|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Yao, X.; Li, Y.; Cao, S.; Ma, X.; Zhang, X.-ping; Schryvers, D. |
Optimization of Automated Crystal Orientation and Phase Mapping in TEM Applied to Ni-Ti All Round Shape Memory Alloy |
2015 |
MATEC web of conferences
T2 – Proceedings of ESOMAT 2015 10th European Symposium on Martensitic Transformations, September 14-18, 2015, Antwerp, Belgium |
33 |
1 |
UA library record; WoS full record; WoS citing articles |
|
|
Sandfeld, S.; Samaee, V.; Idrissi, H.; Groten, J.; Pardoen, T.; Schwaiger, R.; Schryvers, D. |
Datasets for the analysis of dislocations at grain boundaries and during vein formation in cyclically deformed Ni micropillars |
2019 |
Data in Brief |
27 |
|
UA library record; WoS full record |
|
|
Idrissi, H.; Bollinger, C.; Boioli, F.; Schryvers, D.; Cordier, P. |
Low-temperature plasticity of olivine revisited with in situ TEM nanomechanical testing |
2016 |
Science Advances |
2 |
32 |
UA library record; WoS full record; WoS citing articles |
|
|
Marteleur, M.; Idrissi, H.; Amin-Ahmadi, B.; Prima, F.; Schryvers, D.; Jacques, P.J. |
On the nucleation mechanism of {112} < 111 > mechanical twins in as-quenched beta metastable Ti-12 wt.% Mo alloy |
2019 |
Materialia |
7 |
|
UA library record; WoS full record; WoS citing articles |
|
|
Poulain, R.; Lumbeeck, G.; Hunka, J.; Proost, J.; Savolainen, H.; Idrissi, H.; Schryvers, D.; Gauquelin, N.; Klein, A. |
Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism |
2022 |
ACS applied electronic materials |
4 |
|
UA library record; WoS full record; WoS citing articles |
|
|
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C.; de Keyzer, R. |
The influence of crystal thickness on the image tone |
2003 |
Journal of imaging science |
47 |
|
UA library record; WoS full record; WoS citing articles |
|