Number of records found: 157
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Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon”. de Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, The review of scientific instruments 70, 3661 (1999). http://doi.org/10.1063/1.1149974
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Comparison between a radio-frequency and direct current glow discharge in argon by a hybrid Monte Carlo-fluid model for electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer W, Spectrochimica acta: part B : atomic spectroscopy 54, 1335 (1999). http://doi.org/10.1016/S0584-8547(99)00080-4
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Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description”. Bogaerts A, Gijbels R, Journal of applied physics 86, 4124 (1999). http://doi.org/10.1063/1.371337
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Determination of low-Z elements in individual environmental particles using windowless EPMA”. Ro C-U, Osán J, Van Grieken R, Analytical chemistry 71, 1521 (1999). http://doi.org/10.1021/AC981070F
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A potential method to correlate electrical properties and microstructure of a unique high-Tc superconducting Josephson junction”. Verbist K, Lebedev OI, Van Tendeloo G, Tafuri F, Granozio FM, Di Chiara A, Bender H, Applied physics letters 74, 1024 (1999). http://doi.org/10.1063/1.123443
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Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy”. Seo JW, Schryvers D, Vermeulen W, Richard O, Potapov P, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 79, 1279 (1999). http://doi.org/10.1080/01418619908210361
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Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3”. Lemmens H, Richard O, Van Tendeloo G, Bismayer U, Journal of electron microscopy 48, 843 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023756
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Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge”. Bogaerts A, Yan M, Gijbels R, Goedheer W, Journal of applied physics 86, 2990 (1999). http://doi.org/10.1063/1.371159
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Monte Carlo model for the argon ions and fast argon atoms in a radio-frequency discharge”. Bogaerts A, Gijbels R, IEEE transactions on plasma science 27, 1406 (1999). http://doi.org/10.1109/27.799819
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Field evaluation of a wind tunnel-impactor system for sampling ambient aerosols”. Gysels K, Van Grieken R, Journal of aerosol science 30, 639 (1999). http://doi.org/10.1016/S0021-8502(98)00747-2
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High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructurs”. Buschmann V, Rodewald M, Fuess H, Van Tendeloo G, Schäffer C, Journal of applied physics 85, 2119 (1999). http://doi.org/10.1063/1.369512
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The non-destructive determination of REE in fossilized bone using synchrotron radiation induced K-line X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Williams CT, Radtke M, Haller M, Knöchel A, Fresenius' journal of analytical chemistry 363, 413 (1999). http://doi.org/10.1007/S002160051212
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Composition of individual aerosol particles in the marine boundary layer over seas of the Western Russian Arctic”. Shevchenko VP, Van Grieken RE, van Malderen H, Lisitzin AP, Kuptsov VM, Serova VV, Doklady earth sciences 366, 546 (1999)
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Modeling of photon scattering at high X-ray energies : experiment versus simulation”. Vincze L, Vekemans B, Janssens K, Adams F, Journal of analytical atomic spectrometry T2 –, 15th International Congress on X-Ray Optics and Microanalysis (ICXOM), AUG 24-27, 1998, ANTWERP, BELGIUM 14, 529 (1999). http://doi.org/10.1039/A808040B
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Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation”. Tsuji K, Sato T, Wagatsuma K, Claes M, Van Grieken R, The review of scientific instruments 70, 1621 (1999). http://doi.org/10.1063/1.1149687
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Size mismatch : a crucial factor for generating a spin-glass insulator in manganites”. Maignan A, Martin C, Van Tendeloo G, Hervieu M, Raveau B, Physical review : B : condensed matter and materials physics 60, 15214 (1999). http://doi.org/10.1103/PhysRevB.60.15214
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Grazing-exit particle-induced X-ray emission analysis with extremely low background”. Tsuji K, Spolnik Z, Wagatsuma K, Van Grieken RE, Vis RD, Analytical chemistry 71, 5033 (1999). http://doi.org/10.1021/AC990568U
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Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers”. De Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, Microelectronic engineering 45, 277 (1999). http://doi.org/10.1016/S0167-9317(99)00180-X
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Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays”. Cloetens P, Ludwig W, Baruchel J, van Dyck D, van Landuyt J, Guigay JP, Schlenker M, Applied physics letters 75, 2912 (1999). http://doi.org/10.1063/1.125225
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Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Institute of physics conference series T2 –, Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND , 495 (1999)
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Grazing exit electron probe microanalysis for surface and particle analysis”. Tsuji K, Wagatsuma K, Nullens R, Van Grieken RE, Analytical chemistry 71, 2497 (1999). http://doi.org/10.1021/AC990075P
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YBa2Cu3O7-x Josephson junctions and dc SQUIDs based on 45\text{\textdegree} a-axis tilt and twist grain boundaries : atomically clean interfaces for applications”. Tafuri F, Carillo F, Lombardi F, Granozio FM, dii Uccio US, Testa G, Sarnelli E, Verbist K, Van Tendeloo G, Superconductor science and technology T2 –, International Superconductive Electronics Conference, JUN 21-25, 1999, BERKELEY, CALIFORNIA 12, 1007 (1999). http://doi.org/10.1088/0953-2048/12/11/393
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Influence of laser and isothermal treatments on microstructural properties of SnO2 films”. Rembeza ES, Richard O, van Landuyt J, Materials research bulletin 34, 1527 (1999). http://doi.org/10.1016/S0025-5408(99)00188-9
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Preparation of nanocrystalline titania powder via aerosol pyrolysis of titanium tetrabutoxide”. Ahonen PP, Kauppinen EI, Joubert JC, Deschanvres JL, Van Tendeloo G, Journal of materials research 14, 3938 (1999). http://doi.org/10.1557/JMR.1999.0533
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Determination of silicon in organic matrices with grazing-emission X-ray fluorescence spectrometry”. Claes M, van Dyck K, Deelstra H, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 54, 1517 (1999). http://doi.org/10.1016/S0584-8547(99)00098-1
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Growth of pure and doped Rb2ZnCl4and K2ZnCl4 single crystals by Czochralski technique”. Stefan M, Nistor SV, Mateescu DC, Abakumov AM, Journal of crystal growth 200, 148 (1999). http://doi.org/10.1016/S0022-0248(98)01247-0
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Correlation of microstructure and magnetotransport properties of epitaxially grown La-Ca-Mn-O3 thin films”. Habermeier HU, Razavi F, Lebedev O, Gross GM, Praus R, Zhang PX, Physica status solidi: B: basic research T2 –, International Conference on Solid State Spectroscopy –, (ICSSS), SEP 05-07, 1999, SCHWABISCH-GMUND, GERMANY 215, 679 (1999). http://doi.org/10.1002/(SICI)1521-3951(199909)215:1<679::AID-PSSB679>3.0.CO;2-H
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Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition”. Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, van Landuyt J, Grivas C, Hatziapostolou A, Journal of vacuum science and technology: A: vacuum surfaces and films 17, 249 (1999). http://doi.org/10.1116/1.581579
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Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Physica status solidi: A: applied research T2 –, International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland 171, 147 (1999). http://doi.org/10.1002/(SICI)1521-396X(199901)171:1<147::AID-PSSA147>3.0.CO;2-U
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Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ irradiation in an HREM”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Physica status solidi: A: applied research 171, 147 (1999)
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