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  Author Title Year Publication Volume Times cited Additional Links Links
van Cleempoel, A.; Gijbels, R.; van den Heuvel, H.; Claeys, M. Analysis of C60 and C70 oxides by HPLC and low- and high-energy collision-induced dissocation tandem mass spectrometry 1997 Proceedings Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials, 191th Meeting of the Electrochemical Society, Montreal, Canada, 4-9 May 1997 4 1 UA library record; WoS full record; WoS citing articles
Veldeman, E.; Van 't dack, L.; Gijbels, R.; Campbell, M.; Vanhaecke, F.; Vanhoe, H.; Vandecasteele, C. Analysis of thermal waters by ICP-MS 1991 UA library record
Gijbels, R.; van Grieken, R. Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) 1977 UA library record
Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) 1983 UA library record
Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. Application of neural networks in image analysis: the classification of geometrical shapes 1993 CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology 10 UA library record
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. Application of trace element analysis to geothermal waters 1977 UA library record
Gijbels, R.; Oksenoid, K.G. Atomic mass spectrometry 1995 UA library record
de Witte, H.; de Gendt, S.; Douglas, M.; Conard, T.; Kenis, K.; Mertens, P.W.; Vandervorst, W.; Gijbels, R. Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution 1999 UA library record; WoS full record;
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging 1991 UA library record
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. The chemical characterization of silver halide microcrystals 1993 UA library record
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. Chemical surface characterization of complex AgX microcrystals by imaging TOF-SIMS and dual beam depth profiling 2000 UA library record
Oleshko, V.P.; Gijbels, R.; Jacob, W. Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques 1996 UA library record
Jenett, H.; Grallath, E.; Riedel, R.; Strecker, K.; Gijbels, R.; Kennis, P. Comparative bulk, surface and depth profile analyses on AIN and SiC-coated B4C powders 1991 Fres J. Anal. Chem. 341 2 UA library record; WoS full record; WoS citing articles
Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. Complex structural and analytical characterization of silver halide photographic systems by means of analytical electron microscopy 1994 UA library record; WoS full record;
Pentcheva, E.; Van 't dack, L.; Veldeman, E.; Gijbels, R. Corrélations chimiques-géothermométriques des paramètres microchimiques des hydrothermes profonds 1996 Comptes rendus de l'Académie bulgare des sciences 49 UA library record
Oleshko, V.; Gijbels, R.; Jacob, W. Cryo-analytical electron microscopy: new insight into understanding of crystalline and electronic structure of silver halides 1998 1 UA library record; WoS full record; WoS citing articles
Shimizu, K.; Habazaki, H.; Bender, H.; Gijbels, R. The dawn of surface analysis that stands by the side users: ultra-thin film analysis by rf-GDOES 2004 Engineering materials 52 UA library record
van Straaten, M.; Butaye, L.; Gijbels, R. Depth profiling of coated steel wires by GDMS 1992 UA library record
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. Depth profiling of silver halide microcrystals 1992 UA library record
Geuens, I.; Gijbels, R.; Jacob, W. Depth profiling of silver halide microcrystals 1991 UA library record
van Grieken, R.; Gijbels, R.; Speecke, A.; Hoste, J. Determination of oxygen, silicon, phosphorus and copper in iron and steel by 14 MeV neutron activation analysis 1971 UA library record
Charlier, E.; Gijbels, R.; Van Doorselaer, M.; De Keyzer, R. Determination of the silver sulphide cluster size distribution via computer simulations 2000 UA library record; WoS full record;
Gijbels, R. Development of a Fourier transform laser microprobe mass spectrometer with external ion source 1993 ICR/Ion trap newsletter 30 UA library record
Gijbels, R.; Adriaens, A. Einleitung zu den massenspektrometrischen Methoden 2000 UA library record
Oleshko, V.; Gijbels, R.; Amelinckx, S. Electron microscopy and scanning microanalysis 2000 UA library record
Oleshko, V.P.; Gijbels, R.; Amelinckx, S. Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis 2013 UA library record
van Roy, W.; van Vaeck, L.; Gijbels, R. Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis 1992 UA library record
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. Evolution of impurity clusters and mechanism of formation of photographic sensitivity 1998 UA library record
Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. Evolution of impurity clusters and photographic sensitivity 2000 Zhurnal nauchnoj prikladnoj fotografii i kinematografii 45 UA library record
Van 't dack, L.; Beusen, J.-M.; Claesson, T.; Vandelannoote, R.; van Grieken, R.; Gijbels, R. Experimental weathering studies of igneous rocks (alkali-granite, granodiorite, gabbro and granite) and sedimentary gneiss under hydrothermal conditions 1985 UA library record
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