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Author Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G.
  Title Electron microscopy: principles and fundamentals Type ME1 Book as editor or co-editor
  Year 1997 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Vch Place of Publication Weinheim Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 3-527-29479-1 Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:22089 Serial 967
Permanent link to this record
 
 
Author Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M.
  Title Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration Type P3 Proceeding
  Year 2005 Publication Abbreviated Journal
  Volume Issue Pages 121-126
  Keywords P3 Proceeding; Art; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Glassac Place of Publication Lisbon Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:112025 Serial 1036
Permanent link to this record
 
 
Author Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G.
  Title Handbook of microscopy: applications in materials science, solid-state physics and chemistry Type ME1 Book as editor or co-editor
  Year 1997 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords ME1 Book as editor or co-editor; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Vch Place of Publication Weinheim Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 3-527-29280-2 Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:21417 Serial 1407
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
  Title The notion of resolution Type H3 Book chapter
  Year 2008 Publication Abbreviated Journal
  Volume Issue Pages 1228-1265
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Springer Place of Publication Berlin Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:68656 Serial 2370
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
  Title The notion of resolution Type H3 Book chapter
  Year 2007 Publication Abbreviated Journal
  Volume Issue Pages 1228-1265
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Springer Place of Publication Berlin Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:68657 Serial 2371
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; Croitoru, M.D.
  Title Obstacles on the road towards atomic resolution tomography Type A3 Journal article
  Year 2005 Publication Microscoy and microanalysis Abbreviated Journal
  Volume 11 Issue S2 Pages 238-239
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:57129 Serial 2426
Permanent link to this record
 
 
Author Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J.
  Title Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis Type A1 Journal article
  Year 2003 Publication Institute of physics conference series Abbreviated Journal
  Volume Issue 180 Pages 19-22
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0979-2 ISBN Additional Links UA library record; WoS full record;
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:95118 Serial 2710
Permanent link to this record
 
 
Author Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D.
  Title Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction Type A3 Journal article
  Year 2005 Publication Microscopy and microanalysis Abbreviated Journal
  Volume 11 Issue S Pages 556-557
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:54881 Serial 3155
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.
  Title Statistical experimental design for quantitative atomic resolution transmission electron microscopy Type H1 Book chapter
  Year 2004 Publication Abbreviated Journal Adv Imag Elect Phys
  Volume Issue Pages 1-164
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Academic Press Place of Publication San Diego, Calif. Editor
  Language Wos 000223226700001 Publication Date 2011-01-05
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 1076-5670; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor (down) Times cited 13 Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:47513 Serial 3156
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D.
  Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
  Year 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal
  Volume Issue Pages 2081-2086
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Ieee Place of Publication Editor
  Language Wos Publication Date 2002-11-13
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 0-7803-6646-8 Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:136870 Serial 4501
Permanent link to this record
 
 
Author Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G.
  Title The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data Type H1 Book chapter
  Year 2008 Publication Abbreviated Journal
  Volume Issue Pages 97-98
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Springer Place of Publication Berlin Editor
  Language Wos Publication Date 2009-03-17
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN 978-3-540-85154-7 Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ lucian @ c:irua:136865 Serial 4493
Permanent link to this record
 
 
Author Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S.
  Title Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography Type A1 Journal article
  Year 2017 Publication Particle and particle systems characterization Abbreviated Journal Part. Part. Syst. Charact.
  Volume 34 Issue 34 Pages 1700287
  Keywords A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Vision lab
  Abstract Electron tomography is a well-known technique providing a 3D characterization of the morphology and chemical composition of nanoparticles. However, several reasons hamper the acquisition of tilt series with a large number of projection images, which deteriorate the quality of the 3D reconstruction. Here, an inpainting method that is based on sinogram interpolation is proposed, which enables one to reduce artifacts in the reconstruction related to a limited tilt series of projection images. The advantages of the approach will be demonstrated for the 3D characterization of nanoparticles using phantoms and several case studies.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos 000418416100005 Publication Date 2017-10-27
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 1521-4117 ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor (down) Times cited 2 Open Access OpenAccess
  Notes K.S. and S.B. acknowledge support from the Fund for Scientific ResearchFlanders (FWO) (G019014N and G021814N). S.B. acknowledges financial support from European Research Council (ERC Starting Grant #335078-COLOURATOM). Y.Z. acknowledges financial support from the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie Grant Agreement No. 665501 through a FWO [PEGASUS]2 Marie Skłodowska-Curie fellowship (12U4917N). The authors would like to thank Prof. Luis Liz-Marzán for provision of the samples. (ROMEO:yellow; preprint:; postprint:restricted ; pdfversion:cannot); saraecas; ECAS_Sara; Approved Most recent IF: NA
  Call Number EMAT @ emat @c:irua:147857UA @ admin @ c:irua:147857 Serial 4798
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Author Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R.
  Title Electron diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals Type A1 Journal article
  Year 1994 Publication Icem Abbreviated Journal
  Volume 13 Issue Pages
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos A1994BC23W00081 Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record; WoS full record;
  Impact Factor (down) Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:10058 Serial 918
Permanent link to this record
 
 
Author Goessens, C.; Schryvers, D.; van Dyck, D.; van Landuyt, J.; de Keyzer, R.
  Title Electron-diffraction evidence for ordering of interstitial silver ions in silver bromide microcrystals Type A1 Journal article
  Year 1994 Publication Physica status solidi: A Abbreviated Journal
  Volume 143 Issue 2 Pages 277-287
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract The occurrence and origin of diffuse intensity contours in electron micrographs of AgBr crystals are investigated. The observations are interpreted in terms of a model, which attributes diffuse scattering to the presence of predominant atom or vacancy clusters of a particular polyhedral type. It is shown that irrespective of the crystal morphology, interstitial Ag ions order in AgBr material in clusters of finite size along 001 type planes. A different geometry of the diffuse intensity locus observed for triangular and hexagonal tabular grains is explained in terms of the different twin plane morphology of these grains.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Berlin Editor
  Language Wos A1994NW15300010 Publication Date 2007-01-12
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0031-8965;1521-396X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor (down) Times cited 7 Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:99870 Serial 919
Permanent link to this record
 
 
Author Chen, J.H.; van Dyck, D.; op de Beeck, M.; Broeckx, J.; van Landuyt, J.
  Title Modification of the multislice method for calculating coherent STEM images Type A1 Journal article
  Year 1995 Publication Physica status solidi: A: applied research Abbreviated Journal
  Volume 150 Issue Pages 13-22
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Berlin Editor
  Language Wos A1995RQ21500002 Publication Date 2007-01-12
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0031-8965;1521-396X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor (down) Times cited 5 Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:13292 Serial 2159
Permanent link to this record
 
 
Author Amelinckx, S.; van Heurck, C.; van Dyck, D.; Van Tendeloo, G.
  Title A peculiar diffraction effect in FCC crystals of C60 Type A1 Journal article
  Year 1992 Publication Physica status solidi: A: applied research Abbreviated Journal
  Volume 131 Issue Pages 589-604
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Berlin Editor
  Language Wos A1992JE20400030 Publication Date 2007-01-13
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0031-8965;1521-396X; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor (down) Times cited 13 Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:4371 Serial 2568
Permanent link to this record
 
 
Author Van Tendeloo, G.; op de Beeck, M.; De Meulenaere, P.; van Dyck, D.
  Title Towards quantitative high resolution electron microscopy? Type A1 Journal article
  Year 1995 Publication Institute of physics conference series Abbreviated Journal
  Volume 147 Issue Pages 67-72
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
  Abstract The basics of the interpretation of high resolution images showing detail of the order of 0.1 nm are shortly explained here. The use of a field emission source, a CCD camera and an adapted reconstruction method for restoring the projected crystal potential (focus variation method) allows a quantitative interpretation of HREM images. Examples of partially disordered alloys and carbonate ordering in high Tc superconductors are presented.
  Address
  Corporate Author Thesis
  Publisher Place of Publication London Editor
  Language Wos A1995BE67F00014 Publication Date 0000-00-00
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 0-7503-0357-3; 0951-3248; 0305-2346 ISBN Additional Links UA library record; WoS full record;
  Impact Factor (down) Times cited Open Access
  Notes Approved no
  Call Number UA @ lucian @ c:irua:13015 Serial 3688
Permanent link to this record
 
 
Author Proost, K.; Schalm, O.; Janssens, K.; Van Dyck, D.
  Title Investigation of the chemical state and 3D distribution of Mn in corroded glass fragments Type H3 Book chapter
  Year 2005 Publication Abbreviated Journal
  Volume Issue Pages
  Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Vision lab
  Abstract
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos Publication Date
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN ISBN Additional Links UA library record
  Impact Factor (down) Times cited Open Access
  Notes Approved Most recent IF: NA
  Call Number UA @ admin @ c:irua:50851 Serial 5674
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