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Mesoscopic superconducting disks”. Deo PS, Peeters FM, Schweigert VA, Superlattices and microstructures 25, 1195 (1999). http://doi.org/10.1006/spmi.1999.0734
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Monte-Carlo simulation of the coherent backscattering of electrons in a ballistic system”. Janssens KL, Peeters FM, Superlattices and microstructures 25, 615 (1999). http://doi.org/10.1006/spmi.1999.0697
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Precision magnetometry on a submicron scale: magnetisation of superconducting quantum dots”. Geim AK, Grigorieva IV, Lok JGS, Maan JC, Dubonos SV, Li XQ, Peeters FM, Nazarov YV, Superlattices and microstructures 23, 151 (1998). http://doi.org/10.1006/spmi.1996.0199
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Magneto-transport of electrons in a nonhomogeneous magnetic field”. Ibrahim IS, Schweigert VA, Badalian SM, Peeters FM, Superlattices and microstructures 22, 203 (1997)
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Scattering on circular inhomogeneous magnetic field profiles in an electron waveguide junction”. Li XQ, Peeters FM, Superlattices and microstructures 22, 243 (1997)
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Structural properties of c-axis oriented epitaxial YBa2Cu3O7-\delta thin films”. Ye M, Schroeder J, Deltour R, Delplancke MP, Winand R, Verbist K, Van Tendeloo G, Superlattices and microstructures 21, 287 (1997)
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Highly Efficient Hyperbranched CNT Surfactants: Influence of Molar Mass and Functionalization”. Bertels E, Bruyninckx K, Kurttepeli, Smet M, Bals S, Goderis B, Langmuir: the ACS journal of surfaces and colloids 30, 12200 (2014). http://doi.org/10.1021/la503032g
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Immersion calorimetry as a tool to evaluate the catalytic performance of titanosilicate materials in the epoxidation of cyclohexene”. Vernimmen J, Guidotti M, Silvestre-Albero J, Jardim EO, Mertens M, Lebedev OI, Van Tendeloo G, Psaro R, Rodríguez-Reinoso F, Meynen V, Cool P, Langmuir: the ACS journal of surfaces and colloids 27, 3618 (2011). http://doi.org/10.1021/la104808v
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Structural ordering of self-assembled clusters with competing interactions : transition from faceted to spherical clusters”. Galvan Moya JE, Nelissen K, Peeters FM, Langmuir: the ACS journal of surfaces and colloids 31, 917 (2015). http://doi.org/10.1021/la504249e
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A framework to account for sedimentation and diffusion in particle-cell interactions”. Cui J, Faria M, Bjornmalm M, Ju Y, Suma T, Gunawan ST, Richardson JJ, Heidar H, Bals S, Crampin EJ, Caruso F, Langmuir: the ACS journal of surfaces and colloids 32, 12394 (2016). http://doi.org/10.1021/ACS.LANGMUIR.6B01634
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Numerical simulation of hydrocarbon plasmas for nanoparticle formation and the growth of nanostructured thin films”. Neyts E, Eckert M, Mao M, Bogaerts A, Plasma physics and controlled fusion 51, 124034 (2009). http://doi.org/10.1088/0741-3335/51/12/124034
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Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations”. Clima S, Kaczer B, Govoreanu B, Popovici M, Swerts J, Verhulst AS, Jurczak M, De Gendt S, Pourtois G, IEEE electron device letters 34, 402 (2013). http://doi.org/10.1109/LED.2013.2238885
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Superior reliability of junctionless pFinFETs by reduced oxide electric field”. Toledano-Luque M, Matagne P, Sibaja-Hernandez A, Chiarella T, Ragnarsson L-A, Sorée B, Cho M, Mocuta A, Thean A, IEEE electron device letters 35, 1179 (2014). http://doi.org/10.1109/LED.2014.2361769
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Temperature-dependent modeling and characterization of through-silicon via capacitance”. Katti G, Stucchi M, Velenis D, Sorée B, de Meyer K, Dehaene W, IEEE electron device letters 32, 563 (2011). http://doi.org/10.1109/LED.2011.2109052
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Intrinsic tailing of resistive states distributions in amorphous <tex>HfOx </tex>, and TaOx based resistive random access memories”. Clima S, Chen YY, Fantini A, Goux L, Degraeve R, Govoreanu B, Pourtois G, Jurczak M, IEEE electron device letters 36, 769 (2015). http://doi.org/10.1109/LED.2015.2448731
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Uniform strain in heterostructure tunnel field-effect transistors”. Verreck D, Verhulst AS, Van de Put ML, Sorée B, Collaert N, Mocuta A, Thean A, Groeseneken G, IEEE electron device letters 37, 337 (2016). http://doi.org/10.1109/LED.2016.2519681
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Purple phototrophic bacteria for resource recovery : challenges and opportunities”. Capson-Tojo G, Batstone DJ, Grassino M, Vlaeminck SE, Puyol D, Verstraete W, Kleerebezem R, Oehmen A, Ghimire A, Pikaar I, Lema JM, Hülsen T, Grassino M, Hulsen T, Biotechnology Advances 43, 107567 (2020). http://doi.org/10.1016/J.BIOTECHADV.2020.107567
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Innovative market-based policy instruments for waste management : a case study on shredder residues in Belgium”. Dubois M, Hoogmartens R, Van Passel S, Van Acker K, Vanderreydt I, Waste Management &, Research 33, 886 (2015). http://doi.org/10.1177/0734242X15600053
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Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications”. Lubyshev D, Fastenau JM, Fang X-M, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C, Journal of vacuum science &, technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena 22, 1565 (2004). http://doi.org/10.1116/1.1691412
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High precision determination of the elastic strain of InGaN/GaN multiple quantum wells”. Wu MF, Zhou S, Yao S, Zhao Q, Vantomme A, van Daele B, Piscopiello E, Van Tendeloo G, Tong YZ, Yang ZJ, Yu TJ, Zhang GY, Journal of vacuum science and technology: B: microelectronics and nanometer structures 22, 920 (2004). http://doi.org/10.1116/1.1715085
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Addition of yttrium into HfO2 films: microstructure and electrical properties”. Dubourdieu C, Rauwel E, Roussel H, Ducroquet F, Hollaender B, Rossell M, Van Tendeloo G, Lhostis S, Rushworth S, Journal of vacuum science and technology: A: vacuum surfaces and films 27, 503 (2009). http://doi.org/10.1116/1.3106627
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Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition”. Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, van Landuyt J, Grivas C, Hatziapostolou A, Journal of vacuum science and technology: A: vacuum surfaces and films 17, 249 (1999). http://doi.org/10.1116/1.581579
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Influence of sticking coefficients on the behavior of sputtered atoms in an argon glow discharge: modeling and comparison with experiment”. Bogaerts A, Naylor J, Hatcher M, Jones WJ, Mason R, Journal of vacuum science and technology: A: vacuum surfaces and films 16, 2400 (1998). http://doi.org/10.1116/1.581359
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Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates”. Delabie A, Sioncke S, Rip J, Van Elshocht S, Pourtois G, Mueller M, Beckhoff B, Pierloot K, Journal of vacuum science and technology: A: vacuum surfaces and films 30, 01a127 (2012). http://doi.org/10.1116/1.3664090
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Thermal recrystallization of short-range ordered WS2 films”. Heyne MH, de Marneffe J-F, Radu I, Neyts EC, De Gendt S, Journal of vacuum science and technology: A: vacuum surfaces and films 36, 05g501 (2018). http://doi.org/10.1116/1.5036654
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Corrosion protection of Cu by atomic layer deposition”. Cremers V, Rampelberg G, Baert K, Abrahami S, Claes N, de Oliveira TM, Terryn H, Bals S, Dendooven J, Detavernier C, Journal of vacuum science and technology: A: vacuum surfaces and films 37, 060902 (2019). http://doi.org/10.1116/1.5116136
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FLCS-PON : a 100 Gbit/s flexible passive optical network: concepts and field trial”. Borkowski R, Straub M, Ou Y, Lefevre Y, Jelić, ŽL, Lanneer W, Kaneda N, Mahadevan A, Hueckstaedt V, van Veen D, Houtsma V, Coomans W, Bonk R, Maes J, Journal Of Lightwave Technology 39, 5314 (2021). http://doi.org/10.1109/JLT.2021.3102383
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Multidisciplinary environmental monitoring at the Kunsthistorisches Museum, Vienna”. Sturaro G, Camuffo D, Brimblecombe P, Van Grieken R, Busse H-J, Bernardi A, Valentino A, Blades N, Gysels K, Deutsch F, Wieser M, Buczolits S, Journal of trace and microprobe techniques 21, 273 (2003). http://doi.org/10.1081/TMA-120020262
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Urine nitrification with a synthetic microbial community”. Christiaens MER, De Paepe J, Ilgrande C, De Vrieze J, Barys J, Teirlinck P, Meerbergen K, Lievens B, Boon N, Clauwaert P, Vlaeminck SE, Systematic and applied microbiology 42, Unsp 126021 (2019). http://doi.org/10.1016/J.SYAPM.2019.126021
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Strong-coupling limit for one-dimensional polarons in a finite box”. Vansant P, Smondyrev MA, Peeters FM, Devreese JT, Zeitschrift für Physik: B: condensed matter and quanta 99, 345 (1996). http://doi.org/10.1007/s002570050047
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