Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Takeda, M.; Shinohara, G.; Yamada, H.; Yoshida, S.; van Landuyt, J.; Hashimoto, H. |
Precipitation behavior in Cu-Co alloy |
1998 |
|
|
|
UA library record |
Geim, A.K.; Lok, J.G.S.; Maan, J.C.; Dubonos, S.V.; Li, X.Q.; Peeters, F.M.; Nazarov, Y.V. |
Precision magnetometry on a submicron scale |
1996 |
|
|
|
UA library record |
Shazali, I.; Van 't dack, L.; Gijbels, R. |
Preconcentration of precious metals by tellurium sulphide fire-assay followed by instrumental neutron activation analysis |
1988 |
|
|
|
UA library record |
Cao, S. |
Quantitative 3D analysis of Ni4Ti3 precipitate morphology and distribution in Ni-Ti by FIB/SEM slice-and-view |
2010 |
|
|
|
UA library record |
Wang, W.-C. |
Quantitative analysis of electron exit waves with single atom sensitivity |
2011 |
|
|
|
UA library record |
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
|
|
|
UA library record |
de Backer, A. |
Quantitative atomic resolution electron microscopy using advanced statistical techniques |
2015 |
|
|
|
UA library record |
Hens, S.; Stuer, C.; Bender, H.; Loo, R.; van Landuyt, J. |
Quantitative EFTEM study of germanium quantum dots |
2001 |
|
|
|
UA library record; WoS full record; |
Heidari Mezerji, H. |
Quantitative electron tomography of nanoparticles |
2012 |
|
|
|
UA library record |
Martínez Alanis, G.T. |
Quantitative model-based high angle annular dark field scanning transmission electron microscopy |
2015 |
|
|
|
UA library record |
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
Bogaerts, R.; de Keyser, A.; Herlach, F.; Peeters, F.M.; DeRosa, F.; Palmstrøm, C.J.; Brehmer, D.; Allen, S.J. |
Quantum oscillations in the Hall effect of thin Sc1-xErxAs epitaxial layers burried in GaAs |
1995 |
|
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|
UA library record |
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry |
1996 |
|
|
|
UA library record |
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
|
|
|
UA library record; WoS full record; |
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
|
|
|
UA library record |
Wang, Y.J.; Nickel, H.A.; McCombe, B.D.; Peeters, F.M.; Hai, G.Q.; Shi, J.M.; Devreese, J.T.; Wu, X.G. |
Resonant magnetopolaron effects in GaAs/AlGaAs MQWs at high magnetic fields |
1997 |
|
|
|
UA library record |
Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
|
|
|
UA library record |
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1996 |
|
|
|
UA library record |
Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
The selective imaging of “substructures” in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41 |
1992 |
|
|
|
UA library record |
Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
|
|
|
UA library record; WoS full record; |
Xu, W.; Vasilopoulos, P.; Das, M.P.; Peeters, F.M. |
Self-consistent g* factor and spin-split Landau levels in strong magnetic fields and at low temperatures |
1995 |
|
|
|
UA library record |
Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
|
|
|
UA library record; WoS full record; |
Elmonov, A.A.; Yusupov, M.S.; Dzhurakhalov, A.A.; Bogaerts, A. |
Sputtering of Si(001) and SiC(001) by grazing ion bombardment |
2008 |
|
|
|
UA library record; WoS full record; |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. |
Statistical experimental design for quantitative atomic resolution transmission electron microscopy |
2004 |
|
|
13 |
UA library record; WoS full record; WoS citing articles |
Egoavil, R. |
STEM investigation of complex oxides at the atomic scale |
2014 |
|
|
|
UA library record |
Lebedev, O.I.; Van Tendeloo, G.; Amelinckx, S. |
Strained La1-xSrxMnO3 (x = 0.1 – 0.3) thin films studied by HREM |
2000 |
|
|
|
UA library record |