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“
Measuring the absolute position of EELS ionisation edges in a TEM
”. Potapov PL, Schryvers D, Ultramicroscopy
99
, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
Keywords:
A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor:
2.843
Times cited:
29
DOI:
10.1016/S0304-3991(03)00185-2
Additional Links:
UA library record
;
WoS full record
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