toggle visibility
Search within Results:
Display Options:

Select All    Deselect All
List View
 |   | 
   print
  Author Title Year Publication Volume Times cited Additional Links Links
de Raedt, I.; Janssens, K.; Veeckman, J.; Adams, F. Composition of facon-de-venise and Venetian glass from Antwerp and the Southern Netherlands 2000 UA library record
Janssens, K.; Vincze, L.; Vekemans, B. Evaluation and calibration of micro-XRF data 2000 UA library record
Adams, F.; Janssens, K. Future of m-XRF 2000 UA library record
de Raedt, I.; Janssens, K.; Veeckman, J.; Adriaens, A.; Adams, F. Glass trade in Antwerp during the 15th through 17th century 2000 UA library record
Janssens, K.H.A.; Adams, F.C.V.; Rindby, A. Microscopic X-ray fluorescence analysis 2000 UA library record
Janssens, K.; Adams, F. Overview 2000 UA library record
Ro, C.-U.; Oh, K.-Y.; Van Grieken, R.E. Analysis of heterogeneous CaCO3-CaSO4 single particles using ultra-thin window EPMA 2000 UA library record
Van Grieken, R.; Shevach, Y. Atmospheric deposition and its impact on ecosystems, with reference to the Mid-East region 2000 Eurotrac newsletter UA library record
Caen, J.; Schalm, O.; Janssens, K. Caractérisation historique et chimique des peintures en grisaille et du verre de vitrail dans l'oeuvre de J.-B. Capronnier (1814 – 1891) et J.-B. Bethune (1821 – 1894) 2000 UA library record
Van Grieken, R.; Gysels, K.; Hoornaert, S.; Joos, P.; Osán, J.; Szalóki, I.; Worobiec, A. Characterisation of individual aerosol particles for atmospheric and cultural heritage studies 2000 UA library record
Oh, K.-Y.; Ro, C.-U.; Kim, H.K.; Van Grieken, R. Characterization of aerosol particles at Seoul, Korea, using ultrathin window EPMA 2000 UA library record
Oh, K.-Y.; Ro, C.-U.; Kim, H.K.; Kim, Y.-P.; Van Grieken, R. Characterization of aerosol particles collected at Kosan and 1100 Hill sites, Cheju Island, Korea, using ultrathin window EPMA 2000 UA library record
Injuk, J.; Van Grieken, R. Sample preparation for X-ray fluorescence analysis 2000 15 UA library record
Van Grieken, R.; Injuk, J.; de Bock, L.; van Malderen, H. Study of individual particle types and heavy metal deposition for North Sea aerosols using micro and trace analysis techniques 2000 UA library record
Van Grieken, R.E. X-ray spectrometry 2000 15 UA library record
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study 2000 UA library record; WoS full record;
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization 2000 UA library record; WoS full record;
Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) 2000 UA library record; WoS full record;
Van Renterghem, W.; Karthauser, S.; Schryvers, D.; van Landuyt, J.; De Keyzer, R.; Van Roost, C. The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals 2000 UA library record; WoS full record;
Kneller, J.M.; Soto, R.J.; Surber, S.E.; Colomer, J.F.; Fonseca, A.; Nagy, J.B.; Van Tendeloo, G.; Pietrass, T. TEM and laser-polarized 129Xe NMR characterization of oxidatively purified carbon nanotubes 2000 Journal of the American Chemical Society 122 53 UA library record; WoS full record; WoS citing articles pdf doi
Blockhuys, F.; Claes, M.; Van Grieken, R.; Geise, H.J. Assessing the molecular weight of a conducting polymer by grazing emission XRF 2000 Analytical chemistry 72 UA library record; WoS full record; WoS citing articles doi
Szalóki, I.; Török, S.B.; Ro, C.-U.; Injuk, J.; Van Grieken, R.E. X-ray spectrometry 2000 Analytical chemistry 72 UA library record; WoS full record; WoS citing articles doi
Nistor, L.; Bender, H.; Vantomme, A.; Wu, M.F.; van Landuyt, J.; O'Donnell, K.P.; Martin, R.; Jacobs, K.; Moerman, I. Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer 2000 Applied physics letters 77 44 UA library record; WoS full record; WoS citing articles pdf doi
Razavi, F.S.; Gross, G.; Habermeier, H.-U.; Lebedev, O.; Amelinckx, S.; Van Tendeloo, G.; Vigliante, A. Epitaxial strain induced metal insulator transition in La0.9Sr0.1MnO3 and La0.88Sr0.1MnO3 thin films 2000 Applied physics letters 76 91 UA library record; WoS full record; WoS citing articles pdf doi
Li, H.; Bender, H.; Conard, T.; Maex, K.; Gutakovskii, A.; van Landuyt, J.; Froyen, L. Interaction of a Ti-capped Co thin film with Si3N4 2000 Applied physics letters 77 3 UA library record; WoS full record; WoS citing articles pdf doi
Willems, I.; Konya, Z.; Colomer, J.F.; Van Tendeloo, G.; Nagaraju, N.; Fonseca, A.; Nagy, J.B. Control of the outer diameter of thin carbon nanotubes synthesized by catalytic decomposition of hydrocarbons 2000 Chemical physics letters 317 130 UA library record; WoS full record; WoS citing articles pdf doi
Colomer, J.F.; Stephan, C.; Lefrant, S.; Van Tendeloo, G.; Willems, I.; Konya, Z.; Fonseca, A.; Laurent, C.; Nagy, J.B. Large-scale synthesis of single-wall carbon nanotubes by catalytic chemical vapor deposition (CCVD) method 2000 Chemical physics letters 317 344 UA library record; WoS full record; WoS citing articles pdf doi
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces 2000 Journal of the electrochemical society 147 14 UA library record; WoS full record; WoS citing articles doi
Ro, C.-U.; Osán, J.; Szalóki, I.; Oh, K.-Y.; Kim, H.; Van Grieken, R. Determination of chemical species in individual aerosol particles using ultrathin window EPMA 2000 Environmental science and technology 34 UA library record; WoS full record; WoS citing articles doi
Simionovici, A.S.; Chukalina, M.; Schroer, C.; Drakopoulos, M.; Snigirev, A.; Snigireva, I.; Lengeler, B.; Janssens, K.; Adams, F. High-resolution X-ray fluorescence microtomography of homogeneous samples 2000 IEEE transactions on nuclear science 47 UA library record; WoS full record; WoS citing articles doi
Select All    Deselect All
List View
 |   | 
   print

Save Citations:
Export Records: