NANOlab Center of Excellence literature database -- Query Results

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Author	Title	Year	Publication	Additional Links
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	General conclusions and future perspectives	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics	UA library record
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S.	Image-quality evaluation and model selection with maximum a posteriori probability	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics	UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Introduction	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics	UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Optimal experiment design for nanoparticle atom counting from ADF STEM images	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics	UA library record
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S.	Statistical parameter estimation theory : principles and simulation studies	2021	Advances in imaging and electron physics T2 – Advances in imaging and electron physics	UA library record
Van Aert, S.	Statistical parameter estimation theory : a tool for quantitative electron microscopy	2012		UA library record
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G.	The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data	2008		UA library record
Schryvers, D.; Van Aert, S.	High-resolution visualization techniques : structural aspects	2012		UA library record