Number of records found: 3074
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Ion current rectification, limiting and overlimiting conductances in nanopores”. van Oeffelen L, Van Roy W, Idrissi H, Charlier D, Lagae L, Borghs G, PLoS ONE 10, e0124171 (2015). http://doi.org/10.1371/journal.pone.0124171
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On the importance of the work function and electron carrier density of oxide electrodes for the functional properties of ferroelectric capacitors”. Wang J, Nguyen MD, Gauquelin N, Verbeeck J, Do MT, Koster G, Rijnders G, Houwman E, Physica Status Solidi-Rapid Research Letters 14, 1900520 (2020). http://doi.org/10.1002/PSSR.201900520
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Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing, and storage”. Nord M, Webster RWH, Paton KA, McVitie S, McGrouther D, MacLaren I, Paterson GW, Microscopy And Microanalysis 26, Pii S1431927620001713 (2020). http://doi.org/10.1017/S1431927620001713
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Fast pixelated detectors in scanning transmission electron microscopy. part II : post-acquisition data processing, visualization, and structural characterization”. Paterson GW, Webster RWH, Ross A, Paton KA, Macgregor TA, McGrouther D, MacLaren I, Nord M, Microscopy And Microanalysis 26, 944 (2020). http://doi.org/10.1017/S1431927620024307
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Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets”. Ning S, Xu W, Ma Y, Loh L, Pennycook TJ, Zhou W, Zhang F, Bosman M, Pennycook SJ, He Q, Loh ND, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622000320
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Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEM”. Yu C-P, Friedrich T, Jannis D, Van Aert S, Verbeeck J, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622000617
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Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM”. De wael A, De Backer A, Yu C-P, Sentürk DG, Lobato I, Faes C, Van Aert S, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622012284
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Can a programmable phase plate serve as an aberration corrector in the transmission electron microscope (TEM)?”.Vega Ibañez F, Béché, A, Verbeeck J, Microscopy and microanalysis , Pii S1431927622012260 (2022). http://doi.org/10.1017/S1431927622012260
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Phase object reconstruction for 4D-STEM using deep learning”. Friedrich T, Yu C-P, Verbeeck J, Van Aert S, Microscopy and microanalysis 29, 395 (2023). http://doi.org/10.1093/MICMIC/OZAC002
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A cyclic catalyst pretreatment in CO2 for high yield production of Carbon nanofibers with narrow diameter distribution”. Corthals S, van Noyen J, Liang D, Ke X, Van Tendeloo G, Jacobs P, Sels B, Catalysis letters 141, 1621 (2011). http://doi.org/10.1007/s10562-011-0690-3
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Fluorescent nanodiamonds with bioorthogonally reactive protein-resistant polymeric coatings”. Rehor I, Mackova H, Filippov SK, Kucka J, Proks V, Slegerova J, Turner S, Van Tendeloo G, Ledvina M, Hruby M, Cigler P;, ChemPlusChem 79, 21 (2014). http://doi.org/10.1002/cplu.201300339
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Solidelectrolyte interphase evolution of carbon-coated silicon nanoparticles for lithium-ion batteries monitored by transmission electron microscopy and impedance spectroscopy”. Van Havenbergh K, Turner S, Driesen K, Bridel J-S, Van Tendeloo G, Energy technology 3, 699 (2015). http://doi.org/10.1002/ente.201500034
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The mechanical behavior during (de)lithiation of coated silicon nanoparticles as anode material for lithium-ion batteries studied by InSitu transmission electron microscopy”. Van Havenbergh K, Turner S, Marx N, Van Tendeloo G, Energy technology 4, 1005 (2016). http://doi.org/10.1002/ENTE.201600057
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High-resolution electron microscopy and electron tomography: resolution versus precision”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A, Journal of structural biology 138, 21 (2002). http://doi.org/10.1016/S1047-8477(02)00016-3
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Microstructures and interfaces in Ni-Al martensite: comparing HRTEM observations with continuum theories”. Schryvers D, Boullay P, Potapov PL, Kohn RV, Ball JM, International journal of solids and structures 39, 3543 (2002). http://doi.org/10.1016/S0020-7683(02)00167-1
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Microstructure of adiabatic shear bands in Ti6Al4V”. Peirs J, Tirry W, Amin-Ahmadi B, Coghe F, Verleysen P, Rabet L, Schryvers D, Degrieck J, Materials characterization 75, 79 (2013). http://doi.org/10.1016/j.matchar.2012.10.009
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Quantitative study of particle size distribution in an in-situ grown Al-TiB2 composite by synchrotron X-ray diffraction and electron microscopy”. Tang Y, Chen Z, Borbely A, Ji G, Zhong SY, Schryvers D, Ji V, Wang HW, Materials characterization 102, 131 (2015). http://doi.org/10.1016/j.matchar.2015.03.003
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Structures in textured Cu-Al-Ni shape memory thin films grown by sputtering”. Espinoza Torres C, Condó, AM, Haberkorn N, Zelaya E, Schryvers D, Guimpel J, Lovey FC, Materials characterization 96, 256 (2014). http://doi.org/10.1016/j.matchar.2014.08.005
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Triple ion beam cutting of diamond/Al composites for interface characterization”. Ji G, Tan Z, Shabadi R, Li Z, Grünewald W, Addad A, Schryvers D, Zhang D, Materials characterization 89, 132 (2014). http://doi.org/10.1016/j.matchar.2014.01.008
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Twinning in pure Ti subjected to monotonic simple shear deformation”. Tirry W, Bouvier S, Benmhenni N, Hammami W, Habraken AM, Coghe F, Schryvers D, Rabet L, Materials characterization 72, 24 (2012). http://doi.org/10.1016/j.matchar.2012.07.001
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Heterogeneous interfacial chemical nature and bonds in a W-coated diamond/Al composite”. Ji G, Tan Z, Lu Y, Schryvers D, Li Z, Zhang D, Materials characterization 112, 129 (2016). http://doi.org/10.1016/j.matchar.2015.12.013
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A quantitative method to characterize the Al4C3-formed interfacial reaction: the case study of MWCNT/Al composites”. Yan L, Tan Z, Ji G, Li Z, Fan G, Schryvers D, Shan A, Zhang D, Materials characterization 112, 213 (2015). http://doi.org/10.1016/j.matchar.2015.12.031
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Microstructure and phase composition characterization in a Co38Ni33Al29 ferromagnetic shape memory alloy”. Lu JB, Schryvers D, Materials characterization 118, 9 (2016). http://doi.org/10.1016/j.matchar.2016.04.028
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Quantitative measurement for the microstructural parameters of nano-precipitates in Al-Mg-Si-Cu alloys”. Li K, Idrissi H, Sha G, Song M, Lu J, Shi H, Wang W, Ringer SP, Du Y, Schryvers D, Materials characterization 118, 352 (2016). http://doi.org/10.1016/j.matchar.2016.06.007
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Martensite crystallography and chemistry in dual phase and fully martensitic steels”. Du C, Hoefnagels JPM, Kolling S, Geers MGD, Sietsma J, Petrov R, Bliznuk V, Koenraad PM, Schryvers D, Amin-Ahmadi B, Materials characterization 139, 411 (2018). http://doi.org/10.1016/j.matchar.2018.03.011
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Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting”. Pourbabak S, Montero-Sistiaga ML, Schryvers D, Van Humbeeck J, Vanmeensel K, Materials characterization 153, 366 (2019). http://doi.org/10.1016/j.matchar.2019.05.024
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Interfacial characteristics and cohesion mechanisms of linear friction welded dissimilar titanium alloys: Ti–5Al–2Sn–2Zr–4Mo–4Cr (Ti17) and Ti–6Al–2Sn–4Zr–2Mo (Ti6242)”. Boyat X, Ballat-Durand D, Marteau J, Bouvier S, Favergeon J, Orekhov A, Schryvers D, Materials characterization 158, 109942 (2019). http://doi.org/10.1016/j.matchar.2019.109942
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Early stages of dissolution corrosion in 316L and DIN 1.4970 austenitic stainless steels with and without anticorrosion coatings in static liquid lead-bismuth eutectic (LBE) at 500 degrees C”. Charalampopoulou E, Lambrinou K, Van der Donck T, Paladino B, Di Fonzo F, Azina C, Eklund P, Mraz S, Schneider JM, Schryvers D, Delville R, Materials Characterization 178, 111234 (2021). http://doi.org/10.1016/J.MATCHAR.2021.111234
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Electron microscopy characterisation of erbium silicide-thin films grown on a Si(111) substrate”. Frangis N, Van Tendeloo G, van Landuyt J, Muret P, Nguyen TTA, Applied surface science 102, 163 (1996). http://doi.org/10.1016/0169-4332(96)00040-2
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High crystalline quality erbium silicide films on (100) silicon grown in high vacuum”. Kaltsas G, Travlos A, Nassiopoulos AG, Frangis N, van Landuyt J, Applied surface science 102, 151 (1996). http://doi.org/10.1016/0169-4332(96)00036-0
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