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Author
Van Aert, S.
;
Verbeeck, J.
;
Bals, S.
;
Erni, R.
;
van Dyck, D.
;
Van Tendeloo, G.
Title
Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy
Type
A1 Journal article
Year
2009
Publication
Microscopy and microanalysis
Abbreviated Journal
Microsc Microanal
Volume
15
Issue
S:2
Pages
464-465
Keywords
A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author
Thesis
Publisher
Place of Publication
Cambridge, Mass.
Editor
Language
Wos
000208119100230
Publication Date
2009-07-27
Series Editor
Series Title
Abbreviated Series Title
Series Volume
Series Issue
Edition
ISSN
1431-9276;1435-8115;
ISBN
Additional Links
UA library record
;
WoS full record
;
WoS citing articles
Impact Factor
1.891
Times cited
1
Open Access
Notes
Approved
Most recent IF: 1.891; 2009 IF: 3.035
Call Number
UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555
Serial
178
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