Abstract: We studied the coupled impurity states in a freestanding semiconductor nanowire (NW), within the effective mass approximation and including the effect of the dielectric mismatch, by using finite element method. Bonding and anti-bonding states are found and their energies converge with increasing distance di between the two impurities. The dependence of the binding energy on the wire radius R and the distance di between the two impurities is investigated, and we compare it with the result of a freestanding NW that contains a single impurity.

Abstract: ITEM specimens of a LaAlO3/SrTiO3 multilayer are prepared by FIB with internal lift out. Using a Ga+1 beam of 5 kV, a final cleaning step yielding top, top-angle, side, and bottom-angle cleaning is performed. Different cleaning procedures, which can be easily implemented in a dual beam FIB system, are described and compared; all cleaning types produce thin lamellae, useful for HRTEM and HAADF-STEM work up to atomic resolution. However, the top cleaned lamellae are strongly affected by the curtain effect. Top-angle cleaned specimens show an amorphous layer of around 5 nm at the specimen surfaces, due to damage and redeposition. Furthermore, it is observed that the LaAlO3 layers are preferentially destroyed and transformed into amorphous material, during the thinning process.

Abstract: The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.

Abstract: The motivation for the present study is to be found in the recent experiments of Fuchizaki and Hamaya on GeI4. They observed a rapid increase in the melting temperature Tm in going from atmospheric pressure to p
~ 2.6 GPa. Tm was found to be largely independent of pressure above this value. In this paper, heuristic arguments are presented to support the idea that until some critical pressure, a crystalline phase of SnI4, CCl4 and GeI4 molecular solids melts into a low density liquid. However, at this critical pressure, a phase boundary intersects Tm(p), separating a low density liquid phase from a high density liquid. The new phase boundary is between the crystal and an amorphous molecular solid with increasing polymerisation as the pressure is increased.

Abstract: Combined microscopic X-ray fluorescence/microscopic X-ray diffraction (µ-XRF/µ-XRD) tomography is a recently developed method that allows the visualization of the distribution of chemical elements and the associated crystalline phases inside complex, heterogeneous materials of extended thickness (millimeter range) in a nondestructive fashion. In this paper, the accuracy and resolution with which the individual layers in a multilayer stack of automotive paints can be distinguished is evaluated, and some of their properties measured. A paint layer system of eight layers was investigated, in which eight different crystalline substances were identified, each layer consisting of an organic, synthetic resin doped with finely milled inorganic compounds that serve as pigments or to strengthen the layer. In the XRD tomograms, all paint layers could be straightforwardly distinguished and their average thickness calculated. In case the filtered back projection method was used for tomogram reconstruction, a spatial resolution comparable to the microbeam size was obtained indicating no significant reconstruction blurring. When a more robust reconstruction method, such as the maximum-likelihood expectation maximization method, was employed, tomograms showing fewer artifacts were obtained, but with a spatial resolution that was two times worse. In the corresponding XRF tomograms, significant self-absorption distorted the element-specific tomograms corresponding to the low-energy (<7 keV) characteristic radiation and limited their usefulness. It can be concluded that microbeam XRD tomography allows the accurate visualization of the distribution of crystalline phases in multilayered automotive paint materials of millimeter dimensions with sufficient resolution to allow separate characterization of each layer in terms of its crystal-phase composition and thickness.

Abstract: In the present paper, the theory of the large bipolaron is reviewed and the possibility of bipolaron formation in the high-T(c) superconductors is indicated. Operator and path-integral formulations of the large bipolaron problem are compared. In the strong-coupling limit, the effect of non-optimal upper-bounds to the single-polaron groundstate energy is emphasized. The fact that the interaction with multiple phonon branches enhances the electron-phonon interaction and might result in a larger stability region for bipolaron formation is indicated. Experimental values for the static and high-frequency dielectric constants are used to discuss the relevance of bipolaron formation as a pair-forming mechanism in the high-T(c) superconductors.