Gijbels R, Physical review : E : statistical, nonlinear, and soft matter physics 61, 1875 (2000). http://doi.org/10.1103/PhysRevE.61.1875
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Epitaxial strain induced metal insulator transition in La0.9Sr0.1MnO3 and La0.88Sr0.1MnO3 thin films”. Razavi FS, Gross G, Habermeier H-U, Lebedev O, Amelinckx S, Van Tendeloo G, Vigliante A, Applied physics letters 76, 155 (2000). http://doi.org/10.1063/1.125687
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Evolution of impurity clusters and photographic sensitivity”. Oleshko VP, Gijbels RH, Bilous VM, Jacob WA, Alfimov MV, Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45, 1 (2000)
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