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Recrystallization and grain growth in a B2 iron aluminide alloy”. Samajdar I, Ratchev P, Verlinden B, Schryvers D, Intermetallics 6, 419 (1998). http://doi.org/10.1016/S0966-9795(97)00092-7
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Transmission electron microscopy study of combined precipitation of Ti2Ni(Pd) and Ti2Pd(Ni) in a Ti50Ni30Pd20 alloy”. Delville R, Schryvers D, Intermetallics 18, 2353 (2010). http://doi.org/10.1016/j.intermet.2010.08.006
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Twinned b.c.c. sherical particles in a partially crystallised Ti50Ni25Cu25 melt-spun ribbon”. Santamarta R, Schryvers D, Intermetallics 12, 341 (2004). http://doi.org/10.1016/j.intermet.2003.12.002
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope”. Cooper D, Denneulin T, Bernier N, Béché, A, Rouvière J-L, Micron 80, 145 (2016). http://doi.org/10.1016/J.MICRON.2015.09.001
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Nanoscale investigation by TEM and STEM-EELS of the laser induced yellowing”. Godet M, Vergès-Belmin V, Gauquelin N, Saheb M, Monnier J, Leroy E, Bourgon J, Verbeeck J, Andraud C, Micron 115, 25 (2018). http://doi.org/10.1016/j.micron.2018.08.006
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Effectiveness of reducing the influence of CTAB at the surface of metal nanoparticles during in situ heating studies by TEM”. De Meyer R, Albrecht W, Bals S, Micron 144, 103036 (2021). http://doi.org/10.1016/j.micron.2021.103036
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Exploring the effects of graphene and temperature in reducing electron beam damage: A TEM and electron diffraction-based quantitative study on Lead Phthalocyanine (PbPc) crystals”. Jain N, Hao Y, Parekh U, Kaltenegger M, Pedrazo-Tardajos A, Lazzaroni R, Resel R, Geerts YH, Bals S, Van Aert S, Micron 169, 103444 (2023). http://doi.org/10.1016/j.micron.2023.103444
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Do you believe that atoms stay in place when you observe them in HREM?”.van Dyck D, Lobato I, Chen F-R, Kisielowski C, Micron 68, 158 (2015). http://doi.org/10.1016/j.micron.2014.09.003
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The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images”. Martinez GT, de Backer A, Rosenauer A, Verbeeck J, Van Aert S, Micron 63, 57 (2014). http://doi.org/10.1016/j.micron.2013.12.009
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Electronic structure of Pd nanoparticles on carbon nanotubes”. Felten A, Ghijsen J, Pireaux J-J, Drube W, Johnson RL, Liang D, Hecq M, Van Tendeloo G, Bittencourt C, Micron 40, 74 (2009). http://doi.org/10.1016/j.micron.2008.01.013
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Focused electron beam induced deposition as a tool to create electron vortices”. Béché, A, Winkler R, Plank H, Hofer F, Verbeeck J, Micron 80, 34 (2015). http://doi.org/10.1016/j.micron.2015.07.011
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First-principles calculation of the electronic structure and energy loss near edge spectra of chiral carbon nanotubes”. Bertoni G, Calmels L, Micron 37, 486 (2006). http://doi.org/10.1016/j.micron.2005.10.011
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Functionalization of MWCNTs with atomic nitrogen”. Ruelle B, Felten A, Ghijsen J, Drube W, Johnson RL, Liang D, Erni R, Van Tendeloo G, Sophie P, Dubois P, Godfroid T, Hecq M, Bittencourt C;, Micron 40, 85 (2009). http://doi.org/10.1016/j.micron.2008.01.003
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How to optimize the experimental design of quantitative atomic resolution TEM experiments?”.Van Aert S, den Dekker AJ, van Dyck D, Micron 35, 425 (2004). http://doi.org/10.1016/j.micron.2004.01.007
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Imaging from atomic structure to electronic structure”. Xu Q, Zandbergen HW, van Dyck D, Micron 43, 524 (2012). http://doi.org/10.1016/j.micron.2011.10.024
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Model-based electron microscopy : from images toward precise numbers for unknown structure parameters”. Van Aert S, van den Broek W, Goos P, van Dyck D, Micron 43, 509 (2012). http://doi.org/10.1016/j.micron.2011.10.019
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One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopy”. Kirilenko DA, Dideykin AT, Aleksenskiy AE, Sitnikova AA, Konnikov SG, Vul' AY, Micron 68, 23 (2015). http://doi.org/10.1016/j.micron.2014.08.006
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Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy”. Yang Z, Schryvers D, Micron 37, 503 (2006). http://doi.org/10.1016/j.micron.2005.08.002
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Ultrastructure and composition of cell wall appositions in the roots of Asplenium (Polypodiales)”. Leroux O, Leroux F, Bagniewska-Zadworna, Knox JP, Claeys M, Bals S, Viane RLL, Micron 42, 863 (2011). http://doi.org/10.1016/j.micron.2011.06.002
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Electron-microscopy investigation of superconducting la2cu(o, f)4+y oxyfluoride”. Weill, Chevalier, Chambon, Tressaud, Darriet, Etourneau, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Electron microscopy investigation of superconducting La2Cu(O,F)4+y oxyfluoride”. Weill F, Chevalier B, Chambon M, Tressaud A, Darriet B, Etourneau J, Van Tendeloo G, European journal of solid state and inorganic chemistry 30, 1095 (1993)
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Mixed valent iron oxides with the 0201-1201 intergrowth structure: (Pb1-xTlx)Sr4Fe2O9 (0≤x≤1)”. Daniel P, Barbey L, Groult D, Nguyen N, Van Tendeloo G, Raveau B, European journal of solid state and inorganic chemistry 31, 235 (1994)
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New cation deficient perovskite-like oxides in the system La4Ti3O12-LaTiO3”. Bontchev R, Darriet B, Darriet J, Weill F, Van Tendeloo G, Amelinckx S, European journal of solid state and inorganic chemistry 30, 521 (1993)
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Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang Z, , 329 (2005)
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Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy”. De Gryse O, Clauws P, Vanhellemont J, Lebedev O, van Landuyt J, Simoen E, Claeys C, , 183 (2002)
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Quantitative EFTEM study of germanium quantum dots”. Hens S, Stuer C, Bender H, Loo R, van Landuyt J, , 345 (2001)
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Stress analysis with convergent beam electron diffraction around NMOS transistors”. Stuer G, Bender H, van Landuyt J, Eyben P, , 359 (2001)
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Atomic defects, functional groups and properties in MXenes”. Cui W, Hu Z-Y, Unocic RR, Van Tendeloo G, Sang X, Chinese Chemical Letters 32, 339 (2021). http://doi.org/10.1016/J.CCLET.2020.04.024
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“Branched&rdquo, structural transformation of the L12-Al3Zr phase manipulated by Cu substitution/segregation in the Al-Cu-Zr alloy system”. Ding L, Zhao M, Ehlers FJH, Jia Z, Zhang Z, Weng Y, Schryvers D, Liu Q, Idrissi H, Journal of materials science &, technology 185, 186 (2024). http://doi.org/10.1016/j.jmst.2023.11.015
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