| Records |
| Author |
Injuk, J.; Van Grieken, R.E. |
| Title |
X-ray fluorescence |
Type |
H3 Book chapter |
| Year |
2001 |
Publication |
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Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
151-178
T2 - Non-destructive elemental analysis / |
| Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
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| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
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ISBN  |
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Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
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| Notes |
|
Approved |
no |
| Call Number |
UA @ admin @ c:irua:34107 |
Serial |
8764 |
| Permanent link to this record |
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| |
| Author |
Janssens, K.L.; Peeters, F.M.; Schweigert, V.A. |
| Title |
Magnetic field dependence of the properties of excitons confined in a quantum disk |
Type |
A1 Journal article |
| Year |
2001 |
Publication |
Physica status solidi: B: basic research |
Abbreviated Journal |
Phys Status Solidi B |
| Volume |
224 |
Issue |
|
Pages |
763-768 |
| Keywords |
A1 Journal article; Condensed Matter Theory (CMT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Berlin |
Editor |
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| Language |
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Wos |
000168432100030 |
Publication Date |
2004-11-23 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0370-1972;1521-3951; |
ISBN |
|
Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
1.674 |
Times cited |
1 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 1.674; 2001 IF: 0.873 |
| Call Number |
UA @ lucian @ c:irua:37311 |
Serial |
1872 |
| Permanent link to this record |
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| Author |
Potapov, P.L.; Kulkova, S.E.; Schryvers, D.; Verbeeck, J. |
| Title |
Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds |
Type |
A1 Journal article |
| Year |
2001 |
Publication |
Physical review : B : condensed matter and materials physics |
Abbreviated Journal |
Phys Rev B |
| Volume |
64 |
Issue |
|
Pages |
184110,1-9 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
Lancaster, Pa |
Editor |
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| Language |
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Wos |
000172239400038 |
Publication Date |
2002-07-27 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
1098-0121;1550-235X; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
3.836 |
Times cited |
44 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: 3.836; 2001 IF: NA |
| Call Number |
UA @ lucian @ c:irua:48393 |
Serial |
3192 |
| Permanent link to this record |
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| Author |
Lebedev, O.I.; Verbeeck, J.; Van Tendeloo, G.; Amelinckx, S.; Ravazi, F.S.; Habermeier, H.-U. |
| Title |
Structure and microstructure of La1-xSrxMnO3 (x=0.16) films grown on a SrTiO3(110) substrate |
Type |
A1 Journal article |
| Year |
2001 |
Publication |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
Abbreviated Journal |
Philos Mag A |
| Volume |
81 |
Issue |
12 |
Pages |
2865-2884 |
| Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
London |
Editor |
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| Language |
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Wos |
000172348000008 |
Publication Date |
2007-07-08 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0141-8610;1460-6992; |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
2.136 |
Times cited |
12 |
Open Access |
|
| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:57132 |
Serial |
3290 |
| Permanent link to this record |
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| |
| Author |
Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. |
| Title |
High resolution electron microscopy from imaging towards measuring |
Type |
H2 Book chapter |
| Year |
2001 |
Publication |
... IEEE International Instrumentation and Measurement Technology Conference
T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 |
Abbreviated Journal |
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| Volume |
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Issue |
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Pages |
2081-2086 |
| Keywords |
H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab |
| Abstract |
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| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
Ieee |
Place of Publication |
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Editor |
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| Language |
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Wos |
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Publication Date |
2002-11-13 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
|
Edition |
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| ISSN |
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ISBN |
0-7803-6646-8 |
Additional Links |
UA library record |
| Impact Factor |
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Times cited |
|
Open Access |
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| Notes |
|
Approved |
Most recent IF: NA |
| Call Number |
UA @ lucian @ c:irua:136870 |
Serial |
4501 |
| Permanent link to this record |
