Number of records found: 8874
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Citations
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Phase object reconstruction for 4D-STEM using deep learning”. Friedrich T, Yu C-P, Verbeeck J, Van Aert S, Microscopy and microanalysis 29, 395 (2023). http://doi.org/10.1093/MICMIC/OZAC002
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Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS”. Verlinden G, Gijbels R, Geuens I, Microscopy and microanalysis 8, 216 (2002). http://doi.org/10.1017/S1431927602020159
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Annular dark-field transmission electron microscopy for low contrast materials”. Leroux F, Bladt E, Timmermans J-P, Van Tendeloo G, Bals S, Microscopy and microanalysis 19, 629 (2013). http://doi.org/10.1017/S1431927613000020
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Computational aspects in quantitative EELS”. Verbeeck J, Van Aert S, Zhang L, Haiyan T, Schattschneider P, Rosenauer A, Microscopy and microanalysis 16, 240 (2010). http://doi.org/10.1017/S143192761005511X
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EELS investigations of different niobium oxide phases”. Bach D, Störmer H, Schneider R, Gerthsen D, Verbeeck J, Microscopy and microanalysis 12, 416 (2006). http://doi.org/10.1017/S1431927606060521
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EELS of niobium and stoichiometric niobium-oxide phases: part 1: plasmon and Near-edges fine structure”. Bach D, Schneider R, Gerthsen D, Verbeeck J, Sigle W, Microscopy and microanalysis 15, 505 (2009). http://doi.org/10.1017/S143192760999105X
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Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency”. van den Broek W, Van Aert S, van Dyck D, Microscopy and microanalysis 18, 336 (2012). http://doi.org/10.1017/S1431927611012633
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements”. Bals S, Tirry W, Geurts R, Yang Z, Schryvers D, Microscopy and microanalysis 13, 80 (2007). http://doi.org/10.1017/S1431927607070018
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, Microscopy and microanalysis 15, 62 (2009). http://doi.org/10.1017/S1431927609090059
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Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM”. Grieten E, Caen J, Schryvers D, Microscopy and microanalysis 20, 1585 (2014). http://doi.org/10.1017/S1431927614012860
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Physical limits on atomic resolution”. van Dyck D, Van Aert S, den Dekker AJ, Microscopy and microanalysis 10, 153 (2004). http://doi.org/10.1017/S143192760404036X
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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Probing local stoichiometry in InGaN based quantum wells of solid-state LEDs”. Jinschek JR, Bals S, Gopal V, Xus X, Kisielowski C, Microscopy and microanalysis 10, 294 (2004). http://doi.org/10.1017/S1431927604882813
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Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
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TEM annular objective apertures fabricated by FIB”. Bals S, Radmilovic V, Kisielowski C, Microscopy and microanalysis 10, 1148 (2004). http://doi.org/10.1017/S1431927604881765
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Three-dimensional analysis of carbon nanotube networks in interconnects by electron tomography without missing wedge artifacts”. Ke X, Bals S, Cott D, Hantschel T, Bender H, Van Tendeloo G, Microscopy and microanalysis 16, 210 (2010). http://doi.org/10.1017/S1431927609991371
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Towards quantitative EDX results in 3 dimensions”. Goris B, Freitag B, Zanaga D, Bladt E, Altantzis T, Ringnalda J, Bals S, Microscopy and microanalysis 20, 766 (2014). http://doi.org/10.1017/S1431927614005558
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Ultra-high resolution electron tomography for materials science : a roadmap”. Batenburg KJ, Bals S, Van Aert S, Roelandts T, Sijbers J, Microscopy and microanalysis 17, 934 (2011). http://doi.org/10.1017/S143192761100554X
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Wet-STEM tomography : principles, potentialities and limitations”. Masenelli-Varlot K, Malchere A, Ferreira J, Heidari Mezerji H, Bals S, Messaoudi C, Garrido SM, Microscopy and microanalysis 20, 366 (2014). http://doi.org/10.1017/S1431927614000105
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Electrochemical deposition of a copper carboxylate layer on copper as potential corrosion inhibitor”. Elia A, De Wael K, Dowsett M, Adriaens A, Journal of solid state electrochemistry 16, 143 (2011). http://doi.org/10.1007/S10008-010-1283-6
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Influence of the deposition method, temperature and deposition time on the corrosion inhibition of lead dodecanoate coatings deposited on lead surfaces”. De Keersmaecker M, De Wael K, Adriaens A, Journal of solid state electrochemistry 17, 1259 (2013). http://doi.org/10.1007/S10008-012-1964-4
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Combining molecular dynamics with Monte Carlo simulations : implementations and applications”. Neyts EC, Bogaerts A, Theoretical chemistry accounts : theory, computation, and modeling 132, 1320 (2013). http://doi.org/10.1007/s00214-012-1320-x
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Ruthenocene and cyclopentadienyl pyrrolyl ruthenium as precursors for ruthenium atomic layer deposition : a comparative study of dissociation enthalpies”. Phung QM, Vancoillie S, Delabie A, Pourtois G, Pierloot K, Theoretical chemistry accounts : theory, computation, and modeling 131, 1238 (2012). http://doi.org/10.1007/s00214-012-1238-3
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Trapping of Oxygen Vacancies at Crystallographic Shear Planes in Acceptor-Doped Pb-Based Ferroelectrics”. Batuk D, Batuk M, Tsirlin AA, Hadermann J, Abakumov AM, Angewandte Chemie: international edition in English 54, 14787 (2015). http://doi.org/10.1002/anie.201507729
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Highly Luminescent Cesium Lead Halide Perovskite Nanocrystals with Tunable Composition and Thickness by Ultrasonication”. Tong Y, Bladt E, Aygüler MF, Manzi A, Milowska KZ, Hintermayr VA, Docampo P, Bals S, Urban AS, Polavarapu L, Feldmann J, Angewandte Chemie: international edition in English 55, 13887 (2016). http://doi.org/10.1002/anie.201605909
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Reversible Clustering of Gold Nanoparticles under Confinement”. Sánchez-Iglesias A, Claes N, Solís DM, Taboada JM, Bals S, Liz-Marzán LM, Grzelczak M, Angewandte Chemie: international edition in English 57, 3183 (2018). http://doi.org/10.1002/anie.201800736
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Computationally Driven Discovery of a Family of Layered LiNiB Polymorphs”. Gvozdetskyi V, Bhaskar G, Batuk M, Zhao X, Wang R, Carnahan SL, Hanrahan MP, Ribeiro RA, Canfield PC, Rossini AJ, Wang C-Z, Ho K-M, Hadermann J, Zaikina JV, Angewandte Chemie: international edition in English 58, 15855 (2019). http://doi.org/10.1002/anie.201907499
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Manganese‐Doping‐Induced Quantum Confinement within Host Perovskite Nanocrystals through Ruddlesden–Popper Defects”. Paul S, Bladt E, Richter AF, Döblinger M, Tong Y, Huang H, Dey A, Bals S, Debnath T, Polavarapu L, Feldmann J, Angewandte Chemie-International Edition 59, 6794 (2020). http://doi.org/10.1002/anie.201914473
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