Bals, S.; Van Tendeloo, G.; Rijnders, G.; Huijben, M.; Leca, V.; Blank, D.H.A. |
Transmission electron microscopy on interface engineered superconducting thin films |
2003 |
IEEE transactions on applied superconductivity |
13 |
13 |
UA library record; WoS full record; WoS citing articles |