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Author |
Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Hayashi, N.; Terashima, T.; Takano, M. |
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Title |
Structure and microstructure of epitaxial SrnFenO3n-1 films |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Philosophical magazine |
Abbreviated Journal |
Philos Mag |
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Volume |
84 |
Issue |
36 |
Pages |
3825-3841 |
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Keywords |
A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT) |
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Abstract |
Thin films of SrFeO3-x (0 less than or equal to x less than or equal to 0.5) (SFO) grown on a (LaAlO3)(0.3) (SrAl0.5Ta0.5O3)(0.7) (LSAT) substrate by Pulsed laser deposition have been structurally investigated by electron diffraction and high resolution transmission electron microscopy for different post-deposition oxygen treatments. During the deposition and post-growth oxidation, the oxygen-reduced SFO films accept extra oxygen along the tetrahedral layers to minimize the elastic strain energy. The oxidation process stops at a concentration SFO2.875 and/or SFO2.75 because a zero misfit with the LSAT substrate is reached. A possible growth mechanism and phase transition mechanism are suggested. The non-oxidized films exhibit twin boundaries having a local perovskite-type structure with a nominal composition close to SFO3. |
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Wos |
000225854700001 |
Publication Date |
2005-01-28 |
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Edition |
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ISSN |
1478-6435;1478-6443; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.505 |
Times cited |
4 |
Open Access |
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Notes |
reprint |
Approved |
Most recent IF: 1.505; 2004 IF: 1.167 |
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Call Number |
UA @ lucian @ c:irua:54755 |
Serial |
3287 |
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Author |
Rossell, M.D.; Lebedev, O.I.; Van Tendeloo, G.; Hayashi, N.; Terashima, T.; Takano, M. |
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Title |
Structure of epitaxial Ca2Fe2O5 films deposited on different perovskite-type substrates |
Type |
A1 Journal article |
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Year |
2004 |
Publication |
Journal of applied physics |
Abbreviated Journal |
J Appl Phys |
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Volume |
95 |
Issue |
9 |
Pages |
5145-5152 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Publisher |
American Institute of Physics |
Place of Publication |
New York, N.Y. |
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Wos |
000220875400096 |
Publication Date |
2004-04-14 |
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ISSN |
0021-8979; |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
2.068 |
Times cited |
16 |
Open Access |
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Notes |
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Approved |
Most recent IF: 2.068; 2004 IF: 2.255 |
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Call Number |
UA @ lucian @ c:irua:54828 |
Serial |
3310 |
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Permanent link to this record |