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Optimization of sample preparation for grazing emission X-ray fluorescence in micro- and trace analysis applications”. Claes M, de Bokx P, Willard N, Veny P, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 52, 1063 (1997). http://doi.org/10.1016/S0584-8547(96)01654-0
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Quantification in grazing-emission X-ray fluorescence spectrometry”. Spolnik ZM, Claes M, Van Grieken RE, de Bokx PK, Urbach HP, Spectrochimica acta: part B : atomic spectroscopy 54, 1525 (1999). http://doi.org/10.1016/S0584-8547(99)00051-8
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Study of a unique 16th century Antwerp majolica floor in the Rameyenhof castle's chapel by means of X-ray fluorescence and portable Raman analytical instrumentation”. Van de Voorde L, Vandevijvere M, Vekemans B, Van Pevenage J, Caen J, Vandenabeele P, van Espen P, Vincze L, Spectrochimica acta: part B : atomic spectroscopy 102, 28 (2014). http://doi.org/10.1016/J.SAB.2014.10.007
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Substrate selection for optimum qualitative and quantitative single atmospheric particles analysis using nano-manipulation, sequential thin-window electron probe X-ray microanalysis and micro-Raman spectrometry”. Godoi RHM, Potgieter-Vermaak S, de Hoog J, Kaegi R, Van Grieken R, Spectrochimica acta: part B : atomic spectroscopy 61, 375 (2006). http://doi.org/10.1016/J.SAB.2006.02.004
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Classical nature of quantum dots in a magnetic field”. Anisimovas E, Matulis A, Peeters FM, Acta physica Polonica: A: general physics, solid state physics, applied physics 107, 188 (2005)
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Electron microscopy and X-ray structural investigations of incommensurate spin-ladder Sr4.1Ca4.7Bi0.3Cu17O29 single crystals”. Dluzewski P, Pietraszko A, Kozlowski M, Szczepanska A, Gorecka J, Baran M, Leonyuk L, Babonas GJ, Lebedev OI, Szymczak R, Acta physica Polonica: A: general physics, solid state physics, applied physics 98, 729 (2000)
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Free-standing Si and Ge, and Ge/Si core-shell semiconductor nanowires”. Peelaers H, Partoens B, Peeters FM, Acta physica Polonica: A: general physics, solid state physics, applied physics T2 –, WELCOME Scientific Meeting on Hybrid Nanostructures, AUG 28-31, 2011, Torun, POLAND 122, 294 (2012)
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Interband optical properties of concentric type-I nanorings in a normal magnetic field”. Arsoski V, Tadić, M, Peeters FM, Acta physica Polonica: A: general physics, solid state physics, applied physics 117, 733 (2010)
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The optical excitonic Aharonov-Bohm effect in a few nanometer wide type-I nanorings”. Tadić, M, Arsoski V, Čukarić, N, Peeters FM, Acta physica Polonica: A: general physics, solid state physics, applied physics 117, 974 (2010)
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Applications of laser microprobe mass analysis in medicine”. Verbueken AH, van de Vijver FL, de Broe ME, Van Grieken RE, CRC critical reviews in clinical laboratory sciences 24, 263 (1987)
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Strong-coupling limit for one-dimensional polarons in a finite box”. Vansant P, Smondyrev MA, Peeters FM, Devreese JT, Zeitschrift für Physik: B: condensed matter and quanta 99, 345 (1996). http://doi.org/10.1007/s002570050047
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Urine nitrification with a synthetic microbial community”. Christiaens MER, De Paepe J, Ilgrande C, De Vrieze J, Barys J, Teirlinck P, Meerbergen K, Lievens B, Boon N, Clauwaert P, Vlaeminck SE, Systematic and applied microbiology 42, Unsp 126021 (2019). http://doi.org/10.1016/J.SYAPM.2019.126021
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Multidisciplinary environmental monitoring at the Kunsthistorisches Museum, Vienna”. Sturaro G, Camuffo D, Brimblecombe P, Van Grieken R, Busse H-J, Bernardi A, Valentino A, Blades N, Gysels K, Deutsch F, Wieser M, Buczolits S, Journal of trace and microprobe techniques 21, 273 (2003). http://doi.org/10.1081/TMA-120020262
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FLCS-PON : a 100 Gbit/s flexible passive optical network: concepts and field trial”. Borkowski R, Straub M, Ou Y, Lefevre Y, Jelić, ŽL, Lanneer W, Kaneda N, Mahadevan A, Hueckstaedt V, van Veen D, Houtsma V, Coomans W, Bonk R, Maes J, Journal Of Lightwave Technology 39, 5314 (2021). http://doi.org/10.1109/JLT.2021.3102383
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Thermal recrystallization of short-range ordered WS2 films”. Heyne MH, de Marneffe J-F, Radu I, Neyts EC, De Gendt S, Journal of vacuum science and technology: A: vacuum surfaces and films 36, 05g501 (2018). http://doi.org/10.1116/1.5036654
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Corrosion protection of Cu by atomic layer deposition”. Cremers V, Rampelberg G, Baert K, Abrahami S, Claes N, de Oliveira TM, Terryn H, Bals S, Dendooven J, Detavernier C, Journal of vacuum science and technology: A: vacuum surfaces and films 37, 060902 (2019). http://doi.org/10.1116/1.5116136
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Addition of yttrium into HfO2 films: microstructure and electrical properties”. Dubourdieu C, Rauwel E, Roussel H, Ducroquet F, Hollaender B, Rossell M, Van Tendeloo G, Lhostis S, Rushworth S, Journal of vacuum science and technology: A: vacuum surfaces and films 27, 503 (2009). http://doi.org/10.1116/1.3106627
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Crystalline structure of very hard tungsten carbide thin films obtained by reactive pulsed laser deposition”. Mihailescu IN, Gyorgy E, Marin G, Popescu M, Teodorescu VS, van Landuyt J, Grivas C, Hatziapostolou A, Journal of vacuum science and technology: A: vacuum surfaces and films 17, 249 (1999). http://doi.org/10.1116/1.581579
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Influence of sticking coefficients on the behavior of sputtered atoms in an argon glow discharge: modeling and comparison with experiment”. Bogaerts A, Naylor J, Hatcher M, Jones WJ, Mason R, Journal of vacuum science and technology: A: vacuum surfaces and films 16, 2400 (1998). http://doi.org/10.1116/1.581359
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Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates”. Delabie A, Sioncke S, Rip J, Van Elshocht S, Pourtois G, Mueller M, Beckhoff B, Pierloot K, Journal of vacuum science and technology: A: vacuum surfaces and films 30, 01a127 (2012). http://doi.org/10.1116/1.3664090
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Comparison of As- and P-based metamorphic buffers for high performance InP heterojunction bipolar transistor and high electron mobility transistor applications”. Lubyshev D, Fastenau JM, Fang X-M, Wu Y, Doss C, Snyder A, Liu WK, Lamb MSM, Bals S, Song C, Journal of vacuum science &, technology. B. Microelectronics and nanometer structures. Processing, measurement and phenomena 22, 1565 (2004). http://doi.org/10.1116/1.1691412
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High precision determination of the elastic strain of InGaN/GaN multiple quantum wells”. Wu MF, Zhou S, Yao S, Zhao Q, Vantomme A, van Daele B, Piscopiello E, Van Tendeloo G, Tong YZ, Yang ZJ, Yu TJ, Zhang GY, Journal of vacuum science and technology: B: microelectronics and nanometer structures 22, 920 (2004). http://doi.org/10.1116/1.1715085
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Innovative market-based policy instruments for waste management : a case study on shredder residues in Belgium”. Dubois M, Hoogmartens R, Van Passel S, Van Acker K, Vanderreydt I, Waste Management &, Research 33, 886 (2015). http://doi.org/10.1177/0734242X15600053
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Purple phototrophic bacteria for resource recovery : challenges and opportunities”. Capson-Tojo G, Batstone DJ, Grassino M, Vlaeminck SE, Puyol D, Verstraete W, Kleerebezem R, Oehmen A, Ghimire A, Pikaar I, Lema JM, Hülsen T, Grassino M, Hulsen T, Biotechnology Advances 43, 107567 (2020). http://doi.org/10.1016/J.BIOTECHADV.2020.107567
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Intrinsic tailing of resistive states distributions in amorphous <tex>HfOx </tex>, and TaOx based resistive random access memories”. Clima S, Chen YY, Fantini A, Goux L, Degraeve R, Govoreanu B, Pourtois G, Jurczak M, IEEE electron device letters 36, 769 (2015). http://doi.org/10.1109/LED.2015.2448731
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Uniform strain in heterostructure tunnel field-effect transistors”. Verreck D, Verhulst AS, Van de Put ML, Sorée B, Collaert N, Mocuta A, Thean A, Groeseneken G, IEEE electron device letters 37, 337 (2016). http://doi.org/10.1109/LED.2016.2519681
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Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations”. Clima S, Kaczer B, Govoreanu B, Popovici M, Swerts J, Verhulst AS, Jurczak M, De Gendt S, Pourtois G, IEEE electron device letters 34, 402 (2013). http://doi.org/10.1109/LED.2013.2238885
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Superior reliability of junctionless pFinFETs by reduced oxide electric field”. Toledano-Luque M, Matagne P, Sibaja-Hernandez A, Chiarella T, Ragnarsson L-A, Sorée B, Cho M, Mocuta A, Thean A, IEEE electron device letters 35, 1179 (2014). http://doi.org/10.1109/LED.2014.2361769
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Temperature-dependent modeling and characterization of through-silicon via capacitance”. Katti G, Stucchi M, Velenis D, Sorée B, de Meyer K, Dehaene W, IEEE electron device letters 32, 563 (2011). http://doi.org/10.1109/LED.2011.2109052
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Numerical simulation of hydrocarbon plasmas for nanoparticle formation and the growth of nanostructured thin films”. Neyts E, Eckert M, Mao M, Bogaerts A, Plasma physics and controlled fusion 51, 124034 (2009). http://doi.org/10.1088/0741-3335/51/12/124034
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