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Unveiling the composition of sulphur sensitization specks by their interactions with TAI”. Charlier E, van Doorselaer M, Gijbels R, de Keyzer R, Geuens I, Journal Of Imaging Science And Technology 44, 235 (2000)
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RSV frequency in children below 2 years hospitalized for lower respiratory tract infections”. Hacimustafaoglu M, Celebi S, Bozdemir SE, Ozgur T, Ozcan I, Guray A, Çakir D, Turkish Journal Of Pediatrics 55, 130 (2013)
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External costs from fossil electricity generation : a review of the applied impact pathway approach”. Jorli M, Van Passel S, Saghdel HS, Energy &, Environment 29, 635 (2018). http://doi.org/10.1177/0958305X18761616
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The application of laser beam diffraction and scattering methods in the measurement of shape and determination of material parameters”. Sreckovic MZ, Tomic E, Ostojic SM, Ilic JT, Bundaleski N, Sekulic RS, Mlinar V, Lasers in Engineering (Old City Publishing) 17, 179 (2007)
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Impact of tank construction on corrosion of ship ballast tanks”. de Baere K, Verstraelen H, Dewil R, Lemmens L, Lenaerts S, Nkunzimana T, Potters G, Materials performance 49, 48 (2010)
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In situ study of ballast tank corrosion on ships: part 1”. Verstraelen H, de Baere K, Schillemans W, Lemmens L, Dewil R, Lenaerts S, Potters G, Materials performance 48, 48 (2009)
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In situ study of ballast tank corrosion on ships: part 2”. Verstraelen H, de Baere K, Schillemans W, Lemmens L, Dewil R, Lenaerts S, Potters G, Materials performance 48, 54 (2009)
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Structural analysis of CuInSe2, CuInTe2 and CuInSeTe by electron microscopy and X-ray techniques”. Leon M, Merino JM, Van Tendeloo G, Acta Microscopica 18, 128 (2009)
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2-D rotational invariant multi sub band Schrödinger-Poisson solver to model nanowire transistors”. Sels D, Sorée B, Groeseneken G, 14th International Workshop on Computational Electronics, 85 (2010)
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2D semiconductors at the Leuven pulsed field facility”. Bogaerts R, de Keyser A, van Bockstal L, van der Burgt M, van Esch A, Provoost R, Silverans R, Herlach F, Swinnen B, van de Stadt AFW, Koenraad PM, Wolter JH, Karavolas VC, Peeters FM, van de Graaf W, Borghs G, Physicalia magazine 19, 229 (1997)
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The (3 + 2)D structure of oxygen deficient LaSrCuO3.52”. Hadermann J, Pérez O, Créon N, Michel C, Hervieu M, Journal of materials chemistry 17, 2344 (2007). http://doi.org/10.1039/b701449j
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3D reconstruction of Ni4Ti3 precipitates in a Ni51Ti49 alloy in a FIB/SEM dual-beam system”. Cao S, Tirry W, van den Broek W, Schryvers D, Materials science forum 583, 277 (2008). http://doi.org/10.4028/www.scientific.net/MSF.583.277
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Ab initio based atomic scattering amplitudes and {002} electron structure factors of InxGa1-xAs/GaAs quantum wells”. Titantah JT, Lamoen D, Schowalter M, Rosenauer A, Journal of physics : conference series 209, 012040 (2010). http://doi.org/10.1088/1742-6596/209/1/012040
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Ab initio computation of the mean inner Coulomb potential of technological important semiconductors”. Schowalter M, Rosenauer A, Lamoen D, Kruse P, Gerthsen D, 1007, 233 (2005)
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Advanced electron microscopy and its possibilities to solve complex structures: application to transition metal oxides”. Van Tendeloo G, Hadermann J, Abakumov AM, Antipov EV, Journal of materials chemistry 19, 2660 (2009). http://doi.org/10.1039/b817914j
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Advanced electron microscopy characterisation of important precipitation and ordering phenomena in shape memory systems”. Schryvers D, Shape memory and superelasticity 1, 78 (2015). http://doi.org/10.1007/s40830-015-0006-3
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Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA)”. Schryvers D, Tirry W, Cao S, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 229 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.229
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Aerosol synthesis and characterization of ultrafine fullerene particles”. van Cleempoel A, Joutsensaari J, Kauppinen E, Gijbels R, Claeys M, Fullerene science and technology 6, 599 (1998). http://doi.org/10.1080/10641229809350223
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Andreev-type states induced by quantum confinement”. Shanenko AA, Croitoru MD, Mints RG, Peeters FM, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques 2, 611 (2008). http://doi.org/10.1134/S1027451008040216
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Angular confinement and direction-dependent transmission in graphene nanostructures with magnetic barriers”. Masir MR, Vasilopoulos P, Matulis A, Peeters FM, AIP conference proceedings 1199, 363 (2009). http://doi.org/10.1063/1.3295453
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Aqueous CSD approach for the growth of novel, lattice-tuned LaxCe1-xO\delta epitaxial layers”. Narayanan V, Lommens P, De Buysser K, Vanpoucke DEP, Huehne R, Molina L, Van Tendeloo G, van der Voort P, Van Driessche I, Journal of materials chemistry 22, 8476 (2012). http://doi.org/10.1039/c2jm15752g
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Artificial atoms and molecules”. Partoens B, Peeters FM, Physicalia magazine 24, 29 (2002)
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Atomic structure of alloys close to phase transitions”. Van Tendeloo G, Schryvers D, Nucleation and growth processes in materials 580, 283 (2000)
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Band structure, density of states, and transmission in graphene bilayer superlattices”. Barbier M, Vasilopoulos P, Peeters FM, Pereira JM, AIP conference proceedings 1199, 547 (2009). http://doi.org/10.1063/1.3295550
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Biaxially aligned yttria stabilized zirconia and titanium nitride layers deposited by unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, de Gryse R, Depla D, Lebedev OI, Diffusion and defect data : solid state data : part B : solid state phenomena T2 –, 2nd International Conference on Texture and Anisotropy of Polycrystals, JUL 07-09, 2004, Metz, FRANCE 105, 447 (2005)
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Branch current behavior at two level anti-crossings in vertical quantum dot single-particle spectra”. Payette C, Austing DG, Yu G, Gupta JA, Nair SV, Partoens B, Amaha S, Tarucha S, AIP conference proceedings 1199, 271 (2010). http://doi.org/10.1063/1.3295404
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Calculation of Debye-Waller temperature factors for GaAs”. Schowalter M, Rosenauer A, Titantah JT, Lamoen D, Springer proceedings in physics 120, 195 (2008)
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Characterisation of the local stress induced by shallow trench isolation and CoSi2 silicidation”. Stuer C, Steegen A, van Landuyt J, Bender H, Maex K, Institute of physics conference series , 481 (2001)
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Chemical, structural and electrical characterizations in the BIZNVOX family”. Vernochet C, Vannier R-N, Huvé, M, Pirovano C, Nowogrocki G, Mairesse G, Van Tendeloo G, Journal of materials chemistry 10, 2811 (2000). http://doi.org/10.1039/b006157n
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Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J, Institute of physics conference series T2 –, Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND , 495 (1999)
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