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Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images”. van Put A, Vertes A, Wegrzynek D, Treiger B, Van Grieken R, Fresenius' journal of analytical chemistry 350, 440 (1994). http://doi.org/10.1007/BF00321787
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Quantitative determination of low-Z elements in single atmospheric particles on boron substrates by automated scanning electron microscopy: energy-dispersive X-ray spectrometry”. Choël M, Deboudt K, Osán J, Flament P, Van Grieken R, Analytical chemistry 77, 5686 (2005). http://doi.org/10.1021/AC050739X
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Selenium in environmental waters : determination, speciation and concentration levels”. Robberecht H, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 29, 823 (1982). http://doi.org/10.1016/0039-9140(82)80252-X
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Simultaneous determination of silicon and phosphorus in cast iron by 14 MeV neutron activation analysis”. Van Grieken R, Speecke A, Hoste J, Journal of radioanalytical chemistry 6, 385 (1970). http://doi.org/10.1007/BF02513966
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Single-run ion chromatographic separation of inorganic and low-molecular-mass organic anions under isocratic elution: application to environmental samples”. Krata A, Kontozova-Deutsch V, Bencs L, Deutsch F, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 79, 16 (2009). http://doi.org/10.1016/J.TALANTA.2009.02.044
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Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix”. Vanderborght B, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 26, 461 (1979). http://doi.org/10.1016/0039-9140(79)80111-3
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Spatial neutron flux distributions around A 14 MeV neutron generator”. Van Grieken R, Speecke A, Hoste J, Journal of radioanalytical chemistry 10, 95 (1972). http://doi.org/10.1007/BF02518771
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Speciation of aerosols by combining bulk ion chromatography and thin-window electron probe micro analysis”. Eyckmans K, de Hoog J, van der Auwera L, Van Grieken R, International journal of environmental analytical chemistry 83, 777 (2003). http://doi.org/10.1080/0306731031000118934
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Sub-part-per-billion determination of total dissolved selenium and selenite in environmental waters by X-ray fluorescence spectrometry”. Robberecht HJ, Van Grieken RE, Analytical chemistry 52, 449 (1980). http://doi.org/10.1021/AC50053A017
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Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging”. Vincze L, Vekemans B, Brenker FE, Falkenberg G, Rickers K, Somogyi A, Kersten M, Adams F, Analytical chemistry 76, 6786 (2004). http://doi.org/10.1021/AC049274L
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Trace metal analysis of water containing humic substances by X-ray fluorescence”. Vanderborght BM, Van Grieken RE, International journal of environmental analytical chemistry 5, 221 (1978). http://doi.org/10.1080/03067317808071147
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Ultra-thin window electron probe microanalysis of suspended particles in tributaries of Lake Baikal, Siberia”. Semenov MY, Spolnik Z, Granina L, Van Grieken R, International journal of environmental analytical chemistry 85, 377 (2005). http://doi.org/10.1080/03067310500053944
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The use of a secondary cathode to analyse solid non-conducting samples with direct current glow discharge mass spectrometry: potential and restrictions”. Schelles W, de Gendt S, Maes K, Van Grieken R, Fresenius' journal of analytical chemistry 355, 858 (1996). http://doi.org/10.1007/S0021663550858
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Water analysis by spark-source mass-spectrometry after preconcentration on activated carbon”. Vanderborght BM, Van Grieken RE, Talanta : the international journal of pure and applied analytical chemistry 27, 417 (1980). http://doi.org/10.1016/0039-9140(80)80225-6
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 78, 4069 (2006). http://doi.org/10.1021/AC060688J
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X-ray spectrometry”. Szalóki I, Osán J, Van Grieken RE, Analytical chemistry 76, 3445 (2004). http://doi.org/10.1021/AC0400820
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X-ray spectrometry”. Szalóki I, Török SB, Injuk J, Van Grieken RE, Analytical chemistry 74, 2895 (2002). http://doi.org/10.1021/AC020241K
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X-ray spectrometry”. Szalóki I, Török SB, Ro C-U, Injuk J, Van Grieken RE, Analytical chemistry 72, 211 (2000). http://doi.org/10.1021/A1000018H
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X-ray spectrometry”. Török S, Labar J, Schmeling M, Van Grieken R, Analytical chemistry 70, 495r (1998)
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X-ray spectrometry”. Török SB, Labar J, Injuk J, Van Grieken RE, Analytical chemistry R68, 467 (1996)
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X-ray spectrometry”. Török SB, Van Grieken RE, Analytical chemistry 64r, 180 (1992)
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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Micro to nano : multiscale IR analyses reveal zinc soap heterogeneity in a 19th-century painting by Corot”. Ma X, Pavlidis G, Dillon E, Beltran V, Schwartz JJ, Thoury M, Borondics F, Sandt C, Kjoller K, Berrie BH, Centrone A, Analytical chemistry 94, 3103 (2022). http://doi.org/10.1021/ACS.ANALCHEM.1C04182
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Wearable hollow microneedle sensing patches for the transdermal electrochemical monitoring of glucose”. Parrilla M, Detamornrat U, Domínguez-Robles J, Donnelly RF, De Wael K, Talanta : the international journal of pure and applied analytical chemistry 249, 123695 (2022). http://doi.org/10.1016/J.TALANTA.2022.123695
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Design and development of a new program for data processing of mass spectra acquired by means of a high-resolution double-focusing glow-discharge mass spectrometer”. Robben J, Dufour D, Gijbels R, Fresenius' journal of analytical chemistry 370, 663 (2001). http://doi.org/10.1007/s002160100881
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Modeling of glow discharges: what can we learn from it?”.Bogaerts A, Gijbels R, Analytical chemistry A-pages 69, 719 (1997)
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Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary ion-mass spectrometry (SIMS)”. Lenaerts J, Verlinden G, Ignatova VA, van Vaeck L, Gijbels R, Geuens I, Fresenius' journal of analytical chemistry 370, 654 (2001). http://doi.org/10.1007/s002160100880
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