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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Tinck, S. |
Numerical simulations of inductively coupled plasmas for applications in the microelectronics industry |
2011 |
|
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UA library record |
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Petrovic, D.; Martens, T.; De Bie, C.; van Dijk, J.; Brok, W.J.M.; Bogaerts, A. |
Numerical study on energy efficiency of a cylindrical dielectric barrier discharge plasma-chemical reactor |
2009 |
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|
UA library record; WoS full record; |
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Oleshko, V.P.; Gijbels, R.H.; van Daele, A.J.; Jacob, W.A. |
On estimation of the dielectric function of Ag(Br,I) nanocrystals by cryo-EELS (addendum) |
1999 |
Nanostructered materials |
11 |
|
UA library record |
|
|
|
Adriaensen, L.; Vangaever, F.; Gijbels, R. |
Organische TOF-S-SIMS: gebruik van opgedampt Ag en Au voor de verhoging van secundaire ionenintensiteiten |
2004 |
Chemie magazine |
|
|
UA library record |
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Madani, M.; Bogaerts, A.; Gijbels, R.; Vangeneugden, D. |
Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen |
2004 |
|
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UA library record |
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Neyts, E.C. |
PECVD growth of carbon nanotubes : from experiment to simulation |
2012 |
Journal of vacuum science and technology: B: micro-electronics processing and phenomena |
30 |
42 |
UA library record; WoS full record; WoS citing articles |
|
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
|
|
|
UA library record |
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Mao, M.; Bogaerts, A. |
Plasma chemistry modeling for an inductively coupled plasma used for the growth of carbon nanotubes |
2011 |
Journal of physics : conference series |
275 |
|
UA library record |
|
|
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Van Gaens, W. |
Plasma chemistry modelling of an atmospheric pressure argon plasma jet with air impurities for plasma medicine applications |
2014 |
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UA library record |
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Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
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UA library record |
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de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
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UA library record |
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Neyts, E.; Bogaerts, A.; van de Sanden, M.C.M. |
Reaction mechanisms and thin a-C:H film growth from low energy hydrocarbon radicals |
2007 |
Journal of physics : conference series |
86 |
22 |
UA library record; WoS full record; WoS citing articles |
|
|
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Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
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UA library record; WoS full record; |
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Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
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UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
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|
UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
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|
UA library record |
|
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Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
|
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UA library record; WoS full record; |
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Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
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UA library record; WoS full record; |
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Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
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UA library record; WoS full record; |
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Wendelen, W.; Autrique, D.; Bogaerts, A. |
Space charge limited electron emission from a Cu surface under ultrashort pulsed laser irradiation |
2010 |
AIP conference proceedings |
1278 |
|
UA library record; WoS full record |
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Elmonov, A.A.; Yusupov, M.S.; Dzhurakhalov, A.A.; Bogaerts, A. |
Sputtering of Si(001) and SiC(001) by grazing ion bombardment |
2008 |
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UA library record; WoS full record; |
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Oleshko, V.P.; van Daele, A.; Gijbels, R.H.; Jacob, W.A. |
Structural and analytical characterization of Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
Journal of nanostructured materials |
10 |
5 |
UA library record; WoS full record; WoS citing articles |
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Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
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UA library record |
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Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
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UA library record; WoS full record; |
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de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
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UA library record |
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Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
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UA library record; WoS full record; |
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Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
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UA library record; WoS full record; |
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