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Author
Title
Year
Publication
Volume
Times cited
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Verlinden, G.
;
Gijbels, R.
;
Geuens, I.
;
Benninghoven, A.
Imaging time-of-flight SIMS (TOF-SIMS) surface analysis of halide distributions in complex silver halide microcrystals
1998
UA library record
Verlinden, G.
;
Gijbels, R.
;
Brox, O.
;
Benninghoven, A.
;
Geuens, I.
;
de Keyzer, R.
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS)
1997
UA library record
;
WoS full record
;