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Author
Title
Year
Publication
Volume
Times cited
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Müller, K.
;
Schowalter, M.
;
Rosenauer, A.
;
Jansen, J.
;
Tsuda, K.
;
Titantah, J.T.
;
Lamoen, D.
Refinement of chemically sensitive structure factors using parallel and convergent beam electron nanodiffraction
2010
Journal of physics : conference series
209
UA library record