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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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Study of the uniformity of aerosol filters by scanning MA-XRF”. Cabal A, Legrand S, Van den Bril B, Tote K, Janssens K, van Espen P, X-ray spectrometry T2 –, 17th European Conference on X-Ray Spectrometry (EXRS), JUN 19-24, 2016, Univ Gothenburg, Univ Gothenburg, Gothenburg, SWEDEN 46, 461 (2017). http://doi.org/10.1002/XRS.2767
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Comparison of x-ray absorption and emission techniques for the investigation of paintings”. Cabal A, Schalm O, Eyskens P, Willems P, Harth A, van Espen P, X-ray spectrometry 44, 141 (2015). http://doi.org/10.1002/XRS.2591
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Study of quasi-fractal many-particle-systems and percolation networks by zero-loss spectroscopic imaging, electron energy-loss spectroscopy and digital image analysis”. Oleshko V, Kindratenko V, Gijbels R, van Espen P, Jacob W, Mikrochimica acta: supplementum 13, 443 (1996)
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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Characterization of individual soot aggregates from different sources using image analysis”. Smekens A, Godoi RHM, Vervoort M, van Espen P, Potgieter-Vermaak SS, Van Grieken R, Journal of atmospheric chemistry 56, 211 (2007). http://doi.org/10.1007/S10874-006-9050-X
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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Gamma induced atom displacements in LYSO and LuYAP crystals as used in medical imaging applications”. Pinera I, Cruz CM, Abreu Y, Leyva A, van Espen P, Diaz A, Cabal AE, Van Remortel N, Interactions With Materials And Atoms 356, 46 (2015). http://doi.org/10.1016/J.NIMB.2015.04.063
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Improved calculation of displacements per atom cross section in solids by gamma and electron irradiation”. Pinera I, Cruz CM, Leyva A, Abreu Y, Cabal AE, van Espen P, Van Remortel N, Interactions With Materials And Atoms 339, 1 (2014). http://doi.org/10.1016/J.NIMB.2014.08.020
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Monte Carlo simulation of X-ray spectra from low energy electrons using optical data”. Roet D, van Espen P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 268, 2794 (2010). http://doi.org/10.1016/J.NIMB.2010.07.004
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Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm”. Piñera I, Cruz CM, van Espen P, Abreu Y, Leyva A, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 274, 191 (2012). http://doi.org/10.1016/J.NIMB.2011.11.021
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AXIL-PC, software for the analysis of complex-x-ray spectra”. van Espen P, Janssens K, Nobels J, Chemometrics and intelligent laboratory systems 1, 109 (1986). http://doi.org/10.1016/0169-7439(86)80031-4
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PC-MCA : a software package for the acquisition and processing of spectral data”. Janssens K, Nobels J, van Espen P, Chemometrics and intelligent laboratory systems 3, 335 (1988). http://doi.org/10.1016/0169-7439(88)80033-9
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The development process of an expert system for the automated interpretation of large epma data sets”. Janssens K, Dorrine W, van Espen P, Chemometrics and intelligent laboratory systems 4, 147 (1988). http://doi.org/10.1016/0169-7439(88)80086-8
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Case specific prediction intervals for tri-PLS1 : the full local linearisation”. Serneels S, Faber K, Verdonck T, van Espen PJ, Chemometrics and intelligent laboratory systems 108, 93 (2011). http://doi.org/10.1016/J.CHEMOLAB.2011.05.002
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Improved radiographic methods for the investigation of paintings using laboratory and synchrotron X-ray sources”. Schalm O, Cabal A, van Espen P, Laquière N, Storme P, Journal of analytical atomic spectrometry 26, 1068 (2011). http://doi.org/10.1039/C0JA00242A
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Concentration profiles of metal contaminants in fluvial sediments of a rural-urban drainage basin in Tanzania”. Hellar-Kihampa H, Potgieter-Vermaak S, De Wael K, Lugwisha E, van Espen P, Van Grieken R, International journal of environmental analytical chemistry 94, 77 (2014). http://doi.org/10.1080/03067319.2013.791976
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Determination of fluorine in uranium oxyfluoride particles as an indicator of particle age”. Kips R, Pidduck AJ, Houlton MR, Leenaers A, Mace JD, Marie O, Pointurier F, Stefaniak EA, Taylor PDP, van den Berghe S, van Espen P, Van Grieken R, Wellum R, Spectrochimica acta: part B : atomic spectroscopy 64, 199 (2009). http://doi.org/10.1016/J.SAB.2008.12.001
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IDAS: a Windows based software package for cluster analysis”. Bondarenko I, Treiger B, Van Grieken R, van Espen P, Spectrochimica acta: part B : atomic spectroscopy 51, 441 (1996)
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Non-linear mapping of microbeam proton-induced X-ray emission data for source identification of North Sea aerosols”. Treiger B, Injuk J, Bondarenko I, van Espen P, Van Grieken R, Breitenbach L, Wätjen U, Spectrochimica acta: part B : atomic spectroscopy 49, 345 (1994). http://doi.org/10.1016/0584-8547(94)80029-4
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Study of a unique 16th century Antwerp majolica floor in the Rameyenhof castle's chapel by means of X-ray fluorescence and portable Raman analytical instrumentation”. Van de Voorde L, Vandevijvere M, Vekemans B, Van Pevenage J, Caen J, Vandenabeele P, van Espen P, Vincze L, Spectrochimica acta: part B : atomic spectroscopy 102, 28 (2014). http://doi.org/10.1016/J.SAB.2014.10.007
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Quantitative analysis of 16-17th century archaeological glass vessels using PLS regression of EPXMA and μ-XRF data”. Lemberge P, Deraedt I, Janssens K, van Espen P, Journal of chemometrics 14, 751 (2000). http://doi.org/10.1002/1099-128X(200009/12)14:5/6<751::AID-CEM622>3.0.CO;2-D
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The primary energy dependence of backscattered electron images up to 100 keV”. Geuens I, Nys B, Naudts J, Gijbels R, Jacob W, van Espen P, Scanning microscopy 5, 339 (1991)
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