| Records |
| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
General conclusions and future perspectives |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
|
Pages |
243-253 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
This chapter provides an overview of statistical and quantitative methodologies that have pushed (scanning) transmission electron microscopy ((S)TEM) toward accurate and precise measurements of unknown structure parameters for understanding the relation between the structure of a material and its properties. Hereby, statistical parameter estimation theory has extensively been used which enabled not only measuring atomic column positions, but also quantifying the number of atoms, and detecting atomic columns as accurately and precisely as possible from experimental images. As a general conclusion, it can be stated that advanced statistical techniques are ideal tools to perform quantitative electron microscopy at the atomic scale. In the future, statistical methods will continue to be developed and novel quantification procedures will open up new possibilities for studying material structures at the atomic scale. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN  |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177533 |
Serial |
6781 |
| Permanent link to this record |
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| Author |
Fatermans, J.; de Backer, A.; den Dekker, A.J.; Van Aert, S. |
| Title |
Image-quality evaluation and model selection with maximum a posteriori probability |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
|
| Volume |
|
Issue |
|
Pages |
215-242 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods. |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177532 |
Serial |
6782 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Introduction |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
|
Pages |
1-28 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
|
Edition |
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| ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177525 |
Serial |
6784 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Optimal experiment design for nanoparticle atom counting from ADF STEM images |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
|
Pages |
145-175 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this chapter, the principles of detection theory are used to quantify the probability of error for atom counting from high-resolution scanning transmission electron microscopy (HRSTEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom counting using the expression of the probability of error. We show that for very thin objects the low-angle annular dark-field (LAADF) regime is optimal and that for thicker objects the optimal inner detector angle increases. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
|
ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177530 |
Serial |
6785 |
| Permanent link to this record |
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| Author |
de Backer, A.; Fatermans, J.; den Dekker, A.J.; Van Aert, S. |
| Title |
Statistical parameter estimation theory : principles and simulation studies |
Type |
H2 Book chapter |
| Year |
2021 |
Publication |
Advances in imaging and electron physics
T2 – Advances in imaging and electron physics |
Abbreviated Journal |
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| Volume |
|
Issue |
|
Pages |
29-72 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
In this chapter, the principles of statistical parameter estimation theory for a quantitative analysis of atomic-resolution electron microscopy images are introduced. Within this framework, electron microscopy images are described by a parametric statistical model. Here, parametric models are introduced for different types of electron microscopy images: reconstructed exit waves, annular dark-field (ADF) scanning transmission electron microscopy (STEM) images, and simultaneously acquired ADF and annular bright-field (ABF) STEM images. Furthermore, the Cramér-Rao lower bound (CRLB) is introduced, i.e. a theoretical lower bound on the variance of any unbiased estimator. This CRLB is used to quantify the precision of the structure parameters of interest, such as the atomic column positions and the integrated atomic column intensities. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2021-03-06 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
217 |
Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-0-12-824607-8; 1076-5670 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
Not_Open_Access |
| Notes |
ERC Consolidator project funded by the European Union grant #770887 Picometrics |
Approved |
Most recent IF: NA |
| Call Number |
UA @ admin @ c:irua:177527 |
Serial |
6788 |
| Permanent link to this record |
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| |
| Author |
Van Aert, S. |
| Title |
Statistical parameter estimation theory : a tool for quantitative electron microscopy |
Type |
H1 Book chapter |
| Year |
2012 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
281-309 |
| Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
Wiley-VCH |
Place of Publication |
Weinheim |
Editor |
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| Language |
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Wos |
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Publication Date |
0000-00-00 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-3-527-31706-6 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:96693 |
Serial |
3159 |
| Permanent link to this record |
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| Author |
Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. |
| Title |
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data |
Type |
H1 Book chapter |
| Year |
2008 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
97-98 |
| Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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| Language |
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Wos |
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Publication Date |
2009-03-17 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-3-540-85154-7 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:136865 |
Serial |
4493 |
| Permanent link to this record |
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| Author |
Schryvers, D.; Van Aert, S. |
| Title |
High-resolution visualization techniques : structural aspects |
Type |
H1 Book chapter |
| Year |
2012 |
Publication |
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Abbreviated Journal |
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| Volume |
|
Issue |
|
Pages |
135-149 |
| Keywords |
H1 Book chapter; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
Springer |
Place of Publication |
Berlin |
Editor |
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| Language |
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Wos |
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Publication Date |
0000-00-00 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN |
978-3-642-20942-0 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:94124 |
Serial |
1464 |
| Permanent link to this record |
