NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Volume	Times cited	Additional Links
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Verbeeck, A.; de Keyzer, R.	Characterization of crystal defects in mixed tabular silver halide grains by conventional transmission electron microscopy and X-ray diffractometry	1991	Journal of crystal growth	110	40	UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A.	Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas	1997	Journal of crystal growth	173	4	UA library record; WoS full record; WoS citing articles
Goessens, C.; Schryvers, D.; van Landuyt, J.; de Keyzer, R.	Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals	1997	Journal of crystal growth	172	15	UA library record; WoS full record; WoS citing articles
Frangis, N.; Stoemenos, J.; van Landuyt, J.; Nejim, A.; Hemment, P.L.F.	The formation of 3C-SiC in crystalline Si by carbon implantation at 950⁰C and annealing: a structural study	1997	Journal of crystal growth	181	9	UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Kaltsas, G.; Travlos, A.; Nassiopoulos, A.G.	Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction	1997	Journal of crystal growth	172	29	UA library record; WoS full record; WoS citing articles
Bernaerts, D.; Amelinckx, S.; Van Tendeloo, G.; van Landuyt, J.	Microstructure and formation mechanisms of cylindrical and conical scrolls of the misfit layer compounds PbNb_nS_2n+1	1997	Journal of crystal growth	172	23	UA library record; WoS full record; WoS citing articles
Teodorescu, V.; Nistor, L.; Bender, H.; Steegen, A.; Lauwers, A.; Maex, K.; van Landuyt, J.	In situ transmission electron microscopy study of Ni silicide phases formed on (001) Si active lines	2001	Journal of applied physics	90	97	UA library record; WoS full record; WoS citing articles
Ignatova, V.A.; Lebedev, O.I.; Watjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F.	Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions	2002	Journal of applied physics	92	5	UA library record; WoS full record; WoS citing articles
Gryse, O.D.; Clauws, P.; van Landuyt, J.; Lebedev, O.; Claeys, C.; Simoen, E.; Vanhellemont, J.	Oxide phase determination in silicon using infrared spectroscopy and transmission electron microscopy techniques	2002	Journal of applied physics	91	27	UA library record; WoS full record; WoS citing articles
de Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.I.; van Landuyt, J.; Simoen, E.; Claeys, C.	Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy	2004	Journal of the electrochemical society	151	13	UA library record; WoS full record; WoS citing articles
Stuer, C.; van Landuyt, J.; Bender, H.; de Wolf, I.; Rooyackers, R.; Badenes, G.	Investigation by convergent beam electron diffraction of the stress around shallow trench isolation structures	2001	Journal of the electrochemical society	148	13	UA library record; WoS full record; WoS citing articles
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	The study of carbon nanotubules produced by catalytic method	1994	Chemical physics letters	223	405	UA library record; WoS full record; WoS citing articles
Ivanov, V.; Nagy, J.B.; Lambin, P.; Lucas, A.; Zhang, X.B.; Zhang, X.F.; Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; van Landuyt, J.	The study of carbon nanotubes produced by catalytic method	1994	Chemical physics letters	223	405	UA library record; WoS full record; WoS citing articles
Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I.	Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer	2000	Applied physics letters	77	44	UA library record; WoS full record; WoS citing articles
Frangis, N.; van Landuyt, J.; Lartiprete, R.; Martelli, S.; Borsella, E.; Chiussi, S.; Castro, J.; Leon, B.	High resolution electron microscopy and X-ray photoelectron spectroscopy studies of heteroepitaxial Si_xGe_1-x alloys produced through laser induced processing	1998	Applied physics letters	72	16	UA library record; WoS full record; WoS citing articles
Cloetens, P.; Ludwig, W.; Baruchel, J.; van Dyck, D.; van Landuyt, J.; Guigay, J.P.; Schlenker, M.	Holotomography: quantitative phase tomography with micrometer resolution using hard synchrotron radiation X-rays	1999	Applied physics letters	75	481	UA library record; WoS full record; WoS citing articles
Dobbelaere, W.; de Boeck, J.; Heremans, P.; Mertens, R.; Borghs, G.; Luyten, W.; van Landuyt, J.	InAs p-n diodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy	1992	Applied physics letters	60	20	UA library record; WoS full record; WoS citing articles
Dobbelaere, W.; de Boeck, J.; Heremans, P.; Mertens, R.; Borghs, G.; Luyten, W.; van Landuyt, J.	InAs0.85Sb0.15 infrared photodiodes grown on GaAs and GaAs-coated Si by molecular beam epitaxy	1992	Applied physics letters	600	32	UA library record; WoS full record; WoS citing articles
Li, H.; Bender, H.; Conard, T.; Maex, K.; Gutakovskii, A.; van Landuyt, J.; Froyen, L.	Interaction of a Ti-capped Co thin film with Si₃N₄	2000	Applied physics letters	77	3	UA library record; WoS full record; WoS citing articles
Fang, P.a.; Gu, H.; Wang, P.l.; Van Landuyt, J.; Vleugels, J.; Van der Biest, O.;	Effect of powder coating on stabilizer distribution in CeO₂-stabilized ZrO₂ ceramics	2005	Journal of the American Ceramic Society	88	11	UA library record; WoS full record; WoS citing articles
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B.	Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study	2000				UA library record; WoS full record;
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C.	The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals	2000				UA library record; WoS full record;
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J.	EFTEM study of plasma etched low-k Si-O-C dielectrics	2001	Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Stuer, C.; Steegen, A.; van Landuyt, J.; Bender, H.; Maex, K.	Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation	2001	Institute of physics conference series			UA library record; WoS full record;
Nistor, L.; Bender, H.; van Landuyt, J.; Nemeth, S.; Boeve, H.; De Boeck, J.; Borghs, G.	HREM investigation of a Fe/GaN/Fe tunnel junction	2001	Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, Univ of Oxford, Oxford, England			UA library record; WoS full record;
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J.	Clustering of vacancies on {113} planes in Si layers close to Si-Si₃N₄ interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation	1999	Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND			UA library record; WoS full record;
Rembeza, S.I.; Loginov, V.A.; Svistova, T.V.; Podkopaeva, O.I.; Rembeza, E.S.; van Landuyt, J.	Laser thermotreatment of the SnO₂layers	1998	Eurosensors XII, vols 1 and 2			UA library record; WoS full record;
Tokei, Z.; Lanckmans, F.; van den Bosch, G.; Van Hove, M.; Maex, K.; Bender, H.; Hens, S.; van Landuyt, J.	Reliability of copper dual damascene influenced by pre-clean	2002	Analysis Of Integrated Circuits		5	UA library record; WoS full record; WoS citing articles
Schryvers, D.; Van Landuyt, J.	Electron microscopy study of twin sequences and branching in NissAl34 3R martensite	1992	ICOMAT
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R.	Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging	1991				UA library record