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HREM study of ion implantation in 6H-SiC at high temperatures”. Lebedev OI, Van Tendeloo G, Suvorova AA, Usov IO, Suvorov AV, Journal of electron microscopy 46, 271 (1997)
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Microstructure of Mn-doped, spin-cast FeSi2”. Morimura T, Frangis N, Van Tendeloo G, van Landuyt J, Hasaka M, Hisatsune K, Journal of electron microscopy 46, 221 (1997)
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Structural phase transition in the manganite Nd0.5Ca0.2Sr0.3MnO3-\delta”. Hervieu M, Van Tendeloo G, Schuddinck W, Richard O, Caignaert V, Millange F, Raveau B, Journal of electron microscopy 46, 263 (1997)
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Structure determination of YBCO fluorinated phases by HREM”. Van Tendeloo G, Lebedev OI, Shpanchenko RV, Antipov EV, Journal of electron microscopy 1, 23 (1997)
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Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3”. Lemmens H, Richard O, Van Tendeloo G, Bismayer U, Journal of electron microscopy 48, 843 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023756
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Microstructure of CuXMo6S8 Chevrel phase thin films on R-plane sapphire”. Richard O, Van Tendeloo G, Lemée N, le Lannic J, Guilloux-Viry M, Perrin A, Journal of electron microscopy 49, 493 (2000). http://doi.org/10.1093/oxfordjournals.jmicro.a023834
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Microstructure of tough polycrystalline natural diamond”. Chen JH, Van Tendeloo G, Journal of electron microscopy 48, 121 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023658
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Modulated structures in KAISi3O8: a study by high resolution electron microscopy and 29Si MAS-NMR spectroscopy”. Sanchez-Munoz L, Nistor L, Van Tendeloo G, Sanz J, Journal of electron microscopy 47, 17 (1998). http://doi.org/10.1093/oxfordjournals.jmicro.a023555
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New anion-conducting solid solutions Bi1-xTex(O,F)2+\delta (x >, 0.5) and glassceramic material on their base”. Prituzhalov VA, Ardashnikova EI, Vinogradov AA, Dolgikh VA, Videau J-J, Fargin E, Abakumov AM, Tarakina NV, Van Tendeloo G, Journal of fluorine chemistry 132, 1110 (2011). http://doi.org/10.1016/j.jfluchem.2011.06.042
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The superconducting bismuth-based mixed oxides”. Antipov EV, Khasanova NR, Pshirkov JS, Putilin SN, Bougerof C, Lebedev OI, Van Tendeloo G, Baranov A, Park YW, Journal of low temperature physics T2 –, International Conference on Physics and Chemistry of Molecular and Oxide, Superconductors (MOS2002), AUG 13-18, 2002, HSINCHU, TAIWAN 131, 575 (2003). http://doi.org/10.1023/A:1022923924607
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Study of the Q&prime, (Q)-phase precipitation in Al–Mg–Si–Cu alloys by quantification of atomic-resolution transmission electron microscopy images and atom probe tomography”. Ding L, Orekhov A, Weng Y, Jia Z, Idrissi H, Schryvers D, Muraishi S, Hao L, Liu Q, Journal of materials science 54, 7943 (2019). http://doi.org/10.1007/s10853-019-03427-6
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Composition and crystal structure of resorbable calcium phosphate thin films”. Tuck L, Sayer M, Mackenzie M, Hadermann J, Dunfield D, Pietak A, Reid JW, Stratilatov AD, Journal of materials science 41, 4273 (2006). http://doi.org/10.1007/s10853-005-5532-5
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Compositional characterization of nickel silicides by HAADF-STEM imaging”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of materials science 46, 2001 (2011). http://doi.org/10.1007/s10853-010-5191-z
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Hydrothermal processing of barium strontium titanate sol-gel composite thin films”. Zelonka K, Sayer M, Freundorfer AP, Hadermann J, Journal of materials science 41, 3885 (2006). http://doi.org/10.1007/s10853-005-5525-4
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Multiple-step martensitic transformations in the Ni51Ti49 single crystal”. Khalil-Allafi J, Amin-Ahmadi B, Journal of materials science 45, 6440 (2010). http://doi.org/10.1007/s10853-010-4729-4
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Multiwalled carbon nanotubes functionalized with 7-octenyltrichlorosilane and n-octyltrichlorosilane: dispersion in Sylgard®184 silicone and Youngs modulus”. Vast L, Carpentier L, Lallemand F, Colomer J-F, Van Tendeloo G, Fonseca A, Nagy JB, Mekhalif Z, Delhalle J, Journal of materials science 44, 3476 (2009). http://doi.org/10.1007/s10853-009-3464-1
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TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre”. Ramachandran D, Egoavil R, Crabbe A, Hauffman T, Abakumov A, Verbeeck J, Vandendael I, Terryn H, Schryvers D, Journal of microscopy 264, 207 (2016). http://doi.org/10.1111/jmi.12434
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Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED”. Lu J, Bartholomeeusen E, Sels BF, Schryvers D, Journal of microscopy 265, 27 (2017). http://doi.org/10.1111/jmi.12459
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ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles”. Cautaerts N, Delville R, Schryvers D, Journal of microscopy 273, 189 (2019). http://doi.org/10.1111/jmi.12774
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Analysis of 3D elemental distribution in nanomaterials : towards higher throughput and dose efficiency”. Skorikov A, Batenburg KJ, Bals S, Journal of microscopy 289, 157 (2023). http://doi.org/10.1111/JMI.13167
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy”. Yang Z, Schryvers D, Roels F, d' Haese PC, de Broe ME, Journal of microscopy 223, 133 (2006). http://doi.org/10.1111/j.1365-2818.2006.01601.x
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Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi”. Cao S, Tirry W, van den Broek W, Schryvers D, Journal of microscopy 233, 61 (2009). http://doi.org/10.1111/j.1365-2818.2008.03095.x
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Redeposition and differential sputtering of La in transmission electron microscopy samples of LaAIO3/SrTiO3 multilayers prepared by focused ion beam”. Montoya E, Bals S, Van Tendeloo G, Journal of microscopy 231, 359 (2008). http://doi.org/10.1111/j.1365-2818.2008.02055.x
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Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Journal of microscopy 210, 102 (2003). http://doi.org/10.1046/j.1365-2818.2003.01176.x
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Crystal structure, vibrational, electrical, optical and DFT study of C₂H₁0N₂(IO₃)₂.HIO₃”. Ben Abdallah MA, Bacchi A, Parisini A, Canossa S, Bergamonti L, Balestri D, Kamoun S, Journal Of Molecular Structure 1215, 128254 (2020). http://doi.org/10.1016/J.MOLSTRUC.2020.128254
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C-H\cdots X (X = S, P) hydrogen bonding : the complexes of halothane with dimethyl sulfide and trimethylphosphine”. Michielsen B, Verlackt C, van der Veken BJ, Herrebout WA, Journal Of Molecular Structure 1023, 90 (2012). http://doi.org/10.1016/j.molstruc.2012.02.063
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Colloid size distributions in ion implanted glass”. Nistor LC, van Landuyt J, Barton JD, Hole DE, Skelland ND, Townsend PD, Journal of non-crystalline solids 162, 217 (1993). http://doi.org/10.1016/0022-3093(93)91240-4
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Gallium colloid formation during ion implantation of glass”. Hole DE, Townsend PD, Barton JD, Nistor LC, van Landuyt J, Journal of non-crystalline solids 180, 266 (1995). http://doi.org/10.1016/0022-3093(94)00477-3
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Influence of amorphous phase separation on the crystallization behavior of glass-ceramics in the BaO-TiO2-SiO2 system”. Boulay E, Ragoen C, Idrissi H, Schryvers D, Godet S, Journal of non-crystalline solids 384, 61 (2014). http://doi.org/10.1016/j.jnoncrysol.2013.06.023
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