| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Metal-assisted secondary ion mass spectrometry: the influence of Ag and Au deposition on molecular ion yields |
2004 |
Analytical chemistry |
76 |
67 |
UA library record; WoS full record; WoS citing articles |
| Poels, K.; van Vaeck, L.; Gijbels, R. |
Microprobe speciation analysis of inorganic solids by Fourier transform laser mass spectrometry |
1998 |
Analytical chemistry |
70 |
32 |
UA library record; WoS full record; WoS citing articles |
| Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. |
Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis |
1997 |
Analytical chemistry |
69 |
6 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R. |
Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions |
1996 |
Analytical chemistry |
68 |
57 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, A.; Gijbels, R.; Goedheer, W.J. |
Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms |
1996 |
Analytical chemistry |
68 |
70 |
UA library record; WoS full record; WoS citing articles |
| Balazs, L.; Gijbels, R.; Vertes, A. |
Expansion of laser-generated plumes near the plasma ignition threshold |
1991 |
Analytical chemistry |
63 |
71 |
UA library record; WoS full record; WoS citing articles |
| Cidu, R.; Fanfani, L.; Shaud, P.; Edmunds, W.M.; Van 't dack, L.; Gijbels, R. |
Determination of gold at the ultratrace level in natural waters |
1994 |
Analytica chimica acta |
296 |
20 |
UA library record; WoS full record; WoS citing articles |
| Shazali, I.; Van 't dack, L.; Gijbels, R. |
Determination of precious metals in ores and rocks by thermal neutron activation/\gamma-spectrometry after preconcentration by nickel sulphide fire assay and coprecipitation with tellurium |
1987 |
Analytica chimica acta |
196 |
49 |
UA library record; WoS full record; WoS citing articles |
| Gijbels, R.; Dams, R. |
Determination of silicon in natural and pollution aerosols by 14-MeV neutron activation analysis |
1973 |
Analytica chimica acta |
63 |
16 |
UA library record; WoS full record; WoS citing articles |
| van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
The determination of silicon in steel by 14-mev neutron activation analysis |
1968 |
Analytica chimica acta |
43 |
19 |
UA library record; WoS full record; WoS citing articles |
| van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. |
Internal standard activation analysis of silicon in steel |
1968 |
Analytica chimica acta |
43 |
14 |
UA library record; WoS full record; WoS citing articles |
| Struyf, H.; van Roy, W.; van Vaeck, L.; van Grieken, R.; Gijbels, R.; Caravatti, P. |
Laser microprobe Fourier transform mass spectrometer with external ion source for organic and inorganic microanalysis |
1993 |
Analytica chimica acta |
283 |
17 |
UA library record; WoS full record; WoS citing articles |
| Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 1 : neutron and γ-ray attenuation effects |
1973 |
Analytica chimica acta |
64 |
11 |
UA library record; WoS full record; WoS citing articles |
| Vandecasteele, C.; van Grieken, R.; Gijbels, R.; Speecke, A. |
Systematic errors in 14-MeV neutron activation analysis for oxygen : part 2 : a general standardization method for the determination of oxygen |
1973 |
Analytica chimica acta |
65 |
12 |
UA library record; WoS full record; WoS citing articles |
| Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. |
Functioning of thiocyanate ions during sulphur and sulphur-plus-gold Sensitization |
2000 |
|
|
|
UA library record; WoS full record; |
| Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
|
|
|
UA library record; WoS full record; |
| Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
|
|
UA library record; WoS full record; |
| Oleshko, V.; Schryvers, D.; Gijbels, R.; Jacob, W. |
Investigation of Ag, Ag2S and Ag(Br,I) small particles by HREM and AEM |
1998 |
|
|
|
UA library record |
| van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. |
Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry |
1997 |
Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 |
4 |
1 |
UA library record; WoS full record; WoS citing articles |
| Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. |
Analysis of thermal waters by ICP-MS |
1991 |
|
|
|
UA library record |
| Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
|
|
|
UA library record |
| Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
|
|
|
UA library record |
| Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
| Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
|
|
|
UA library record |
| Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
|
|
|
UA library record |
| de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. |
Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution |
1999 |
|
|
|
UA library record; WoS full record; |
| Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
1991 |
|
|
|
UA library record |
| Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
| Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling |
2000 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.; Jacob, W. |
Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques |
1996 |
|
|
|
UA library record |
